Inhwan Lee
- Electrical and Electronic Engineering
- Software top 5%
- Computer Networks and Communications top 10%
- Materials Chemistry
- Biomedical Engineering
- Co-authors
- Ravishankar K. IyerRizwan KhanPeriyayya UthirakumarHo-Chan KimM. Shamshi HassanMyung‐Seob KhilVicky PhilipsenStefan De Gendt
- Topics
- Advancements in Photolithography Techniques (15 papers)Electron and X-Ray Spectroscopy Techniques (9 papers)Advanced X-ray Imaging Techniques (6 papers)
- Journals
- SHILAP Revista de lepidopterologíaACS Applied Materials & InterfacesIEEE Access
- Partner nations
- South KoreaBelgiumUnited States
In The Last Decade
Inhwan Lee
35 papers receiving 297 citations
Peers
Comparison fields: 5 of 60
- Electrical and Electronic Engineering 130
- Software 88
- Computer Networks and Communications 85
- Materials Chemistry 64
- Biomedical Engineering 59
Countries citing papers authored by Inhwan Lee
This map shows the geographic impact of Inhwan Lee's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Inhwan Lee with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Inhwan Lee more than expected).
Fields of papers citing papers by Inhwan Lee
This network shows the impact of papers produced by Inhwan Lee. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Inhwan Lee. The network helps show where Inhwan Lee may publish in the future.
Co-authorship network of co-authors of Inhwan Lee
This figure shows the co-authorship network connecting the top 25 collaborators of Inhwan Lee. A scholar is included among the top collaborators of Inhwan Lee based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Inhwan Lee. Inhwan Lee is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 7 | |
| 2 | 1 | |
| 3 | 0 | |
| 4 | 1 | |
| 5 | 2 | |
| 6 | 2 | |
| 7 | 0 | |
| 8 | 3 | |
| 9 | 8 | |
| 10 | 2 | |
| 11 | 3 | |
| 12 | 28 | |
| 13 | 6 | |
| 14 | 1 | |
| 15 | 7 | |
| 16 | 8 | |
| 17 | 8 | |
| 18 | Measurement-based analysis of software reliability | 12 |
| 19 | 99 | |
| 20 | Measurement and analysis of operating system fault tolerance | 1 |
About Inhwan Lee
Inhwan Lee is a scholar working on Surfaces, Coatings and Films, Software and Radiation, having authored 38 papers that have together received 320 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (15 papers), Electron and X-Ray Spectroscopy Techniques (9 papers) and Advanced X-ray Imaging Techniques (6 papers). The work is most often cited by research in Software (88 citations), Surfaces, Coatings and Films (31 citations) and Computer Networks and Communications (85 citations). Inhwan Lee has collaborated with scholars based in South Korea, Belgium and United States. Frequent co-authors include Ravishankar K. Iyer, Rizwan Khan, Periyayya Uthirakumar, Ho-Chan Kim, M. Shamshi Hassan, Myung‐Seob Khil, Vicky Philipsen, Stefan De Gendt, Jungho Cho and Joern-Holger Franke. Their work appears in journals such as SHILAP Revista de lepidopterología, ACS Applied Materials & Interfaces and IEEE Access.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.