Donis G. Flagello
- Surfaces, Coatings and Films top 5%
- Optical Coatings and Gratings 20
- Electron and X-Ray Spectroscopy Techniques 14
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- Advancements in Photolithography Techniques 47
- Integrated Circuits and Semiconductor Failure Analysis 13
- Semiconductor Lasers and Optical Devices 6
- Media Technology top 5%
- Biomedical Engineering top 10%
- Advanced Surface Polishing Techniques 9
- Advanced optical system design 7
- Radiation top 10%
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- Advanced Measurement and Metrology Techniques 5
- Co-authors
- Alan E. RosenbluthTom D. MilsterJan MulkensRobert SochaMichael TotzeckTilmann HeilChristian WagnerPaul Gräupner
- Journals
- Journal of the Optical Society of America A (1 paper)Microelectronic Engineering (2 papers)Journal of Micro/Nanolithography MEMS and MOEMS (1 paper)
- Partner nations
- United StatesNetherlandsGermany
In The Last Decade
Donis G. Flagello
59 papers receiving 502 citations
Peers
Comparison fields: 5 of 43
- Surfaces, Coatings and Films 172
- Electrical and Electronic Engineering 450
- Media Technology 57
- Biomedical Engineering 272
- Radiation 39
Countries citing papers authored by Donis G. Flagello
This map shows the geographic impact of Donis G. Flagello's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Donis G. Flagello with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Donis G. Flagello more than expected).
Fields of papers citing papers by Donis G. Flagello
This network shows the impact of papers produced by Donis G. Flagello. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Donis G. Flagello. The network helps show where Donis G. Flagello may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Donis G. Flagello, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 1 | |
| 2 | 2011 | 8 | |
| 3 | 2010 | 3 | |
| 4 | Optical Microlithography XX | 2007 | 7 |
| 5 | Optical Microlithography XIX | 2006 | 7 |
| 6 | 2006 | 13 | |
| 7 | 2005 | 5 | |
| 8 | 2004 | 1 | |
| 9 | 2004 | 9 | |
| 10 | 2003 | 18 | |
| 11 | 2003 | 0 | |
| 12 | 2002 | 1 | |
| 13 | 2001 | 2 | |
| 14 | 1998 | 7 | |
| 15 | 1997 | 24 | |
| 16 | 1995 | 1 | |
| 17 | 1992 | 1 | |
| 18 | 1992 | 7 | |
| 19 | 1990 | 22 | |
| 20 | 1987 | 3 |
About Donis G. Flagello
Donis G. Flagello is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 60 papers that have together received 564 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (47 papers), Optical Coatings and Gratings (20 papers), Electron and X-Ray Spectroscopy Techniques (14 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers), Advanced Surface Polishing Techniques (9 papers), Advanced optical system design (7 papers), Semiconductor Lasers and Optical Devices (6 papers) and Advanced Measurement and Metrology Techniques (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (172 citations), Electrical and Electronic Engineering (450 citations) and Media Technology (57 citations). Donis G. Flagello has collaborated with scholars based in United States, Netherlands and Germany. Frequent co-authors include Alan E. Rosenbluth, Tom D. Milster, Jan Mulkens, Robert Socha, Michael Totzeck, Tilmann Heil, Christian Wagner, Paul Gräupner, Mircea Dusa and Jo Finders. Their work appears in journals such as Journal of the Optical Society of America A, Microelectronic Engineering and Journal of Micro/Nanolithography MEMS and MOEMS.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.