K.P. Müller
Impact in
- Hardware and Architecture top 10%
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- Semiconductor materials and devices
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Advancements in Photolithography Techniques
- Plasma Diagnostics and Applications
Papers in
-
- VLSI and Analog Circuit Testing 4
-
- Semiconductor materials and devices 12
- Advancements in Photolithography Techniques 8
- Radiation Effects in Electronics 6
- Integrated Circuits and Semiconductor Failure Analysis 5
- Advancements in Semiconductor Devices and Circuit Design 4
- Co-authors
- Chen-Yong CherMeeta S. GuptaPradip BoseA. HeubergerWenjin YanHong NgM. GutscheK.A. Jenkins
- Journals
- Microelectronic Engineering (7 papers)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1 paper)IBM Journal of Research and Development (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (2 papers)Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena (2 papers)
- Partner nations
- United StatesGermanyAustria
In The Last Decade
K.P. Müller
26 papers receiving 236 citations
Peers
Comparison fields: 5 of 38
- Hardware and Architecture 44
- Electrical and Electronic Engineering 236
- Structural Biology 4
- Surfaces, Coatings and Films 18
- Electronic, Optical and Magnetic Materials 31
Countries citing papers authored by K.P. Müller
This map shows the geographic impact of K.P. Müller's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K.P. Müller with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K.P. Müller more than expected).
Fields of papers citing papers by K.P. Müller
This network shows the impact of papers produced by K.P. Müller. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K.P. Müller. The network helps show where K.P. Müller may publish in the future.
Co-authorship network
The 25 scholars most cited alongside K.P. Müller, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2015 | 6 | |
| 2 | 2015 | 4 | |
| 3 | 2010 | 15 | |
| 4 | 2010 | 3 | |
| 5 | 2002 | 15 | |
| 6 | 2002 | 21 | |
| 7 | 1999 | 2 | |
| 8 | 1999 | 42 | |
| 9 | Thermoelectric Infrared Imaging Microsystems by Commercial CMOS Technology | 1998 | 4 |
| 10 | 1997 | 12 | |
| 11 | 1993 | 5 | |
| 12 | 1992 | 5 | |
| 13 | 1990 | 3 | |
| 14 | 1989 | 6 | |
| 15 | 1989 | 9 | |
| 16 | 1988 | 5 | |
| 17 | 1988 | 9 | |
| 18 | 1987 | 10 | |
| 19 | 1987 | 6 | |
| 20 | 1986 | 19 |
About K.P. Müller
K.P. Müller is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Software and Safety, Risk, Reliability and Quality, having authored 26 papers that have together received 261 indexed citations. Recurring topics across this work include Semiconductor materials and devices (12 papers), Advancements in Photolithography Techniques (8 papers), Radiation Effects in Electronics (6 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Copper Interconnects and Reliability (4 papers), Ion-surface interactions and analysis (4 papers), VLSI and Analog Circuit Testing (4 papers) and Advancements in Semiconductor Devices and Circuit Design (4 papers). The work is most often cited by research in Hardware and Architecture (44 citations), Electrical and Electronic Engineering (236 citations), Structural Biology (4 citations), Surfaces, Coatings and Films (18 citations) and Electronic, Optical and Magnetic Materials (31 citations). K.P. Müller has collaborated with scholars based in United States, Germany and Austria. Frequent co-authors include Chen-Yong Cher, Meeta S. Gupta, Pradip Bose, A. Heuberger, Wenjin Yan, Hong Ng, M. Gutsche, K.A. Jenkins, Rich Wise and Scott Halle. Their work appears in journals such as Microelectronic Engineering, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IBM Journal of Research and Development, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.