Winfried Kaiser
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 19
- Optical Coatings and Gratings 5
- Radiation top 5%
- Advanced X-ray Imaging Techniques 7
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- Advancements in Photolithography Techniques 32
- Integrated Circuits and Semiconductor Failure Analysis 16
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- Advanced Surface Polishing Techniques 2
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- Advanced Measurement and Metrology Techniques 4
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- Adaptive optics and wavefront sensing 2
- Co-authors
- Jan van SchootJens Timo NeumannBernhard KneerMichael TotzeckPaul GräupnerKars TroostJudon StoeldraijerPeter Kuerz
- Journals
- Journal of Micro/Nanolithography MEMS and MOEMS (1 paper)Nature Photonics (1 paper)Solid State Technology (1 paper)
- Partner nations
- GermanyNetherlandsUnited States
In The Last Decade
Winfried Kaiser
35 papers receiving 591 citations
Peers
Comparison fields: 5 of 47
- Surfaces, Coatings and Films 268
- Radiation 106
- Electrical and Electronic Engineering 517
- Biomedical Engineering 225
- Structural Biology 7
Countries citing papers authored by Winfried Kaiser
This map shows the geographic impact of Winfried Kaiser's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Winfried Kaiser with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Winfried Kaiser more than expected).
Fields of papers citing papers by Winfried Kaiser
This network shows the impact of papers produced by Winfried Kaiser. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Winfried Kaiser. The network helps show where Winfried Kaiser may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Winfried Kaiser, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 4 | |
| 2 | 2021 | 16 | |
| 3 | 2020 | 31 | |
| 4 | 2020 | 22 | |
| 5 | 2019 | 1 | |
| 6 | 2019 | 2 | |
| 7 | 2019 | 11 | |
| 8 | 2019 | 29 | |
| 9 | 2018 | 9 | |
| 10 | 2017 | 48 | |
| 11 | 2016 | 11 | |
| 12 | 2015 | 20 | |
| 13 | 2015 | 54 | |
| 14 | 2013 | 20 | |
| 15 | 2008 | 2 | |
| 16 | 2002 | 9 | |
| 17 | Soft X-Ray and EUV Imaging Systems | 2000 | 5 |
| 18 | 2000 | 8 | |
| 19 | EUCLIDES: European EUV lithography milestones | 1999 | 3 |
| 20 | 1999 | 9 |
About Winfried Kaiser
Winfried Kaiser is a scholar working on Surfaces, Coatings and Films, Radiation, Electrical and Electronic Engineering, Biomedical Engineering and Mechanical Engineering, having authored 35 papers that have together received 656 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (32 papers), Electron and X-Ray Spectroscopy Techniques (19 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Advanced X-ray Imaging Techniques (7 papers), Optical Coatings and Gratings (5 papers), Advanced Measurement and Metrology Techniques (4 papers), Adaptive optics and wavefront sensing (2 papers) and Advanced Surface Polishing Techniques (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (268 citations), Radiation (106 citations), Electrical and Electronic Engineering (517 citations), Biomedical Engineering (225 citations) and Structural Biology (7 citations). Winfried Kaiser has collaborated with scholars based in Germany, Netherlands and United States. Frequent co-authors include Jan van Schoot, Jens Timo Neumann, Bernhard Kneer, Michael Totzeck, Paul Gräupner, Kars Troost, Judon Stoeldraijer, Peter Kuerz, Eelco van Setten and Jos Benschop. Their work appears in journals such as Journal of Micro/Nanolithography MEMS and MOEMS, Nature Photonics, Solid State Technology, Optik & Photonik and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.