M. Bidaud
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- Semiconductor materials and devices 15
- Advancements in Semiconductor Devices and Circuit Design 13
- Integrated Circuits and Semiconductor Failure Analysis 10
- Silicon and Solar Cell Technologies 4
- Ferroelectric and Negative Capacitance Devices 2
- Advanced Memory and Neural Computing 2
- Thin-Film Transistor Technologies 2
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- Thermal properties of materials 1
- Cited by
- Electrical and Electronic EngineeringSurfaces, Coatings and FilmsAtomic and Molecular Physics, and Optics
- Journals
- Microelectronic Engineering (2 papers)Journal of Non-Crystalline Solids (1 paper)Materials Science in Semiconductor Processing (1 paper)
- Partner nations
- FranceIndiaSwitzerland
In The Last Decade
M. Bidaud
19 papers receiving 89 citations
Peers
Comparison fields: 5 of 17
- Electrical and Electronic Engineering 89
- Surfaces, Coatings and Films 4
- Atomic and Molecular Physics, and Optics 12
- Computational Mechanics 7
- Hardware and Architecture 2
Countries citing papers authored by M. Bidaud
This map shows the geographic impact of M. Bidaud's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Bidaud with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Bidaud more than expected).
Fields of papers citing papers by M. Bidaud
This network shows the impact of papers produced by M. Bidaud. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Bidaud. The network helps show where M. Bidaud may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M. Bidaud, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2014 | 3 | |
| 2 | 2009 | 5 | |
| 3 | 2009 | 3 | |
| 4 | 2008 | 13 | |
| 5 | 2007 | 5 | |
| 6 | 2005 | 7 | |
| 7 | 2005 | 19 | |
| 8 | 2004 | 5 | |
| 9 | 2004 | 7 | |
| 10 | 2004 | 1 | |
| 11 | 2003 | 2 | |
| 12 | 2002 | 1 | |
| 13 | 2002 | 4 | |
| 14 | 2002 | 2 | |
| 15 | 2002 | 3 | |
| 16 | 2001 | 2 | |
| 17 | 2000 | 2 | |
| 18 | 2000 | 1 | |
| 19 | 1999 | 11 |
About M. Bidaud
M. Bidaud is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials, having authored 19 papers that have together received 96 indexed citations. Recurring topics across this work include Semiconductor materials and devices (15 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers), Silicon and Solar Cell Technologies (4 papers), Ferroelectric and Negative Capacitance Devices (2 papers), Advanced Memory and Neural Computing (2 papers), Thin-Film Transistor Technologies (2 papers) and Thermal properties of materials (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (89 citations), Surfaces, Coatings and Films (4 citations) and Atomic and Molecular Physics, and Optics (12 citations). M. Bidaud has collaborated with scholars based in France, India and Switzerland. Frequent co-authors include F. Arnaud, D. Barge, É. Fogarassy, D. Mathiot, M. Valenza, T. Skotnicki, P. Morin, F. Mart́ınez, C. Leyris and F. Bœuf. Their work appears in journals such as Microelectronic Engineering, Journal of Non-Crystalline Solids, Materials Science in Semiconductor Processing, Microelectronics Reliability and Materials Science and Engineering B.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.