J. Bruley

5.8k total citations
136 papers, 4.4k citations indexed

About

J. Bruley is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, J. Bruley has authored 136 papers receiving a total of 4.4k indexed citations (citations by other indexed papers that have themselves been cited), including 92 papers in Electrical and Electronic Engineering, 64 papers in Materials Chemistry and 31 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in J. Bruley's work include Semiconductor materials and devices (71 papers), Advancements in Semiconductor Devices and Circuit Design (34 papers) and Electronic and Structural Properties of Oxides (31 papers). J. Bruley is often cited by papers focused on Semiconductor materials and devices (71 papers), Advancements in Semiconductor Devices and Circuit Design (34 papers) and Electronic and Structural Properties of Oxides (31 papers). J. Bruley collaborates with scholars based in United States, Germany and United Kingdom. J. Bruley's co-authors include Jerome J. Cuomo, J. P. Doyle, David L. Pappas, M. Rühle, K. L. Saenger, D. B. Williams, Vijay Narayanan, Joyce C. Liu, Harald Müllejans and Rik Brydson and has published in prestigious journals such as Science, Physical Review Letters and Nano Letters.

In The Last Decade

J. Bruley

131 papers receiving 4.3k citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
J. Bruley 2.8k 2.3k 875 796 788 136 4.4k
J. W. Steeds 2.4k 0.9× 1.1k 0.5× 688 0.8× 406 0.5× 763 1.0× 181 4.0k
John R. Abelson 3.8k 1.4× 3.4k 1.5× 815 0.9× 739 0.9× 854 1.1× 210 5.5k
E. Bustarret 3.4k 1.2× 2.1k 0.9× 864 1.0× 929 1.2× 1.1k 1.4× 160 4.7k
J. J. Cuomo 3.2k 1.2× 3.4k 1.5× 1.4k 1.6× 693 0.9× 1.4k 1.7× 138 6.3k
G. Turban 2.2k 0.8× 2.5k 1.1× 1.3k 1.5× 309 0.4× 372 0.5× 132 3.7k
Christian Elsässer 4.7k 1.7× 2.1k 0.9× 514 0.6× 621 0.8× 1.3k 1.6× 173 6.5k
L.E. Rehn 2.9k 1.1× 821 0.4× 870 1.0× 548 0.7× 535 0.7× 183 4.3k
Victor Ralchenko 5.1k 1.8× 1.8k 0.8× 1.9k 2.1× 1.3k 1.6× 1.5k 1.9× 352 6.5k
H. P. Strunk 2.2k 0.8× 2.8k 1.2× 676 0.8× 656 0.8× 1.7k 2.1× 232 4.6k
M‐A. Nicolet 1.9k 0.7× 2.9k 1.2× 651 0.7× 470 0.6× 2.0k 2.5× 180 5.0k

Countries citing papers authored by J. Bruley

Since Specialization
Citations

This map shows the geographic impact of J. Bruley's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Bruley with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Bruley more than expected).

Fields of papers citing papers by J. Bruley

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Bruley. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Bruley. The network helps show where J. Bruley may publish in the future.

Co-authorship network of co-authors of J. Bruley

This figure shows the co-authorship network connecting the top 25 collaborators of J. Bruley. A scholar is included among the top collaborators of J. Bruley based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Bruley. J. Bruley is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Safranski, Christopher, et al.. (2025). High-Efficiency Continuous Spin-Conduction through NiO/Cu Bilayer Structure. Nano Letters. 25(10). 3851–3857. 3 indexed citations
2.
Gottwald, M., G. Hu, P. L. Trouilloud, et al.. (2024). First Demonstration of High Retention Energy Barriers and 2 ns Switching, Using Magnetic Ordered-Alloy-Based STT MRAM Devices. 1–2. 1 indexed citations
3.
Molinari, Alan, Heinz Schmid, Marilyne Sousa, et al.. (2024). Unconventional magnetoresistance and resistivity scaling in amorphous CoSi thin films. Scientific Reports. 14(1). 20608–20608. 3 indexed citations
4.
5.
Borg, Mattias, Lynne Gignac, J. Bruley, et al.. (2018). Facet-selective group-III incorporation in InGaAs template assisted selective epitaxy. Nanotechnology. 30(8). 84004–84004. 19 indexed citations
6.
Ando, Takashi, Pouya Hashemi, J. Bruley, et al.. (2017). High Mobility High-Ge-Content SiGe PMOSFETs Using Al2O3/HfO2 Stacks With <italic>In-Situ</italic> O3 Treatment. IEEE Electron Device Letters. 38(3). 303–305. 34 indexed citations
7.
Cartier, E., A. Majumdar, Takashi Ando, et al.. (2017). Electron mobility in thin In0.53Ga0.47As channel.. European Solid-State Device Research Conference. 292–295. 2 indexed citations
8.
Hashemi, Pouya, Takashi Ando, Karthik Balakrishnan, et al.. (2017). High performance PMOS with strained high-Ge-content SiGe fins for advanced logic applications. 1–2. 6 indexed citations
9.
Schmid, Heinz, Mattias Borg, Kirsten E. Moselund, et al.. (2015). Template-assisted selective epitaxy of III–V nanoscale devices for co-planar heterogeneous integration with Si. Applied Physics Letters. 106(23). 165 indexed citations
10.
Dubourdieu, Catherine, J. Bruley, Thomas M. Arruda, et al.. (2013). Switching of ferroelectric polarization in epitaxial BaTiO3 films on silicon without a conducting bottom electrode. Nature Nanotechnology. 8(10). 748–754. 224 indexed citations
11.
Kanungo, Pratyush Das, Heinz Schmid, Mikael Björk, et al.. (2013). Selective area growth of III–V nanowires and their heterostructures on silicon in a nanotube template: towards monolithic integration of nano-devices. Nanotechnology. 24(22). 225304–225304. 39 indexed citations
12.
Domenicucci, A., et al.. (2012). Variable magnification dual lens electron holography for semiconductor junction profiling and strain mapping. Ultramicroscopy. 124. 117–129. 17 indexed citations
13.
Hopstaken, Marinus, J. Bruley, Dirk Pfeiffer, et al.. (2010). Oxygen Transport in High-k Metal Gate Stacks and Physical Characterization by SIMS Using Isotopic Labeled Oxygen. ECS Transactions. 28(1). 105–113. 6 indexed citations
14.
Wen, Cheng‐Yen, M. C. Reuter, J. Bruley, et al.. (2009). Formation of Compositionally Abrupt Axial Heterojunctions in Silicon-Germanium Nanowires. Science. 326(5957). 1247–1250. 266 indexed citations
15.
Wells, Oliver C., et al.. (2006). Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope. Scanning. 28(1). 27–31. 8 indexed citations
16.
Kawasaki, Masahiro, et al.. (2004). Off-axis electron holography with a dual-lens imaging system and its usefulness in 2-D potential mapping of semiconductor devices. Ultramicroscopy. 101(2-4). 63–72. 30 indexed citations
17.
Keast, Vicki J., A.J. Scott, Rik Brydson, D. B. Williams, & J. Bruley. (2001). Electron energy‐loss near‐edge structure – a tool for the investigation of electronic structure on the nanometre scale. Journal of Microscopy. 203(2). 135–175. 149 indexed citations
18.
Myers, A. F., et al.. (1996). Characterization of amorphous carbon coated silicon field emitters. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(3). 2024–2029. 9 indexed citations
19.
Bruley, J. & L. M. Brown. (1989). Quantitative electron energy-loss spectroscopy microanalysis of platelet and voidite defects in natural diamond. Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 59(2). 247–261. 34 indexed citations
20.
Brydson, Rik, J. Bruley, & J. M. Thomas. (1988). Further evidence for core-hole effects in the near-edge structures of light-element K-edges. Chemical Physics Letters. 149(4). 343–347. 22 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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