Rich Wise
- Electrical and Electronic Engineering
- Materials Chemistry
- Mechanics of Materials
- Biomedical Engineering
- Electronic, Optical and Magnetic Materials
- Co-authors
- Thorsten LillTaeseung KimKeren J. KanarikKazuo NojiriEric A. HudsonSamantha TanIvan L. BerryYang Pan
- Topics
- Advancements in Photolithography Techniques (12 papers)Integrated Circuits and Semiconductor Failure Analysis (6 papers)Semiconductor materials and devices (6 papers)
- Journals
- Journal of Vacuum Science & Technology A Vacuum Surfaces and FilmsIBM Journal of Research and DevelopmentIEEE Transactions on Semiconductor Manufacturing
- Partner nations
- United StatesBelgiumNetherlands
In The Last Decade
Rich Wise
13 papers receiving 178 citations
Peers
Comparison fields: 5 of 24
- Electrical and Electronic Engineering 184
- Materials Chemistry 54
- Mechanics of Materials 36
- Biomedical Engineering 25
- Electronic, Optical and Magnetic Materials 21
Countries citing papers authored by Rich Wise
This map shows the geographic impact of Rich Wise's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rich Wise with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rich Wise more than expected).
Fields of papers citing papers by Rich Wise
This network shows the impact of papers produced by Rich Wise. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rich Wise. The network helps show where Rich Wise may publish in the future.
Co-authorship network of co-authors of Rich Wise
This figure shows the co-authorship network connecting the top 25 collaborators of Rich Wise. A scholar is included among the top collaborators of Rich Wise based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Rich Wise. Rich Wise is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 11 | |
| 4 | 0 | |
| 5 | 1 | |
| 6 | 3 | |
| 7 | 98 | |
| 8 | 11 | |
| 9 | 4 | |
| 10 | 3 | |
| 11 | 10 | |
| 12 | 4 | |
| 13 | 2 | |
| 14 | 3 | |
| 15 | 2 | |
| 16 | 42 |
About Rich Wise
Rich Wise is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Biomedical Engineering, having authored 16 papers that have together received 194 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (12 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Semiconductor materials and devices (6 papers). The work is most often cited by research in Electrical and Electronic Engineering (184 citations), Surfaces, Coatings and Films (18 citations) and Mechanics of Materials (36 citations). Rich Wise has collaborated with scholars based in United States, Belgium and Netherlands. Frequent co-authors include Thorsten Lill, Taeseung Kim, Keren J. Kanarik, Kazuo Nojiri, Eric A. Hudson, Samantha Tan, Ivan L. Berry, Yang Pan, Wenbing Yang and Richard A. Gottscho. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, IBM Journal of Research and Development and IEEE Transactions on Semiconductor Manufacturing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.