Kevin M. Brunson

415 total citations
37 papers, 333 citations indexed

About

Kevin M. Brunson is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Kevin M. Brunson has authored 37 papers receiving a total of 333 indexed citations (citations by other indexed papers that have themselves been cited), including 34 papers in Electrical and Electronic Engineering, 17 papers in Atomic and Molecular Physics, and Optics and 12 papers in Materials Chemistry. Recurrent topics in Kevin M. Brunson's work include Semiconductor materials and devices (16 papers), Semiconductor materials and interfaces (14 papers) and Advanced MEMS and NEMS Technologies (9 papers). Kevin M. Brunson is often cited by papers focused on Semiconductor materials and devices (16 papers), Semiconductor materials and interfaces (14 papers) and Advanced MEMS and NEMS Technologies (9 papers). Kevin M. Brunson collaborates with scholars based in United Kingdom, United States and Singapore. Kevin M. Brunson's co-authors include David Sands, Michael J. Uren, C.B. Thomas, Andrèa M. Hodge, H.S. Reehal, P.H. Saul, W. Redman-White, D.O. King, M.S.L. Lee and B.M. Tenbroek and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

Kevin M. Brunson

36 papers receiving 314 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Kevin M. Brunson United Kingdom 11 280 115 91 53 29 37 333
M. Ferri Italy 12 277 1.0× 143 1.2× 133 1.5× 170 3.2× 32 1.1× 48 399
Arijit Roy India 10 372 1.3× 44 0.4× 58 0.6× 40 0.8× 57 2.0× 38 474
Jerónimo Buencuerpo United States 13 297 1.1× 124 1.1× 87 1.0× 144 2.7× 17 0.6× 37 407
Hiroyuki Toyota Japan 12 361 1.3× 66 0.6× 185 2.0× 23 0.4× 5 0.2× 47 451
Ulrich Krumbein Germany 8 285 1.0× 103 0.9× 56 0.6× 102 1.9× 15 0.5× 23 336
W. H. Bloss Germany 11 188 0.7× 57 0.5× 113 1.2× 32 0.6× 13 0.4× 30 296
Christoph Flötgen Austria 8 202 0.7× 35 0.3× 38 0.4× 37 0.7× 33 1.1× 18 226
Zhijian Li China 10 202 0.7× 73 0.6× 63 0.7× 118 2.2× 9 0.3× 46 298
R. Thompson United States 10 661 2.4× 75 0.7× 359 3.9× 72 1.4× 11 0.4× 34 678
H. Thomann Germany 7 127 0.5× 26 0.2× 224 2.5× 152 2.9× 39 1.3× 10 313

Countries citing papers authored by Kevin M. Brunson

Since Specialization
Citations

This map shows the geographic impact of Kevin M. Brunson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kevin M. Brunson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kevin M. Brunson more than expected).

Fields of papers citing papers by Kevin M. Brunson

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kevin M. Brunson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kevin M. Brunson. The network helps show where Kevin M. Brunson may publish in the future.

Co-authorship network of co-authors of Kevin M. Brunson

This figure shows the co-authorship network connecting the top 25 collaborators of Kevin M. Brunson. A scholar is included among the top collaborators of Kevin M. Brunson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kevin M. Brunson. Kevin M. Brunson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Scott, Andrew M., Kevin D. Ridley, David C. Jones, et al.. (2009). Retro-reflective communications over a kilometre range using a MEMS-based optical tag. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7480. 74800L–74800L. 2 indexed citations
2.
King, D.O., G. W. Smith, Neil T. Gordon, et al.. (2008). A large area reconfigurable MOEMS microshutter array for coded aperture imaging systems. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7096. 70960D–70960D. 3 indexed citations
3.
Davies, Ryan R., et al.. (2006). Bio-inspired MEMS resonant thermal detector. 2006. 83–90. 1 indexed citations
4.
Saul, P.H., et al.. (2003). Versatile high voltage level shift and driver for MEMS applications. Electronics Letters. 39(2). 185–186. 10 indexed citations
5.
6.
Tenbroek, B.M., Gregory L. Whiting, W. Redman-White, et al.. (1999). Measurement of buried oxide thermal conductivity for accurate electrothermal simulation of SOI device. IEEE Transactions on Electron Devices. 46(1). 251–253. 22 indexed citations
7.
Coleman, P. G., et al.. (1999). Positron annihilation spectroscopy of laser-irradiated 4H-SiC. Applied Surface Science. 149(1-4). 144–147. 1 indexed citations
8.
Uren, Michael J., et al.. (1998). Interface State Capture Cross Section Measurements on Vacuum Annealed and Radiation Damaged Si : SiO2 Surfaces. Journal of The Electrochemical Society. 145(2). 683–689. 11 indexed citations
9.
King, D.O., Michael Ward, Kevin M. Brunson, & Douglas Hamilton. (1998). Polysilicon process development for fully integrated surfacemicromachined accelerometer with CMOS electronics. Sensors and Actuators A Physical. 68(1-3). 238–243. 6 indexed citations
10.
Tenbroek, B.M., et al.. (1996). Characterization of layout dependent thermal coupling in SOI CMOS current mirrors. IEEE Transactions on Electron Devices. 43(12). 2227–2232. 15 indexed citations
11.
Uren, Michael J. & Kevin M. Brunson. (1994). An improved technique for the evaluation of surface Fermi energy in metal-oxide-semiconductor capacitors. Semiconductor Science and Technology. 9(8). 1504–1510. 11 indexed citations
12.
Jackson, Robert L., et al.. (1993). Optimisation of furnace oxidation of Si with respect to negative bias stress instability. Microelectronic Engineering. 22(1-4). 47–50. 1 indexed citations
13.
Sands, David, et al.. (1992). Measured intrinsic defect density throughout the entire band gap at the <100> Si/SiO2interface. Semiconductor Science and Technology. 7(8). 1091–1096. 22 indexed citations
14.
Uren, Michael J., Kevin M. Brunson, & Andrèa M. Hodge. (1992). Separation of two distinct fast interface state contributions at the (100)Si/SiO2 interface using the conductance technique. Applied Physics Letters. 60(5). 624–626. 31 indexed citations
15.
Sands, David, et al.. (1990). Growth of wide band gap polycrystalline semi-insulating polycrystalline silicon. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 8(1). 16–20. 7 indexed citations
16.
Thomas, C.B., David Sands, Kevin M. Brunson, & H.S. Reehal. (1989). Influence of the Deposition Temperature on the Photoluminescence from Thin Film ZnS : Mn. Journal of The Electrochemical Society. 136(4). 1235–1239. 6 indexed citations
17.
Sands, David, Kevin M. Brunson, & C.B. Thomas. (1988). A modified charge-voltage technique for interface-state measurements in metal-oxide-semiconductor capacitors. Semiconductor Science and Technology. 3(5). 477–482. 2 indexed citations
18.
Thomas, C.B., David Sands, & Kevin M. Brunson. (1987). Electrical characteristics of Al/ZnS/p-p+ Si diodes. Applied Physics Letters. 51(3). 195–196. 4 indexed citations
19.
Sands, David, et al.. (1987). Electronic states at the interface between thin films of ZnS and crystalline p-silicon. Journal of Applied Physics. 62(4). 1340–1343. 5 indexed citations
20.
Brunson, Kevin M., et al.. (1987). The contribution of bulk states to the ac conductance of metal-insulator-semiconductor diodes. Journal of Applied Physics. 62(1). 185–189. 19 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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