Alan Myers

866 citations
37 papers · 710 indexed · h-index 15
Topics
Advancements in Photolithography Techniques (14 papers)Electron and X-Ray Spectroscopy Techniques (12 papers)Integrated Circuits and Semiconductor Failure Analysis (11 papers)

In The Last Decade

Alan Myers

36 papers receiving 665 citations

Peers

Alan Myers
Comparison fields: 5 of 50
  • Electrical and Electronic Engineering 441
  • Biomedical Engineering 199
  • Mechanical Engineering 178
  • Materials Chemistry 163
  • Surfaces, Coatings and Films 141
Replace L.P. Buchwalter with:
L.P. Buchwalter United States
André Van Calster Belgium
Hagen Bartzsch Germany
William J. Dauksher United States
M.A. Kulakov Germany
Yves Jourlin France
Jeremy Theil United States
Mao‐Kuo Wei Taiwan
E. M. James United States
Takayuki Aoyama Japan
Alan Myers relative to L.P. Buchwalter United States L.P. Buchwalter's profile →
Citations per field
00.5×1.5×2.3×
L.P. Buchwalter · 1×
Citations per year

Countries citing papers authored by Alan Myers

Since Specialization
Citations

This map shows the geographic impact of Alan Myers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alan Myers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alan Myers more than expected).

Fields of papers citing papers by Alan Myers

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Alan Myers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alan Myers. The network helps show where Alan Myers may publish in the future.

Co-authorship network of co-authors of Alan Myers

This figure shows the co-authorship network connecting the top 25 collaborators of Alan Myers. A scholar is included among the top collaborators of Alan Myers based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Alan Myers. Alan Myers is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 9
2 6
3 12
4 17
5 16
6 8
7 11
8 20
9 24
10 17
11 4
12 142
13 16
14 12
15 7
16 8
17 13
18 37
19 11
20 7

About Alan Myers

Alan Myers is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Bioengineering, having authored 37 papers that have together received 710 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (14 papers), Electron and X-Ray Spectroscopy Techniques (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). The work is most often cited by research in Surfaces, Coatings and Films (141 citations), Electrical and Electronic Engineering (441 citations) and Mechanical Engineering (178 citations). Alan Myers has collaborated with scholars based in United States, Belgium and South Korea. Frequent co-authors include John R. Abelson, N. Maley, Mustafa Pinarbasi, Suzana Prstic, Ravi Prasher, David Chau, Je-Young Chang, Dongming He, Shuhuai Yao and Juan G. Santiago. Their work appears in journals such as Nano Letters, Journal of Applied Physics and Sensors and Actuators B Chemical.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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