M. Chudzik

2.0k total citations
56 papers, 957 citations indexed

About

M. Chudzik is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Condensed Matter Physics. According to data from OpenAlex, M. Chudzik has authored 56 papers receiving a total of 957 indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Electrical and Electronic Engineering, 16 papers in Materials Chemistry and 15 papers in Condensed Matter Physics. Recurrent topics in M. Chudzik's work include Semiconductor materials and devices (29 papers), Advancements in Semiconductor Devices and Circuit Design (19 papers) and Physics of Superconductivity and Magnetism (15 papers). M. Chudzik is often cited by papers focused on Semiconductor materials and devices (29 papers), Advancements in Semiconductor Devices and Circuit Design (19 papers) and Physics of Superconductivity and Magnetism (15 papers). M. Chudzik collaborates with scholars based in United States, Austria and Israel. M. Chudzik's co-authors include Carl R. Kannewurf, Vijay Narayanan, Tobin J. Marks, Robert P. H. Chang, Anchuan Wang, J. H. Stathis, C. Cabral, B. Doris, Vamsi Paruchuri and Agnese Callegari and has published in prestigious journals such as Advanced Materials, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

M. Chudzik

55 papers receiving 928 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Chudzik United States 17 703 326 156 115 113 56 957
Abdulrahman Albadri Saudi Arabia 21 973 1.4× 749 2.3× 313 2.0× 231 2.0× 116 1.0× 52 1.3k
Marcus Müller Germany 17 350 0.5× 442 1.4× 336 2.2× 177 1.5× 230 2.0× 49 779
W. Eccleston United Kingdom 19 1.2k 1.7× 401 1.2× 44 0.3× 64 0.6× 195 1.7× 105 1.3k
J. J. Bucchignano United States 14 465 0.7× 186 0.6× 124 0.8× 90 0.8× 312 2.8× 35 730
Ole Bethge Austria 17 793 1.1× 659 2.0× 123 0.8× 160 1.4× 239 2.1× 56 1.1k
Valeri Afanas’ev Belgium 26 1.3k 1.8× 782 2.4× 33 0.2× 188 1.6× 225 2.0× 101 1.6k
W. Clemens Germany 15 741 1.1× 169 0.5× 125 0.8× 164 1.4× 414 3.7× 31 1.1k
Shinji Migita Japan 24 2.4k 3.5× 1.2k 3.7× 79 0.5× 165 1.4× 232 2.1× 197 2.6k
M. Doczy United States 16 2.1k 2.9× 477 1.5× 58 0.4× 103 0.9× 404 3.6× 22 2.3k
T.W. Kim South Korea 13 388 0.6× 449 1.4× 59 0.4× 166 1.4× 139 1.2× 73 639

Countries citing papers authored by M. Chudzik

Since Specialization
Citations

This map shows the geographic impact of M. Chudzik's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Chudzik with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Chudzik more than expected).

Fields of papers citing papers by M. Chudzik

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Chudzik. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Chudzik. The network helps show where M. Chudzik may publish in the future.

Co-authorship network of co-authors of M. Chudzik

This figure shows the co-authorship network connecting the top 25 collaborators of M. Chudzik. A scholar is included among the top collaborators of M. Chudzik based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Chudzik. M. Chudzik is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Correll, Justin M., Jie Lu, Wei Tang, et al.. (2025). An 8-bit 20.7 TOPS/W Multilevel Cell ReRAM Macro With ADC-Assisted Bit-Serial Processing. IEEE Journal of Solid-State Circuits. 60(8). 2995–3008. 2 indexed citations
2.
3.
Wu, Yuting, Qiwen Wang, Ziyu Wang, et al.. (2023). Bulk‐Switching Memristor‐Based Compute‐In‐Memory Module for Deep Neural Network Training. Advanced Materials. 35(46). e2305465–e2305465. 27 indexed citations
4.
Bao, Ruqiang, Steven Hung, Miaomiao Wang, et al.. (2018). Novel Materials and Processes in Replacement Metal Gate for Advanced CMOS Technology. 11.4.1–11.4.4. 8 indexed citations
5.
Breil, N., Nikolaos Bekiaris, Jennifer F. Tseng, et al.. (2017). Electron beam detection of cobalt trench embedded voids enabling improved process control for Middle-Of-Line at the 7nm node and beyond. 14.5.1–14.5.4. 3 indexed citations
6.
Lavoie, C., Ahmet S. Özcan, F.H. Baumann, et al.. (2014). Challenges of nickel silicidation in CMOS technologies. Microelectronic Engineering. 137. 79–87. 45 indexed citations
7.
Cartier, E., Takashi Ando, M. Hopstaken, et al.. (2013). Characterization and optimization of charge trapping in high-k dielectrics. 5A.2.1–5A.2.7. 9 indexed citations
8.
Kim, Jiseok, Siddarth Krishnan, Sudarshan Narayanan, M. Chudzik, & Massimo V. Fischetti. (2012). Thickness and temperature dependence of the leakage current in hafnium-based Si SOI MOSFETs. Microelectronics Reliability. 52(12). 2907–2913. 16 indexed citations
9.
Wong, Keith H.K., et al.. (2011). Low resistivity tungsten for 32nm node MOL contacts and beyond. Microelectronic Engineering. 92. 123–125. 12 indexed citations
10.
Dai, Min, Jinping Liu, Dechao Guo, et al.. (2011). A novel atomic layer oxidation technique for EOT scaling in gate-last high-к/metal gate CMOS technology. 86. 28.5.1–28.5.4. 6 indexed citations
11.
Frank, Martin M., Sang‐Bum Kim, S. Brown, et al.. (2009). Scaling the MOSFET gate dielectric: From high-k to higher-k? (Invited Paper). Microelectronic Engineering. 86(7-9). 1603–1608. 59 indexed citations
12.
Guha, Supratik, Vijay Narayanan, Vamsi Paruchuri, et al.. (2006). Charge Defects, Vt Shifts, and the Solution to the High-K Metal Gate n-MOSFET Problem. ECS Transactions. 3(2). 247–252. 2 indexed citations
13.
Ludeke, R., Patrick Lysaght, E. Cartier, et al.. (2004). Surface potential and morphology issues of annealed (HfO2)x(SiO2)1−x gate oxides. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 22(4). 2113–2120. 6 indexed citations
14.
Parkinson, P. M. Saz, M. Chudzik, Kangguo Cheng, et al.. (2004). Novel techniques for scaling deep trench DRAM capacitor technology to 0.11 μm and beyond. ed 33. 21–24. 4 indexed citations
15.
Selvamanickam, V., G. Carota, Pradeep Haldar, et al.. (2001). High-current Y-Ba-Cu-O coated conductor using metal organic chemical-vapor deposition and ion-beam-assisted deposition. IEEE Transactions on Applied Superconductivity. 11(1). 3379–3381. 41 indexed citations
16.
Belot, J.A., Tobin J. Marks, Yanguo Wang, et al.. (2000). Analysis of the fluoride effect on the phase-selective growth of TlBa2Ca2Cu3O9−x thin films: Phase evolution and microstructure development. Journal of materials research/Pratt's guide to venture capital sources. 15(5). 1083–1097. 6 indexed citations
17.
Wang, Anchuan, J.A. Belot, Tobin J. Marks, et al.. (1999). Buffers for high temperature superconductor coatings. Low temperature growth of CeO2 films by metal–organic chemical vapor deposition and their implementation as buffers. Physica C Superconductivity. 320(3-4). 154–160. 38 indexed citations
18.
Selvamanickam, V., Christian Trautwein, Pradeep Haldar, et al.. (1999). Y-Ba-Cu-O film deposition by metal organic chemical vapor deposition on buffered metal substrates. IEEE Transactions on Applied Superconductivity. 9(2). 1523–1526. 6 indexed citations
19.
Wang, A., Shangcong Cheng, J.A. Belot, et al.. (1997). Metal-Organic Chemical Vapor Deposition Routes to Films of Transparent Conducting Oxides. MRS Proceedings. 495. 2 indexed citations
20.
Balachandràn, U., R. Jammy, M. Chudzik, Aparna Iyer, & Pradeep Haldar. (1996). Advances in processing and characterizing Bi-based superconductors. JOM. 48(10). 19–23. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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