V. Carron

961 total citations
43 papers, 451 citations indexed

About

V. Carron is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanical Engineering. According to data from OpenAlex, V. Carron has authored 43 papers receiving a total of 451 indexed citations (citations by other indexed papers that have themselves been cited), including 43 papers in Electrical and Electronic Engineering, 24 papers in Atomic and Molecular Physics, and Optics and 5 papers in Mechanical Engineering. Recurrent topics in V. Carron's work include Semiconductor materials and interfaces (23 papers), Semiconductor materials and devices (22 papers) and Silicon and Solar Cell Technologies (15 papers). V. Carron is often cited by papers focused on Semiconductor materials and interfaces (23 papers), Semiconductor materials and devices (22 papers) and Silicon and Solar Cell Technologies (15 papers). V. Carron collaborates with scholars based in France, Switzerland and Hungary. V. Carron's co-authors include David Cooper, Armand Béché, Jean‐Luc Rouvière, D. Mangelinck, Jean-Michel Hartmann, K. Hoummada, F. Nemouchi, M. Vinet, P. Batude and V. Mazzocchi and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Scripta Materialia.

In The Last Decade

V. Carron

42 papers receiving 430 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
V. Carron France	12	379	184	102	55	32	43	451
B. Volland Germany	13	432 1.1×	223 1.2×	198 1.9×	74 1.3×	41 1.3×	38	535
Jeffrey Lam Singapore	8	195 0.5×	78 0.4×	70 0.7×	37 0.7×	17 0.5×	76	261
Elshad Guliyev Germany	12	181 0.5×	237 1.3×	138 1.4×	42 0.8×	22 0.7×	22	314
Katsuya Okumura Japan	12	374 1.0×	47 0.3×	98 1.0×	54 1.0×	23 0.7×	56	430
L. Baud France	14	370 1.0×	145 0.8×	61 0.6×	75 1.4×	115 3.6×	28	499
Tsutomu Tajima Japan	11	355 0.9×	73 0.4×	78 0.8×	57 1.0×	9 0.3×	32	466
Lee Smith United States	18	794 2.1×	111 0.6×	189 1.9×	55 1.0×	10 0.3×	64	830
S. Sivakumar United States	5	753 2.0×	124 0.7×	222 2.2×	112 2.0×	8 0.3×	9	815
Babak Mokaberi United States	6	108 0.3×	261 1.4×	133 1.3×	59 1.1×	34 1.1×	9	358
Tzv. Ivanov Germany	12	253 0.7×	265 1.4×	106 1.0×	36 0.7×	19 0.6×	20	345

Countries citing papers authored by V. Carron

Since Specialization

Citations

This map shows the geographic impact of V. Carron's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Carron with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Carron more than expected).

Fields of papers citing papers by V. Carron

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Carron. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Carron. The network helps show where V. Carron may publish in the future.

Co-authorship network of co-authors of V. Carron

This figure shows the co-authorship network connecting the top 25 collaborators of V. Carron. A scholar is included among the top collaborators of V. Carron based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with V. Carron. V. Carron is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Menezo, Sylvie, Antoine Descos, Damien Bordel, et al.. (2014). Advances on III-V on Silicon DBR and DFB Lasers for WDM Optical Interconnects and Associated Heterogeneous Integration 200mm-Wafer-Scale Technology. 1–6. 4 indexed citations

Bakir, Badhise Ben, Corrado Sciancalepore, Antoine Descos, et al.. (2014). (Invited) Heterogeneously Integrated III-V on Silicon Lasers. ECS Transactions. 64(5). 211–223. 11 indexed citations

Hutin, Louis, O. Rozeau, V. Carron, et al.. (2014). Junction technology outlook for sub-28nm FDSOI CMOS. 1–6. 7 indexed citations

Bogumilowicz, Y., Alexandra Abbadie, V. Klinger, et al.. (2013). Realization and characterization of thin single crystal Ge films on sapphire. Semiconductor Science and Technology. 28(3). 35013–35013. 5 indexed citations

Nemouchi, F., V. Carron, Y. Morand, et al.. (2013). Evaluation Of Ni(Si_1-xGe_x) and Pt(Si_1-xGe_x) Contact Resistance for FD-SOI PMOS Metallic Source and Drain. ECS Transactions. 50(9). 197–204. 3 indexed citations

Carron, V., et al.. (2013). Source and Drain Contact Module for FDSOI MOSFETs : Silicidation and Strain Engineering. ECS Transactions. 58(9). 239–248. 3 indexed citations

Hoummada, K., et al.. (2013). Formation of Pt silicide on doped Si: Kinetics and stress. Thin Solid Films. 542. 174–179. 5 indexed citations

Nemouchi, F., V. Carron, János L. Lábár, et al.. (2013). Formation of NiGe through germanium oxide on Ge(0 0 1) substrate. Microelectronic Engineering. 107. 178–183. 6 indexed citations

Batude, P., M. Vinet, A. Pouydebasque, et al.. (2011). 3D monolithic integration. 2233–2236. 18 indexed citations

10.

Cooper, David, et al.. (2011). Strain measurement for the semiconductor industry with nm-scale resolution by dark field electron holography and nanobeam electron diffraction. 3 indexed citations

11.

Royer, C. Le, Benjamin Vincent, K. Romanjek, et al.. (2011). High mobility CMOS: First demonstration of planar GeOI p-FETs with SOI n-FETs. Solid-State Electronics. 59(1). 2–7. 11 indexed citations

12.

Blum, Ivan, A. Portavoce, Lee Chow, et al.. (2010). B diffusion in implanted Ni2Si and NiSi layers. Applied Physics Letters. 96(5). 9 indexed citations

13.

Cooper, David, Armand Béché, Jean Michel Hartmann, V. Carron, & Jean‐Luc Rouvière. (2010). Strain mapping for the semiconductor industry by dark-field electron holography and nanobeam electron diffraction with nm resolution. Semiconductor Science and Technology. 25(9). 95012–95012. 27 indexed citations

14.

Vinet, M., P. Batude, C. Tabone, et al.. (2010). 3D monolithic integration: Technological challenges and electrical results. Microelectronic Engineering. 88(4). 331–335. 52 indexed citations

15.

Vinet, M., T. Poiroux, Christophe Licitra, et al.. (2009). Self-Aligned Planar Double-Gate MOSFETs by Bonding for 22-nm Node, With Metal Gates, High- $\kappa$ Dielectrics, and Metallic Source/Drain. IEEE Electron Device Letters. 30(7). 748–750. 10 indexed citations

16.

Poiroux, T., M. Vinet, F. Nemouchi, et al.. (2009). Highly performant FDSOI pMOSFETs with metallic source/drain. 87. 88–89. 3 indexed citations

17.

Nolot, Emmanuel, V. Carron, F. Nemouchi, et al.. (2007). Laser Scattering: a Fast, Sensitive, In-Line Technique for Advanced Process Development and Monitoring. AIP conference proceedings. 931. 116–120. 9 indexed citations

18.

Carron, V., et al.. (2007). Characterization of CMOS sub-65nm metallic contact by laser scattering: Thermal stability of Ni(Si1−xGex). Microelectronic Engineering. 84(11). 2558–2562. 7 indexed citations

19.

Carron, V., János L. Lábár, Magali Putero, et al.. (2007). Dopant Effect On NiGe Texture During Nickel Germanide Growth. ECS Transactions. 6(16). 49–59. 3 indexed citations

20.

Pouydebasque, A., B. Dumont, A. Halimaoui, et al.. (2005). CMOS integration of solid phase epitaxy for sub-50nm devices. 2004. 419–422. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact