Wilfried Haensch

11.6k total citations · 3 hit papers
147 papers, 8.1k citations indexed

About

Wilfried Haensch is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Wilfried Haensch has authored 147 papers receiving a total of 8.1k indexed citations (citations by other indexed papers that have themselves been cited), including 126 papers in Electrical and Electronic Engineering, 35 papers in Materials Chemistry and 18 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Wilfried Haensch's work include Semiconductor materials and devices (84 papers), Advancements in Semiconductor Devices and Circuit Design (79 papers) and Graphene research and applications (26 papers). Wilfried Haensch is often cited by papers focused on Semiconductor materials and devices (84 papers), Advancements in Semiconductor Devices and Circuit Design (79 papers) and Graphene research and applications (26 papers). Wilfried Haensch collaborates with scholars based in United States, Japan and South Korea. Wilfried Haensch's co-authors include Aaron D. Franklin, George S. Tulevski, Shu‐Jen Han, Qing Cao, D.J. Frank, E. Nowak, Shu-Jen Han, R.H. Dennard, Steven J. Koester and Robert K. Montoye and has published in prestigious journals such as Science, Physical Review Letters and Advanced Materials.

In The Last Decade

Wilfried Haensch

143 papers receiving 7.7k citations

Hit Papers

Sub-10 nm Carbon Nanotube Transistor 2005 2026 2012 2019 2012 2005 2006 100 200 300 400 500

Peers

Wilfried Haensch
Comparison fields: 5 of 92
  • Electrical and Electronic Engineering 6.3k
  • Materials Chemistry 2.9k
  • Biomedical Engineering 2.0k
  • Atomic and Molecular Physics, and Optics 897
  • Hardware and Architecture 595
Replace S.S. Wong with:
S.S. Wong United States
Mehdi Asheghi United States
Giuseppe Iannaccone Italy
Chris H. Kim United States
Denis Flandre Belgium
Vijay Narayanan United States
T. Sakurai Japan
Nishant Patil United States
E. Nowak France
W. Weber Germany
S.S. Wong United States View profile →
Citations per field, relative to Wilfried Haensch
Wilfried Haensch · 1×
Citations per year, relative to Wilfried Haensch
Wilfried Haensch · 1×

Countries citing papers authored by Wilfried Haensch

Since Specialization
Citations

This map shows the geographic impact of Wilfried Haensch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wilfried Haensch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wilfried Haensch more than expected).

Fields of papers citing papers by Wilfried Haensch

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Wilfried Haensch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wilfried Haensch. The network helps show where Wilfried Haensch may publish in the future.

Co-authorship network of co-authors of Wilfried Haensch

This figure shows the co-authorship network connecting the top 25 collaborators of Wilfried Haensch. A scholar is included among the top collaborators of Wilfried Haensch based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Wilfried Haensch. Wilfried Haensch is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
# Work Indexed citations
1 17
2 3
3 11
4 7
5 33
6 5
7 124
8 181
9 404
10 1
11 13
12 254
13 2
14
Modeling of width-quantization-induced variations in logic FinFETs for 22nm and beyond
22
15
Scaling of SOI FinFETs down to fin width of 4 nm for the 10nm technology node
11
16 88
17 4
18
Reliability of a 300-mm-compatible 3DI technology based on hybrid Cu-adhesive wafer bonding
5
19 198
20 27

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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2026