Alan Myers

866 total citations
37 papers, 710 citations indexed

About

Alan Myers is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering. According to data from OpenAlex, Alan Myers has authored 37 papers receiving a total of 710 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 14 papers in Surfaces, Coatings and Films and 8 papers in Biomedical Engineering. Recurrent topics in Alan Myers's work include Advancements in Photolithography Techniques (14 papers), Electron and X-Ray Spectroscopy Techniques (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). Alan Myers is often cited by papers focused on Advancements in Photolithography Techniques (14 papers), Electron and X-Ray Spectroscopy Techniques (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). Alan Myers collaborates with scholars based in United States, Belgium and South Korea. Alan Myers's co-authors include John R. Abelson, N. Maley, Mustafa Pinarbasi, Suzana Prstic, Ravi Prasher, David Chau, Je-Young Chang, Dongming He, Shuhuai Yao and Juan G. Santiago and has published in prestigious journals such as Nano Letters, Journal of Applied Physics and Sensors and Actuators B Chemical.

In The Last Decade

Alan Myers

36 papers receiving 665 citations

Peers

Countries citing papers authored by Alan Myers

Since Specialization

Citations

This map shows the geographic impact of Alan Myers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alan Myers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alan Myers more than expected).

Fields of papers citing papers by Alan Myers

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Alan Myers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alan Myers. The network helps show where Alan Myers may publish in the future.

Co-authorship network of co-authors of Alan Myers

This figure shows the co-authorship network connecting the top 25 collaborators of Alan Myers. A scholar is included among the top collaborators of Alan Myers based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Alan Myers. Alan Myers is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Nanoscale chemical structure variations in nano-patterned and nano-porous low-k dielectrics: A comparative photothermal induced resonance and infrared spectroscopy investigation 2016 ·Vibrational Spectroscopy ·Qichi Hu, Kevin Kjoller, Alan Myers, Kanwal Jit Singh, Sean W. King	9
2	Picosecond ultrasonic study of surface acoustic waves on titanium nitride nanostructures 2015 ·Journal of Applied Physics ·(unknown), (unknown), (unknown), (unknown), Brian C. Daly, G. A. Antonelli, Alan Myers, Kanwal Jit Singh, Hui Jae Yoo, Sean W. King	6
3	Nanoscale Buckling of Ultrathin Low-k Dielectric Lines during Hard-Mask Patterning 2015 ·Nano Letters ·Gheorghe Stan, Cristian V. Ciobanu, Igor Levin, Hui Jae Yoo, Alan Myers, Kanwal Jit Singh, Christopher Jezewski, B. Miner, Sean W. King	12
4	Bonding Structure of Model Fluorocarbon Polymer Residue Determined by Functional Group Specific Chemical Derivatization 2013 ·ECS Solid State Letters ·Tamal Mukherjee, (unknown), (unknown), Oliver Chyan, Kanwal Jit Singh, Alan Myers	17
5	Investigation of EUV mask defectivity via full-field printing and inspection on wafer 2009 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·R. Jonckheere, Dieter Van den Heuvel, (unknown), (unknown), Alan Myers, (unknown), (unknown), Eric Hendrickx, Kurt Ronse	16
6	Demonstration of full-field patterning of 32 nm test chips using EUVL 2009 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Manish Chandhok, E. Steve Putna, Todd R. Younkin, James S. Clarke, (unknown), Alan Myers, (unknown), Guojing Zhang, Ted Liang, (unknown)	8
7	Imaging performance of the EUV alpha semo tool at IMEC 2008 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Gian F. Lorusso, Jan Hermans, (unknown), (unknown), Frieda Van Roey, Alan Myers, I. Kim, B. S. Kim, R. Jonckheere, (unknown), Sjoerd Lok, (unknown), Jean‐François de Marneffe, S. Demuynck, (unknown), Kurt Ronse	11
8	EUV pattern shift compensation strategies 2008 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), (unknown), Gian F. Lorusso, Alan Myers, R. Jonckheere, (unknown), Kurt Ronse	20
9	EUV lithography program at IMEC 2007 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), R. Jonckheere, Gian F. Lorusso, Jan Hermans, Frieda Van Roey, Alan Myers, Manish Chandhok, Insung Kim, (unknown), (unknown), (unknown), Roel Gronheid, (unknown), Kurt Ronse	24
10	Status of EUV lithography at IMEC 2007 ·Journal of Photopolymer Science and Technology ·(unknown), (unknown), (unknown), Jan Hermans, Frieda Van Roey, Alan Myers, (unknown), I. Kim, (unknown), (unknown), Kurt Ronse	17
11	Full field EUV lithography turning into a reality at IMEC 2007 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·R. Jonckheere, Gian F. Lorusso, (unknown), Jan Hermans, (unknown), Alan Myers, Insung Kim, (unknown), (unknown), (unknown), Kurt Ronse	4
12	Nusselt Number and Friction Factor of Staggered Arrays of Low Aspect Ratio Micropin-Fins Under Cross Flow for Water as Fluid 2006 ·Journal of Heat Transfer ·Ravi Prasher, (unknown), Je-Young Chang, Alan Myers, David Chau, Dongming He, Suzana Prstic	142
13	EUV mask pattern defect printability 2006 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Ted Liang, Guojing Zhang, Patrick Naulleau, Alan Myers, (unknown), Alan R. Stivers, (unknown)	16
14	Convective Performance of Package Based Single Phase Microchannel Heat Exchanger 2005 ·Je-Young Chang, Ravi Prasher, David Chau, Alan Myers, (unknown), Suzana Prstic, Dongming He	12
15	Effect of Localized Hotspot on the Thermal Performance of Two-Phase Microchannel Heat Exchanger 2005 ·Ravi Prasher, (unknown), Je-Young Chang, Alan Myers, David Chau, Suzana Prstic, Dongming He	7
16	Energy Resolved Mass Spectrometry of the a-Si:D Film Growth Species During DC Magnetron Sputtering 1990 ·MRS Proceedings ·Alan Myers, D. N. Ruzic, N. Maley, James R. Doyle, John R. Abelson	8
17	Surface hydrogen release during the growth of a‐Si:H by reactive magnetron sputtering 1990 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·John R. Abelson, James R. Doyle, (unknown), Alan Myers, N. Maley	13
18	Infrared absorption and thermal evolution study of hydrogen bonding in a-SiH 1989 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·N. Maley, Alan Myers, Mustafa Pinarbasi, (unknown), John R. Abelson, John A. Thornton	37
19	Hydrogenated amorphous silicon films deposited by DC planar magnetron reactive sputtering 1987 ·Superlattices and Microstructures ·Mustafa Pinarbasi, (unknown), (unknown), Alan Myers, (unknown), John A. Thornton	11
20	The d resonance scattering and the electrical resistivities of some Au-4d alloys 1980 ·Journal of Physics F Metal Physics ·Alan Myers, (unknown), (unknown)	7

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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