H. Löschner
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- Electron and X-Ray Spectroscopy Techniques 7
- Computational Mechanics top 10%
- Ion-surface interactions and analysis 11
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- Advancements in Photolithography Techniques 32
- Integrated Circuits and Semiconductor Failure Analysis 10
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- Advanced Surface Polishing Techniques 10
- Nanofabrication and Lithography Techniques 10
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- Force Microscopy Techniques and Applications 5
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- Metal and Thin Film Mechanics 5
- Journals
- Microelectronic Engineering (14 papers)Journal of Applied Physics (3 papers)Applied Physics Letters (1 paper)
- Partner nations
- AustriaUnited StatesGermany
In The Last Decade
H. Löschner
42 papers receiving 236 citations
Peers
Comparison fields: 5 of 29
- Surfaces, Coatings and Films 40
- Computational Mechanics 78
- Electrical and Electronic Engineering 209
- Structural Biology 4
- Biomedical Engineering 119
Countries citing papers authored by H. Löschner
This map shows the geographic impact of H. Löschner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Löschner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Löschner more than expected).
Fields of papers citing papers by H. Löschner
This network shows the impact of papers produced by H. Löschner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Löschner. The network helps show where H. Löschner may publish in the future.
Co-authorship network
The 25 scholars most cited alongside H. Löschner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 7 | |
| 2 | 2000 | 2 | |
| 3 | 1999 | 8 | |
| 4 | 1998 | 3 | |
| 5 | 1997 | 13 | |
| 6 | 1996 | 6 | |
| 7 | 1996 | 3 | |
| 8 | 1993 | 8 | |
| 9 | 1993 | 11 | |
| 10 | 1993 | 4 | |
| 11 | 1992 | 7 | |
| 12 | 1989 | 2 | |
| 13 | 1986 | 16 | |
| 14 | 1986 | 5 | |
| 15 | 1985 | 8 | |
| 16 | 1985 | 2 | |
| 17 | 1981 | 0 | |
| 18 | 1973 | 1 | |
| 19 | 1973 | 6 | |
| 20 | 1972 | 8 |
About H. Löschner
H. Löschner is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Structural Biology, Computational Mechanics and Biomedical Engineering, having authored 44 papers that have together received 255 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (32 papers), Ion-surface interactions and analysis (11 papers), Advanced Surface Polishing Techniques (10 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers), Nanofabrication and Lithography Techniques (10 papers), Electron and X-Ray Spectroscopy Techniques (7 papers), Force Microscopy Techniques and Applications (5 papers) and Metal and Thin Film Mechanics (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (40 citations), Computational Mechanics (78 citations), Electrical and Electronic Engineering (209 citations), Structural Biology (4 citations) and Biomedical Engineering (119 citations). H. Löschner has collaborated with scholars based in Austria, United States and Germany. Frequent co-authors include G. Stengl, Peter Wolf, A. Chalupka, Wilhelm Maurer, J. C. Wolfe, Ivo W. Rangelow, P. Hudek, G. Stangl, J. Voigt and H. Vonach. Their work appears in journals such as Microelectronic Engineering, Journal of Applied Physics, Applied Physics Letters, Journal of Microelectromechanical Systems and Journal of Vacuum Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.