M. Copel

11.6k total citations · 2 hit papers
159 papers, 9.6k citations indexed

About

M. Copel is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. Copel has authored 159 papers receiving a total of 9.6k indexed citations (citations by other indexed papers that have themselves been cited), including 126 papers in Electrical and Electronic Engineering, 56 papers in Materials Chemistry and 52 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. Copel's work include Semiconductor materials and devices (101 papers), Electronic and Structural Properties of Oxides (31 papers) and Integrated Circuits and Semiconductor Failure Analysis (30 papers). M. Copel is often cited by papers focused on Semiconductor materials and devices (101 papers), Electronic and Structural Properties of Oxides (31 papers) and Integrated Circuits and Semiconductor Failure Analysis (30 papers). M. Copel collaborates with scholars based in United States, Germany and Brazil. M. Copel's co-authors include R. M. Tromp, M. Gribelyuk, M. C. Reuter, E. Cartier, Efthimios Kaxiras, David B. Mitzi, E. P. Gusev, Evgeni Gusev, F. K. LeGoues and Supratik Guha and has published in prestigious journals such as Nature, Physical Review Letters and Advanced Materials.

In The Last Decade

M. Copel

158 papers receiving 9.2k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Surfactants in epitaxial growth

1989 956 citations M. Copel, M. C. Reuter et al. Physical Review Letters profile →
Structure and stability of ultrathin zirconium oxide layers on Si(001)

2000 582 citations M. Copel, M. Gribelyuk et al. Applied Physics Letters profile →

Peers

Countries citing papers authored by M. Copel

Since Specialization

Citations

This map shows the geographic impact of M. Copel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Copel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Copel more than expected).

Fields of papers citing papers by M. Copel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Copel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Copel. The network helps show where M. Copel may publish in the future.

Co-authorship network of co-authors of M. Copel

This figure shows the co-authorship network connecting the top 25 collaborators of M. Copel. A scholar is included among the top collaborators of M. Copel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Copel. M. Copel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Atomic Layer Deposition of Tungsten Oxide Using Nitrogen Dioxide: A Comparative Study with Other Oxygen Sources 2021 ·Chemistry of Materials ·Damon B. Farmer, M. Copel, Teodor K. Todorov, J. A. Ott, Marinus Hopstaken, (unknown), (unknown), (unknown), (unknown)	5
2	Time-resolved Conductance in Electrochemical Systems for Neuromorphic Computing 2018 ·Douglas M. Bishop, P. M. Solomon, (unknown), Jian Tang, J. Tersoff, Tchavdar N. Todorov, M. Copel, (unknown), (unknown), (unknown), Wilfried Haensch, John Rozen	11
3	First realization of the piezoelectronic stress-based transduction device 2015 ·Nanotechnology ·Josephine Chang, Hiroyuki Miyazoe, M. Copel, P. M. Solomon, Xiaohu Liu, T. M. Shaw, A. G. Schrott, Lynne Gignac, Glenn Martyna, D. M. Newns	8
4	Direct Measurement of the Growth Mode of Graphene on SiC(0001) andSiC(0001¯) 2011 ·Physical Review Letters ·J. B. Hannon, M. Copel, R. M. Tromp	41
5	Oxygen Transport in High-k Metal Gate Stacks and Physical Characterization by SIMS Using Isotopic Labeled Oxygen 2010 ·ECS Transactions ·Marinus Hopstaken, J. Bruley, Dirk Pfeiffer, M. Copel, Martin M. Frank, E. Cartier, Takashi Ando, Vijay Narayanan	6
6	Self-Assembled Multilayers of Transition-Metal−Terpyridinyl Complexes; Formation, and Characterization 2006 ·Langmuir ·Laura L. Kosbar, (unknown), Ali Afzali, Teresita Graham, M. Copel, L. Krusin‐Elbaum	52
7	High‐Mobility p‐Type Transistor Based on a Spin‐Coated Metal Telluride Semiconductor 2006 ·Advanced Materials ·David B. Mitzi, M. Copel, Conal E. Murray	66
8	Critical Role of Surface Steps in the Alloying of Ge on Si(001) 2004 ·Physical Review Letters ·J. B. Hannon, M. Copel, R. Stumpf, M. C. Reuter, R. M. Tromp	15
9	Suppression of subcutaneous oxidation during the deposition of amorphous lanthanum aluminate on silicon 2004 ·Applied Physics Letters ·L. F. Edge, Darrell G. Schlom, (unknown), Yves J. Chabal, John R. Williams, Scott A. Chambers, Christopher L. Hinkle, G. Lucovsky, Yue‐De Yang, Susanne Stemmer, M. Copel, B. Holländer, J. Schubert	75
10	Microstructure and thermal stability of HfO2 gate dielectric deposited on Ge(100) 2004 ·Applied Physics Letters ·E. P. Gusev, Huiling Shang, M. Copel, M. Gribelyuk, C. D’Emic, P. Kozlowski, T. Zabel	79
11	Physical and electrical properties of reactive molecular-beam-deposited aluminum nitride in metal-oxide-silicon structures 2003 ·Journal of Applied Physics ·L.-Å. Ragnarsson, N. A. Bojarczuk, M. Copel, E. P. Gusev, J. Karasiński, Supratik Guha	18
12	Interface reactions in ZrO2 based gate dielectric stacks 2002 ·Journal of Applied Physics ·M. Gribelyuk, Agnese Callegari, E. P. Gusev, M. Copel, D. A. Buchanan	33
13	Molecular-beam-deposited yttrium-oxide dielectrics in aluminum-gated metal–oxide–semiconductor field-effect transistors: Effective electron mobility 2001 ·Applied Physics Letters ·L.-Å. Ragnarsson, Supratik Guha, M. Copel, E. Cartier, N. A. Bojarczuk, J. Karasiński	72
14	Medium-energy ion scattering for analysis of microelectronic materials 2000 ·IBM Journal of Research and Development ·M. Copel	27
15	Effects of surface oxide on the rapid thermal nitridation of Si(001) 1996 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·M. Copel, R. M. Tromp, H.‐J. Timme, (unknown), T. Nakao	8
16	Stoichiometry reversal and depth-profiling in the growth of thin oxynitride films with N2O on Si(100) surfaces 1996 ·Journal of Electron Spectroscopy and Related Phenomena ·D. G. J. Sutherland, (unknown), M. Copel, F. J. Himpsel, T. A. Callcott, J. A. Carlisle, D. L. Ederer, Jinbiao Jia, I. Jiménez, R. C. C. Perera, David K. Shuh, L. J. Terminello, Wei Tong	1
17	Stoichiometry reversal in the growth of thin oxynitride films on Si(100) surfaces 1995 ·Journal of Applied Physics ·D. G. J. Sutherland, (unknown), M. Copel, F. J. Himpsel, T. A. Callcott, John A. Carlisle, D. L. Ederer, Jinbiao Jia, I. Jiménez, R. C. C. Perera, David K. Shuh, L. J. Terminello, Wei Tong	47
18	A new two-dimensional particle detector for a toroidal electrostatic analyzer 1991 ·Review of Scientific Instruments ·R. M. Tromp, M. Copel, M. C. Reuter, M. Horn von Hoegen, James L. Speidell, (unknown)	96
19	Surfactants in epitaxial growth breakdown → 1989 ·Physical Review Letters ·M. Copel, M. C. Reuter, Efthimios Kaxiras, R. M. Tromp	956
20	Elemental and electrical characterization of thin SiO2 films deposited downstream from a microwave discharge 1988 ·AIP conference proceedings ·(unknown), T.N. Nguyen, M. Copel	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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