Kurt Ronse
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 39
- Optical Coatings and Gratings 18
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- Advancements in Photolithography Techniques 123
- Integrated Circuits and Semiconductor Failure Analysis 53
- 3D IC and TSV technologies 17
- Hardware and Architecture top 10%
- Biomedical Engineering top 10%
- Nanofabrication and Lithography Techniques 20
- Advanced Surface Polishing Techniques 17
- Advanced optical system design 16
- Co-authors
- R. JonckheereEric HendrickxGeert VandenbergheLuc Van den hoveJulien RyckaertJan HermansGian F. LorussoAlan Myers
- Journals
- Microelectronic Engineering (12 papers)Journal of Photopolymer Science and Technology (12 papers)Japanese Journal of Applied Physics (1 paper)
- Partner nations
- BelgiumUnited StatesNetherlands
In The Last Decade
Kurt Ronse
122 papers receiving 831 citations
Peers
Comparison fields: 5 of 49
- Surfaces, Coatings and Films 292
- Electrical and Electronic Engineering 836
- Hardware and Architecture 49
- Industrial and Manufacturing Engineering 62
- Biomedical Engineering 269
Countries citing papers authored by Kurt Ronse
This map shows the geographic impact of Kurt Ronse's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kurt Ronse with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kurt Ronse more than expected).
Fields of papers citing papers by Kurt Ronse
This network shows the impact of papers produced by Kurt Ronse. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kurt Ronse. The network helps show where Kurt Ronse may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Kurt Ronse, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 1 | |
| 2 | 2025 | 0 | |
| 3 | 2024 | 1 | |
| 4 | 2024 | 3 | |
| 5 | 2023 | 1 | |
| 6 | 2015 | 26 | |
| 7 | 2012 | 2 | |
| 8 | 2010 | 3 | |
| 9 | 2008 | 11 | |
| 10 | 2008 | 3 | |
| 11 | 2005 | 4 | |
| 12 | 2004 | 5 | |
| 13 | 2003 | 1 | |
| 14 | 2002 | 5 | |
| 15 | 2000 | 1 | |
| 16 | 1999 | 1 | |
| 17 | 1999 | 1 | |
| 18 | 1998 | 1 | |
| 19 | 1994 | 2 | |
| 20 | 1993 | 1 |
About Kurt Ronse
Kurt Ronse is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Biomedical Engineering, Industrial and Manufacturing Engineering and Media Technology, having authored 132 papers that have together received 920 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (123 papers), Integrated Circuits and Semiconductor Failure Analysis (53 papers), Electron and X-Ray Spectroscopy Techniques (39 papers), Nanofabrication and Lithography Techniques (20 papers), Optical Coatings and Gratings (18 papers), Advanced Surface Polishing Techniques (17 papers), 3D IC and TSV technologies (17 papers) and Advanced optical system design (16 papers). The work is most often cited by research in Surfaces, Coatings and Films (292 citations), Electrical and Electronic Engineering (836 citations), Hardware and Architecture (49 citations), Industrial and Manufacturing Engineering (62 citations) and Biomedical Engineering (269 citations). Kurt Ronse has collaborated with scholars based in Belgium, United States and Netherlands. Frequent co-authors include R. Jonckheere, Eric Hendrickx, Geert Vandenberghe, Luc Van den hove, Julien Ryckaert, Jan Hermans, Gian F. Lorusso, Alan Myers, Diederik Verkest and Zsolt Tökei. Their work appears in journals such as Microelectronic Engineering, Journal of Photopolymer Science and Technology, Japanese Journal of Applied Physics, Micro and Nano Engineering and Comptes Rendus Physique.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.