Yuri Granik

1.1k total citations
79 papers, 848 citations indexed

About

Yuri Granik is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, Yuri Granik has authored 79 papers receiving a total of 848 indexed citations (citations by other indexed papers that have themselves been cited), including 73 papers in Electrical and Electronic Engineering, 25 papers in Biomedical Engineering and 20 papers in Surfaces, Coatings and Films. Recurrent topics in Yuri Granik's work include Advancements in Photolithography Techniques (71 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers) and Electron and X-Ray Spectroscopy Techniques (17 papers). Yuri Granik is often cited by papers focused on Advancements in Photolithography Techniques (71 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers) and Electron and X-Ray Spectroscopy Techniques (17 papers). Yuri Granik collaborates with scholars based in United States, Hungary and Belgium. Yuri Granik's co-authors include Nicolas B. Cobb, Dmitry Medvedev, J. Andres Torres, Thuy Do, James Word, Germain Fenger, Alexander Tritchkov, Yuansheng Ma, Joost Bekaert and Julien Ryckaert and has published in prestigious journals such as Journal of Micro/Nanolithography MEMS and MOEMS, Microelectronics Journal and Journal of Micro/Nanopatterning Materials and Metrology.

In The Last Decade

Yuri Granik

74 papers receiving 795 citations

Peers

Countries citing papers authored by Yuri Granik

Since Specialization

Citations

This map shows the geographic impact of Yuri Granik's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yuri Granik with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yuri Granik more than expected).

Fields of papers citing papers by Yuri Granik

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Yuri Granik. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yuri Granik. The network helps show where Yuri Granik may publish in the future.

Co-authorship network of co-authors of Yuri Granik

This figure shows the co-authorship network connecting the top 25 collaborators of Yuri Granik. A scholar is included among the top collaborators of Yuri Granik based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yuri Granik. Yuri Granik is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Structured assist features in inverse lithography 2023 ·Yuri Granik, Philip Wang	1
2	Analytical solutions for the deformation of a photoresist film 2019 ·Yuri Granik	1
3	Evaluation of compact models for negative-tone development layers at 20/14nm nodes 2015 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Ao Chen, (unknown), (unknown), Hongxin Zhang, (unknown), David S. Fryer, Yunfei Deng, Dmitry Medvedev, Yuri Granik	6
4	Compact model experimental validation for grapho-epitaxy hole processes and its impact in mask making tolerances 2014 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Germain Fenger, J. Andres Torres, Yuansheng Ma, Yuri Granik, (unknown), (unknown), (unknown), (unknown), Raluca Tiron	6
5	Contour-based self-aligning calibration of OPC models 2010 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Thuy Do, Yuri Granik, John L. Sturtevant, Peter De Bisschop, (unknown)	6
6	Application of pixel-based mask optimization technique for high transmission attenuated PSM 2009 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), Yuri Granik, Eric Hendrickx, Geert Vandenberghe, (unknown), Germain Fenger, (unknown), (unknown)	2
7	On the uniqueness of optical images and solutions of inverse lithographical problems 2009 ·Journal of Micro/Nanolithography MEMS and MOEMS ·Yuri Granik	5
8	Extreme mask corrections: technology and benefits 2008 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Yuri Granik, (unknown), Dmitry Medvedev	11
9	Etch proximity correction by integrated model-based retargeting and OPC flow 2007 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Yuri Granik, (unknown)	6
10	Calibration of OPC models for multiple focus conditions 2004 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), Rainer Zimmermann, J. Andres Torres, Wilhelm Maurer, Yuri Granik, (unknown), George K. Hung, (unknown)	7
11	Full-chip-model-based correction of flare-induced linewidth variation 2004 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·James Word, (unknown), (unknown), Wilhelm Maurer, Yuri Granik, Emile Sahouria, (unknown)	11
12	OPC methods to improve image slope and process window 2003 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Nicolas B. Cobb, Yuri Granik	17
13	Efficient full-chip yield analysis methodology for OPC-corrected VLSI designs 2002 ·(unknown), Nicolas B. Cobb, (unknown), (unknown), Thuy Do, (unknown), Yuri Granik, Emile Sahouria, A. Balasiński	3
14	<title>Model-based OPC for sub-resolution assist feature enhanced layouts</title> 2002 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), Yuri Granik, Thuy Do	2
15	Contrast-based assist feature optimization 2002 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Yuri Granik, Luigi Capodieci	1
16	Model-based OPC considering process window aspects: a study 2002 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Steffen Schulze, (unknown), Rainer Zimmermann, (unknown), (unknown), Emile Sahouria, Yuri Granik, Nicolas B. Cobb	1
17	Full-chip Process Simulation for Silicon DRC 2000 ·TechConnect Briefs ·Nicolas B. Cobb, Yuri Granik, Emile Sahouria, (unknown)	8
18	Sub-half-micron contact window design with 3D photolithography simulator 1997 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), (unknown), Jiangwei Li, Yuri Granik, (unknown)	2
19	Advanced simulation techniques for thick photoresist lithography 1997 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Warren W. Flack, (unknown), (unknown), (unknown), Yuri Granik, (unknown)	6
20	CAESAR: The virtual IC factory as an integrated TCAD user environment 1995 ·Microelectronics Journal ·(unknown), Yuri Granik, (unknown)	4

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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