Scott Mansfield
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 7
- Biomedical Engineering top 5%
- Biophysics top 5%
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- Advancements in Photolithography Techniques 32
- Integrated Circuits and Semiconductor Failure Analysis 7
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing 5
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- Industrial Vision Systems and Defect Detection 10
- Manufacturing Process and Optimization 5
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- Advanced Radiotherapy Techniques 5
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- Advanced Measurement and Metrology Techniques 4
- Co-authors
- G. S. KinoAlfred K. K. WongLars W. LiebmannKiyoshi OsatoW. R. StudenmundRichard A. FergusonAlan C. ThomasMark A. Lavin
- Journals
- Medical Physics (4 papers)IEEE Communications Standards Magazine (3 papers)Journal of Micro/Nanolithography MEMS and MOEMS (2 papers)
- Partner nations
- United StatesHungaryJapan
In The Last Decade
Scott Mansfield
47 papers receiving 1.0k citations
Hit Papers
Peers
Comparison fields: 5 of 51
- Surfaces, Coatings and Films 273
- Biomedical Engineering 714
- Biophysics 82
- Electrical and Electronic Engineering 745
- Hardware and Architecture 83
Countries citing papers authored by Scott Mansfield
This map shows the geographic impact of Scott Mansfield's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Scott Mansfield with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Scott Mansfield more than expected).
Fields of papers citing papers by Scott Mansfield
This network shows the impact of papers produced by Scott Mansfield. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Scott Mansfield. The network helps show where Scott Mansfield may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Scott Mansfield, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2018 | 2 | |
| 2 | 2018 | 5 | |
| 3 | 2014 | 2 | |
| 4 | 2013 | 0 | |
| 5 | 2011 | 7 | |
| 6 | 2010 | 5 | |
| 7 | MPLS TP Network Management Requirements | 2010 | 2 |
| 8 | MPLS-TP Network Management Framework | 2010 | 2 |
| 9 | 2008 | 3 | |
| 10 | 2007 | 3 | |
| 11 | 2007 | 4 | |
| 12 | 2006 | 5 | |
| 13 | 2005 | 4 | |
| 14 | 2005 | 7 | |
| 15 | 2001 | 23 | |
| 16 | 2000 | 24 | |
| 17 | 2000 | 7 | |
| 18 | 2000 | 96 | |
| 19 | 1998 | 4 | |
| 20 | 1998 | 29 |
About Scott Mansfield
Scott Mansfield is a scholar working on Industrial and Manufacturing Engineering, Surfaces, Coatings and Films, Hardware and Architecture, Radiation and Electrical and Electronic Engineering, having authored 50 papers that have together received 1.1k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (32 papers), Industrial Vision Systems and Defect Detection (10 papers), Electron and X-Ray Spectroscopy Techniques (7 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), VLSI and Analog Circuit Testing (5 papers), Advanced Radiotherapy Techniques (5 papers), Manufacturing Process and Optimization (5 papers) and Advanced Measurement and Metrology Techniques (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (273 citations), Biomedical Engineering (714 citations), Biophysics (82 citations), Electrical and Electronic Engineering (745 citations) and Hardware and Architecture (83 citations). Scott Mansfield has collaborated with scholars based in United States, Hungary and Japan. Frequent co-authors include G. S. Kino, Alfred K. K. Wong, Lars W. Liebmann, Kiyoshi Osato, W. R. Studenmund, Richard A. Ferguson, Alan C. Thomas, Mark A. Lavin, Geng Han and R. Tsai. Their work appears in journals such as Medical Physics, IEEE Communications Standards Magazine, Journal of Micro/Nanolithography MEMS and MOEMS, IEEE Transactions on Semiconductor Manufacturing and Microelectronic Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.