J. Mogab
Impact in
-
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Silicon Carbide Semiconductor Technologies
Papers in
-
- Semiconductor materials and devices 11
- Advancements in Semiconductor Devices and Circuit Design 10
- Integrated Circuits and Semiconductor Failure Analysis 8
- Silicon Carbide Semiconductor Technologies 2
- Silicon and Solar Cell Technologies 2
- Photonic and Optical Devices 1
-
- Metal and Thin Film Mechanics 1
- Co-authors
- Philip J. Tobin (4 shared papers)S. Samavedam (4 shared papers)Ana María Miranda Zavala (4 shared papers)J. Schaeffer (4 shared papers)Bich-Yen Nguyen (4 shared papers)B. E. White (3 shared papers)R. Martín (2 shared papers)L.B. La (3 shared papers)
- Journals
- IEEE Electron Device Letters (1 paper)IEEE Transactions on Nanotechnology (1 paper)IEE Proceedings - Optoelectronics (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)MRS Proceedings (1 paper)
- Partner nations
- United StatesTaiwan
In The Last Decade
J. Mogab
11 papers receiving 196 citations
Peers
Comparison fields: 5 of 16
- Electrical and Electronic Engineering 209
- Instrumentation 6
- Electronic, Optical and Magnetic Materials 18
- Atomic and Molecular Physics, and Optics 26
- Mechanics of Materials 20
Countries citing papers authored by J. Mogab
This map shows the geographic impact of J. Mogab's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Mogab with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Mogab more than expected).
Fields of papers citing papers by J. Mogab
This network shows the impact of papers produced by J. Mogab. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Mogab. The network helps show where J. Mogab may publish in the future.
Co-authors
The 25 scholars most cited alongside J. Mogab, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 85 | |
| 2 | 2003 | 24 | |
| 3 | 2002 | 22 | |
| 4 | 2006 | 16 | |
| 5 | 2003 | 14 | |
| 6 | 2002 | 13 | |
| 7 | 1999 | 11 | |
| 8 | 2003 | 11 | |
| 9 | 2006 | 5 | |
| 10 | 2002 | 5 | |
| 11 | 2002 | 4 | |
| 12 | 2003 | 1 |
About J. Mogab
J. Mogab is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Instrumentation, Infectious Diseases and Organic Chemistry, having authored 12 papers that have together received 211 indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), Silicon Carbide Semiconductor Technologies (2 papers), Silicon and Solar Cell Technologies (2 papers), Metal and Thin Film Mechanics (1 paper), Photonic and Optical Devices (1 paper) and Advanced Optical Sensing Technologies (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (209 citations), Instrumentation (6 citations), Electronic, Optical and Magnetic Materials (18 citations), Atomic and Molecular Physics, and Optics (26 citations) and Mechanics of Materials (20 citations). J. Mogab has collaborated with scholars based in United States and Taiwan. Frequent co-authors include Philip J. Tobin, S. Samavedam, Ana María Miranda Zavala, J. Schaeffer, Bich-Yen Nguyen, B. E. White, R. Martín, L.B. La, M. V. Raymond and R. Gregory. Their work appears in journals such as IEEE Electron Device Letters, IEEE Transactions on Nanotechnology, IEE Proceedings - Optoelectronics, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and MRS Proceedings.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.