Luigi Capodieci
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture top 5%
- Biomedical Engineering
- Industrial and Manufacturing Engineering top 5%
- Computer Vision and Pattern Recognition
- Co-authors
- Jie YangDennis SylvesterAndrew R. NeureutherSandipan MishraCostas J. SpanosKameshwar PoollaNing MaPuneet Gupta
- Topics
- Advancements in Photolithography Techniques (41 papers)VLSI and FPGA Design Techniques (15 papers)Industrial Vision Systems and Defect Detection (15 papers)
- Cited by
- Hardware and ArchitectureIndustrial and Manufacturing EngineeringElectrical and Electronic Engineering
- Journals
- International Conference on Computer Aided DesignJournal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and PhenomenaSymposium on VLSI Technology
- Partner nations
- United StatesHungaryNetherlands
In The Last Decade
Luigi Capodieci
55 papers receiving 475 citations
Peers
Comparison fields: 5 of 34
- Electrical and Electronic Engineering 473
- Hardware and Architecture 132
- Biomedical Engineering 124
- Industrial and Manufacturing Engineering 116
- Computer Vision and Pattern Recognition 37
Countries citing papers authored by Luigi Capodieci
This map shows the geographic impact of Luigi Capodieci's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Luigi Capodieci with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Luigi Capodieci more than expected).
Fields of papers citing papers by Luigi Capodieci
This network shows the impact of papers produced by Luigi Capodieci. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Luigi Capodieci. The network helps show where Luigi Capodieci may publish in the future.
Co-authorship network of co-authors of Luigi Capodieci
This figure shows the co-authorship network connecting the top 25 collaborators of Luigi Capodieci. A scholar is included among the top collaborators of Luigi Capodieci based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Luigi Capodieci. Luigi Capodieci is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 4 | |
| 3 | 2 | |
| 4 | 1 | |
| 5 | 5 | |
| 6 | 2 | |
| 7 | Design enablement for yield and area optimization at 20 nm and below | 0 |
| 8 | 16 | |
| 9 | 21 | |
| 10 | 1 | |
| 11 | 7 | |
| 12 | 5 | |
| 13 | 4 | |
| 14 | 3 | |
| 15 | 36 | |
| 16 | 1 | |
| 17 | 1 | |
| 18 | 19 | |
| 19 | 1 | |
| 20 | 7 |
About Luigi Capodieci
Luigi Capodieci is a scholar working on Industrial and Manufacturing Engineering, Hardware and Architecture and Electrical and Electronic Engineering, having authored 58 papers that have together received 513 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (41 papers), VLSI and FPGA Design Techniques (15 papers) and Industrial Vision Systems and Defect Detection (15 papers). The work is most often cited by research in Hardware and Architecture (132 citations), Industrial and Manufacturing Engineering (116 citations) and Electrical and Electronic Engineering (473 citations). Luigi Capodieci has collaborated with scholars based in United States, Hungary and Netherlands. Frequent co-authors include Jie Yang, Dennis Sylvester, Andrew R. Neureuther, Jie Yang, Sandipan Mishra, Costas J. Spanos, Kameshwar Poolla, Ning Ma, Puneet Gupta and Andrew B. Kahng. Their work appears in journals such as International Conference on Computer Aided Design, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and Symposium on VLSI Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.