M. Haond
Impact in
-
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Thin-Film Transistor Technologies
- Silicon and Solar Cell Technologies
- Ferroelectric and Negative Capacitance Devices
- Radio Frequency Integrated Circuit Design
Papers in
-
- Semiconductor materials and devices 75
- Advancements in Semiconductor Devices and Circuit Design 67
- Integrated Circuits and Semiconductor Failure Analysis 30
- Thin-Film Transistor Technologies 22
- Silicon and Solar Cell Technologies 16
- Silicon Carbide Semiconductor Technologies 14
- Co-authors
- N. PlanesDenis FlandreValeriya KilchytskaD. BensahelBabak Kazemi EsfehJean‐Pierre RaskinM. PaoliD.P. Vu
- Journals
- Electronics Letters (9 papers)Solid-State Electronics (8 papers)Microelectronic Engineering (5 papers)Journal of Applied Physics (3 papers)IEEE Transactions on Electron Devices (2 papers)
- Partner nations
- FranceBelgiumSwitzerland
In The Last Decade
M. Haond
90 papers receiving 860 citations
Peers
Comparison fields: 5 of 28
- Electrical and Electronic Engineering 906
- Hardware and Architecture 22
- Biomedical Engineering 124
- Materials Chemistry 123
- Atomic and Molecular Physics, and Optics 78
Countries citing papers authored by M. Haond
This map shows the geographic impact of M. Haond's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Haond with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Haond more than expected).
Fields of papers citing papers by M. Haond
This network shows the impact of papers produced by M. Haond. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Haond. The network helps show where M. Haond may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M. Haond, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 13 | |
| 2 | 2019 | 13 | |
| 3 | Back-gate bias effect on 3-port UTBB-FDSOI non-linearity performance | 2017 | 3 |
| 4 | 2017 | 15 | |
| 5 | 2015 | 28 | |
| 6 | 2015 | 6 | |
| 7 | 2014 | 3 | |
| 8 | 2014 | 3 | |
| 9 | 2002 | 0 | |
| 10 | Improved understanding and optimization of 0.18um CMOS technology with retrograde channel and pockets | 1998 | 2 |
| 11 | Analysis of Parasitic Effects in Advanced Isolation Schemes for Deep Submicron CMOS Technologies | 1995 | 2 |
| 12 | Channel Engineering by Heavy Ion Implants | 1994 | 6 |
| 13 | Intrinsic gate capacitances of SOI MOSFETs: measurement, modelling, floating substrate effects | 1990 | 1 |
| 14 | Rounded edge mesa for submicron SOI CMOS process | 1990 | 4 |
| 15 | 1990 | 13 | |
| 16 | Gate Oxide Breakdown in a SOI CMOS Process Usilng MESA Isolatioon | 1989 | 4 |
| 17 | 1989 | 12 | |
| 18 | Electrical Parameters of SOI Material Obtained by ZMR and Oxidized Porous Silicon | 1987 | 3 |
| 19 | 1984 | 4 | |
| 20 | 1983 | 1 |
About M. Haond
M. Haond is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 100 papers that have together received 936 indexed citations. Recurring topics across this work include Semiconductor materials and devices (75 papers), Advancements in Semiconductor Devices and Circuit Design (67 papers), Integrated Circuits and Semiconductor Failure Analysis (30 papers), Thin-Film Transistor Technologies (22 papers), Silicon and Solar Cell Technologies (16 papers), Silicon Carbide Semiconductor Technologies (14 papers), Silicon Nanostructures and Photoluminescence (9 papers) and Semiconductor materials and interfaces (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (906 citations), Hardware and Architecture (22 citations), Biomedical Engineering (124 citations), Materials Chemistry (123 citations) and Atomic and Molecular Physics, and Optics (78 citations). M. Haond has collaborated with scholars based in France, Belgium and Switzerland. Frequent co-authors include N. Planes, Denis Flandre, Valeriya Kilchytska, D. Bensahel, Babak Kazemi Esfeh, Jean‐Pierre Raskin, M. Paoli, D.P. Vu, D. Dutartre and M. Dupuy. Their work appears in journals such as Electronics Letters, Solid-State Electronics, Microelectronic Engineering, Journal of Applied Physics and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.