В. В. Наумов

504 total citations
92 papers, 339 citations indexed

About

В. В. Наумов is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, В. В. Наумов has authored 92 papers receiving a total of 339 indexed citations (citations by other indexed papers that have themselves been cited), including 69 papers in Electrical and Electronic Engineering, 30 papers in Atomic and Molecular Physics, and Optics and 25 papers in Materials Chemistry. Recurrent topics in В. В. Наумов's work include Semiconductor materials and devices (18 papers), Advancements in Battery Materials (17 papers) and Metal and Thin Film Mechanics (16 papers). В. В. Наумов is often cited by papers focused on Semiconductor materials and devices (18 papers), Advancements in Battery Materials (17 papers) and Metal and Thin Film Mechanics (16 papers). В. В. Наумов collaborates with scholars based in Russia, Belarus and Netherlands. В. В. Наумов's co-authors include I. I. Amirov, С. П. Зимин, Ilia V. Uvarov, А. М. Скундин, V. B. Svetovoy, С. Г. Симакин, Т. Л. Кулова, Sergey Vasilyev, В. Ф. Гременок and H. Zogg and has published in prestigious journals such as Journal of Physics D Applied Physics, Physical review. B. and International Journal of Impact Engineering.

In The Last Decade

В. В. Наумов

77 papers receiving 318 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
В. В. Наумов Russia 10 245 134 95 64 43 92 339
Luyao Xu United States 10 221 0.9× 34 0.3× 61 0.6× 49 0.8× 27 0.6× 20 348
Hideki Kitada Japan 12 469 1.9× 44 0.3× 67 0.7× 141 2.2× 48 1.1× 61 534
Hamed Attariani United States 13 96 0.4× 294 2.2× 45 0.5× 69 1.1× 31 0.7× 27 396
Lachlan Smillie Australia 9 125 0.5× 164 1.2× 63 0.7× 85 1.3× 13 0.3× 18 304
Lieve Teugels Belgium 13 338 1.4× 155 1.2× 85 0.9× 238 3.7× 7 0.2× 36 473
J.H. Lee South Korea 9 165 0.7× 153 1.1× 62 0.7× 42 0.7× 10 0.2× 18 396
G. Kissinger Germany 13 591 2.4× 240 1.8× 204 2.1× 108 1.7× 8 0.2× 105 677
Oleg Kononchuk France 13 401 1.6× 126 0.9× 145 1.5× 68 1.1× 5 0.1× 75 490
Yiwei Wang China 10 332 1.4× 95 0.7× 16 0.2× 97 1.5× 10 0.2× 29 400
T. Conard Belgium 6 346 1.4× 192 1.4× 44 0.5× 20 0.3× 7 0.2× 19 390

Countries citing papers authored by В. В. Наумов

Since Specialization
Citations

This map shows the geographic impact of В. В. Наумов's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by В. В. Наумов with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites В. В. Наумов more than expected).

Fields of papers citing papers by В. В. Наумов

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by В. В. Наумов. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by В. В. Наумов. The network helps show where В. В. Наумов may publish in the future.

Co-authorship network of co-authors of В. В. Наумов

This figure shows the co-authorship network connecting the top 25 collaborators of В. В. Наумов. A scholar is included among the top collaborators of В. В. Наумов based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with В. В. Наумов. В. В. Наумов is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Курбатов, С. В., et al.. (2024). Comparison of Electrochemical Characteristics of Thin-Film Batteries with a Si@O@Al Composite Anode and Lithium Metal Formed by In Situ Method. Russian Journal of Electrochemistry. 60(12). 1051–1060.
2.
Курбатов, С. В., et al.. (2024). Investigation of the Intercalation and Deintercalation of Lithium Ions in a Thin-Film Lithium-Ion Battery by Rutherford Backscattering Spectrometry. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 18(6). 1374–1381.
3.
Курбатов, С. В., et al.. (2024). A Comprehensive Study of Nonuniformity Properties of the LiCoO2 Thin-Film Cathode Fabricated by RF Sputtering. Russian Microelectronics. 53(3). 202–216. 1 indexed citations
4.
Наумов, В. В., et al.. (2024). Determination of the Band Structure and Conductivity of the Si@O@Al Nanocomposite. Technical Physics. 69(6). 1753–1764. 1 indexed citations
5.
Наумов, В. В., et al.. (2023). Impedance of a thin-film lithium-ion battery Si@O@Al|LiPON|LiCoO-=SUB=-2-=/SUB=- at temperatures from -20-=SUP=-o-=/SUP=-C to +50-=SUP=-o-=/SUP=-C. Письма в журнал технической физики. 49(4). 18–18.
6.
Скундин, А. М., et al.. (2023). Current Effect on the Performances of All-Solid-State Lithium-Ion Batteries—Peukert’s Law. Batteries. 9(7). 370–370. 2 indexed citations
8.
Наумов, В. В., et al.. (2023). Effect of the Material of Electrodes on Electroformation and Properties of Memristors Based on Open Metal–SiO2–Metal Sandwich Structures. Russian Microelectronics. 52(5). 419–428. 2 indexed citations
9.
Наумов, В. В., et al.. (2022). Schottky barrier in Si-M structures of solid-state lithium-ion batteries. Письма в журнал технической физики. 48(6). 63–63. 2 indexed citations
10.
Наумов, В. В., et al.. (2022). Features of the current-voltage characteristic of the Ti-Si@O@Al junction Ti-Si@O@Al. Письма в журнал технической физики. 48(9). 7–7. 2 indexed citations
11.
Amirov, I. I., et al.. (2020). Ion-plasma sputtering of Co and Mo nanometer thin films near the sputtering threshold. Journal of Physics D Applied Physics. 54(6). 65204–65204. 6 indexed citations
12.
Uvarov, Ilia V., et al.. (2019). A fast electrochemical actuator in the non-explosive regime. Journal of Micromechanics and Microengineering. 29(11). 114001–114001. 4 indexed citations
13.
Зимин, С. П., I. I. Amirov, В. В. Наумов, et al.. (2019). Plasma-assisted surface nanostructuring of epitaxial Pb 1− x Sn x Te (0 ≤  x  ≤ 1) films. Semiconductor Science and Technology. 34(9). 95001–95001. 4 indexed citations
14.
Зимин, С. П., et al.. (2016). Plasma sputtering of Pb1–x Eu x Te films with varied composition and structure. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 10(3). 623–626. 3 indexed citations
15.
Кулова, Т. Л., et al.. (2015). Cyclic voltammetry studies of silicon–aluminum thin-film electrodes synthesized in the presence of oxygen. Russian Journal of Electrochemistry. 51(12). 1157–1161. 8 indexed citations
16.
Зимин, С. П., et al.. (2014). Features of the plasma sputtering of polycrystalline Pb1 − x Sn x S films. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 8(3). 602–606. 3 indexed citations
17.
Зимин, С. П., et al.. (2014). Plasma sputtering of polycrystalline Pb1−xSnxTe thin films grown on glass substrates using hot wall deposition. Semiconductor Science and Technology. 29(7). 75020–75020. 3 indexed citations
18.
19.
Amirov, I. I., et al.. (2012). Investigations of the inductively coupled argon plasma sputtering of Pb1 − x Sn x Te ternary solid solution. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 6(4). 643–646. 5 indexed citations
20.
Наумов, В. В., et al.. (2009). Enhancement of the transversal magnetooptical Kerr effect in nanoperforated cobalt films. Technical Physics Letters. 35(7). 589–593. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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