Yunfei Deng
- Electrical and Electronic Engineering top 10%
- Electronic, Optical and Magnetic Materials
- Surfaces, Coatings and Films top 5%
- Aerospace Engineering top 10%
- Biomedical Engineering
- Co-authors
- Andrew R. NeureutherHaiyan ZhangDanfeng ZhangHarry LevinsonGuoxun ZengJunyao ShenYun ZhengJongwook Kye
- Topics
- Advancements in Photolithography Techniques (42 papers)Integrated Circuits and Semiconductor Failure Analysis (22 papers)Electron and X-Ray Spectroscopy Techniques (18 papers)
- Cited by
- Surfaces, Coatings and FilmsElectronic, Optical and Magnetic MaterialsElectrical and Electronic Engineering
- Partner nations
- United StatesChinaHungary
In The Last Decade
Yunfei Deng
52 papers receiving 541 citations
Peers
Comparison fields: 5 of 55
- Electrical and Electronic Engineering 389
- Electronic, Optical and Magnetic Materials 158
- Surfaces, Coatings and Films 151
- Aerospace Engineering 124
- Biomedical Engineering 112
Countries citing papers authored by Yunfei Deng
This map shows the geographic impact of Yunfei Deng's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yunfei Deng with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yunfei Deng more than expected).
Fields of papers citing papers by Yunfei Deng
This network shows the impact of papers produced by Yunfei Deng. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yunfei Deng. The network helps show where Yunfei Deng may publish in the future.
Co-authorship network of co-authors of Yunfei Deng
This figure shows the co-authorship network connecting the top 25 collaborators of Yunfei Deng. A scholar is included among the top collaborators of Yunfei Deng based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yunfei Deng. Yunfei Deng is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 12 | |
| 3 | 0 | |
| 4 | 10 | |
| 5 | 1 | |
| 6 | 6 | |
| 7 | 7 | |
| 8 | 3 | |
| 9 | 21 | |
| 10 | 5 | |
| 11 | 9 | |
| 12 | 16 | |
| 13 | 40 | |
| 14 | 5 | |
| 15 | 9 | |
| 16 | 4 | |
| 17 | 19 | |
| 18 | 2 | |
| 19 | 9 | |
| 20 | 3 |
About Yunfei Deng
Yunfei Deng is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Hardware and Architecture, having authored 54 papers that have together received 577 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (42 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers) and Electron and X-Ray Spectroscopy Techniques (18 papers). The work is most often cited by research in Surfaces, Coatings and Films (151 citations), Electronic, Optical and Magnetic Materials (158 citations) and Electrical and Electronic Engineering (389 citations). Yunfei Deng has collaborated with scholars based in United States, China and Hungary. Frequent co-authors include Andrew R. Neureuther, Haiyan Zhang, Danfeng Zhang, Harry Levinson, Guoxun Zeng, Junyao Shen, Yun Zheng, Jongwook Kye, Bruno La Fontaine and Ao Cheng. Their work appears in journals such as Carbon, Journal of Colloid and Interface Science and Applied Sciences.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.