Eric M. Gullikson

14.8k total citations · 2 hit papers
375 papers, 10.9k citations indexed

About

Eric M. Gullikson is a scholar working on Electrical and Electronic Engineering, Radiation and Surfaces, Coatings and Films. According to data from OpenAlex, Eric M. Gullikson has authored 375 papers receiving a total of 10.9k indexed citations (citations by other indexed papers that have themselves been cited), including 169 papers in Electrical and Electronic Engineering, 168 papers in Radiation and 155 papers in Surfaces, Coatings and Films. Recurrent topics in Eric M. Gullikson's work include Advanced X-ray Imaging Techniques (116 papers), Advancements in Photolithography Techniques (114 papers) and Electron and X-Ray Spectroscopy Techniques (99 papers). Eric M. Gullikson is often cited by papers focused on Advanced X-ray Imaging Techniques (116 papers), Advancements in Photolithography Techniques (114 papers) and Electron and X-Ray Spectroscopy Techniques (99 papers). Eric M. Gullikson collaborates with scholars based in United States, Japan and Germany. Eric M. Gullikson's co-authors include B. L. Henke, J. H. Underwood, Régina Soufli, A. P. Mills, Farhad Salmassi, Andrew Aquila, Patrick Naulleau, David L. Windt, H. A. Padmore and D. G. Stearns and has published in prestigious journals such as Science, Physical Review Letters and Nature Communications.

In The Last Decade

Eric M. Gullikson

359 papers receiving 10.4k citations

Hit Papers

align trajectories sort by overperformance

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92

1993 4.7k citations B. L. Henke, Eric M. Gullikson et al. Atomic Data and Nuclear Data Tables profile →
Initial Calibration of the Atmospheric Imaging Assembly (AIA) on the Solar Dynamics Observatory (SDO)

2011 289 citations Régina Soufli, Eberhard Spiller et al. profile →

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author						Papers	Cites
Eric M. Gullikson	4.2k	3.4k	2.8k	2.6k	2.4k	375	10.9k
B. L. Henke	3.4k 0.8×	1.6k 0.5×	1.9k 0.7×	1.5k 0.6×	1.6k 0.7×	54	7.2k
H. A. Padmore	2.3k 0.6×	2.9k 0.9×	3.1k 1.1×	1.4k 0.5×	2.2k 0.9×	316	9.6k
Tetsuya Ishikawa	9.0k 2.2×	3.4k 1.0×	4.0k 1.4×	1.3k 0.5×	3.9k 1.6×	719	16.8k
Makina Yabashi	6.2k 1.5×	3.1k 0.9×	2.2k 0.8×	864 0.3×	2.7k 1.1×	531	11.0k
J. F. Ziegler	2.0k 0.5×	3.4k 1.0×	2.1k 0.7×	784 0.3×	2.0k 0.8×	160	8.1k
R. H. Ritchie	2.7k 0.6×	3.4k 1.0×	7.4k 2.6×	4.7k 1.8×	1.7k 0.7×	217	13.0k
K. Nugent	6.8k 1.6×	1.7k 0.5×	4.3k 1.5×	550 0.2×	1.5k 0.6×	396	11.5k
Jianwei Miao	5.9k 1.4×	1.5k 0.4×	2.6k 0.9×	1.1k 0.4×	2.7k 1.1×	137	11.2k
F. Aumayr	1.5k 0.3×	1.7k 0.5×	2.7k 1.0×	1.9k 0.7×	2.3k 1.0×	320	7.2k
T. Tanaka	2.4k 0.6×	2.1k 0.6×	1.6k 0.6×	583 0.2×	1.8k 0.8×	266	6.4k

Countries citing papers authored by Eric M. Gullikson

Since Specialization

Citations

This map shows the geographic impact of Eric M. Gullikson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric M. Gullikson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric M. Gullikson more than expected).

Fields of papers citing papers by Eric M. Gullikson

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Eric M. Gullikson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric M. Gullikson. The network helps show where Eric M. Gullikson may publish in the future.

Co-authorship network of co-authors of Eric M. Gullikson

This figure shows the co-authorship network connecting the top 25 collaborators of Eric M. Gullikson. A scholar is included among the top collaborators of Eric M. Gullikson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Eric M. Gullikson. Eric M. Gullikson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Rebellato, Jennifer, Regina Soufli, Evgueni Meltchakov, et al.. (2021). Optical, structural and aging properties of Al/Sc-based multilayers for the extreme ultraviolet. Thin Solid Films. 735. 138873–138873. 4 indexed citations

Rebellato, Jennifer, Regina Soufli, Evgueni Meltchakov, et al.. (2020). High efficiency Al/Sc-based multilayer coatings in the EUV wavelength range above 40 nanometers. Optics Letters. 45(4). 869–869. 13 indexed citations

Yin, Liang, Hanchen Wang, Brendan A. Reagan, et al.. (2020). Using Temporally Synthesized Laser Pulses to Enhance the Conversion Efficiency of Sn Plasmas for EUV Lithography. IEEE photonics journal. 13(1). 1–15. 7 indexed citations

Kuo, Cheng‐Tai, G. Ghiringhelli, Ping Yang, et al.. (2017). Determining the depth distribution of RIXS excitations through standing-wave excitation. Bulletin of the American Physical Society. 2017. 1 indexed citations

Cummings, K. D., L. Girard, Michael Goldstein, et al.. (2013). Projection optics for EUVL micro-field exposure tools with a numerical aperture of 0.5. eScholarship (California Digital Library). 1 indexed citations

Soufli, Régina, Sherry L. Baker, Eric M. Gullikson, et al.. (2012). Review of substrate materials, surface metrologies and polishing techniques for current and future-generation EUV/x-ray optics. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8501. 850102–850102. 16 indexed citations

Kriese, Michael D., et al.. (2011). Multilayers for next generation EUVL at 6.X nm. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8076. 80760N–80760N. 29 indexed citations

Voronov, Dmitriy L., Minseung Ahn, Eric H. Anderson, et al.. (2010). High-efficiency multilayer blazed gratings for EUV and soft x-rays: recent developments. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7802. 780207–780207. 21 indexed citations

Muramatsu, Yasuji, et al.. (2009). Quantitative and chemical-state analyses of surface oxygen on graphite oxides using total-electron-yield soft X-ray absorption spectroscopy. TANSO. 2009(236). 9–14. 9 indexed citations

10.

Muramatsu, Yasuji, et al.. (2009). Soft X-ray absorption spectra in the CK region of carbon black and spectral analysis using the discrete variational Xα method. TANSO. 2009(236). 2–8. 6 indexed citations

11.

Voronov, Dmitriy L., Erik H. Anderson, Rossana Cambié, et al.. (2009). 5000 groove/mm multilayer-coated blazed grating with 33% efficiency in the 3rd order in the EUV wavelength range. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7448. 74480J–74480J. 9 indexed citations

12.

Voronov, Dmitriy L., Rossana Cambié, Eric M. Gullikson, et al.. (2007). Development of an ultrahigh-resolution diffraction grating for soft x-rays. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6705. 67050E–67050E. 8 indexed citations

13.

Naulleau, Patrick, et al.. (2005). EUV Binary Phase Gratings: Fabrication and Application toDiffractive Optics. Journal of Vacuum Science and Technology. 24(4). 2 indexed citations

14.

Windt, David L., J. F. Seely, Benjawan Kjornrattanawanich, et al.. (2004). EUV multilayers for solar physics. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5168. 1–1. 48 indexed citations

15.

Naulleau, Patrick, J. Alexander Liddle, Farhad Salmassi, Erik H. Anderson, & Eric M. Gullikson. (2003). Design and fabrication of advanced EUV diffractive elements. University of North Texas Digital Library (University of North Texas). 1 indexed citations

16.

Naulleau, Patrick, Kenneth A. Goldberg, Erik H. Anderson, et al.. (2002). Lithographic characterization of the printability of programmed EUV substrate defects. University of North Texas Digital Library (University of North Texas). 21(4). 1 indexed citations

17.

Chang, Chang, Erik H. Anderson, Patrick Naulleau, et al.. (2001). Direct index of refraction measurement at extreme ultraviolet wavelength region with a novel interferometer. Optics Letters. 27(12). 1 indexed citations

18.

Koike, Masato, Takeshi Namioka, Eric M. Gullikson, et al.. (2000). <title>Varied-line-spacing laminar-type holographic grating for the standard soft x-ray flat-field spectrograph</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4146. 163–170. 16 indexed citations

19.

Underwood, J. H., Eric M. Gullikson, Masato Koike, & Stanley Mrowka. (1997). Experimental comparison of mechanically ruled and holographically recorded plane varied-line-spacing gratings. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3150. 40–40. 12 indexed citations

20.

Henke, B. L., et al.. (1993). X-Ray Interactions: Photoabsorption, Scattering, Transmission and Reflection E = 50-30,000 eV, Z = 1-92. Atomic Data and Nuclear Data Tables. 54(2). 13 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact