Conal E. Murray

3.6k total citations · 1 hit paper
104 papers, 2.6k citations indexed

About

Conal E. Murray is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Mechanics of Materials. According to data from OpenAlex, Conal E. Murray has authored 104 papers receiving a total of 2.6k indexed citations (citations by other indexed papers that have themselves been cited), including 69 papers in Electrical and Electronic Engineering, 29 papers in Materials Chemistry and 27 papers in Mechanics of Materials. Recurrent topics in Conal E. Murray's work include Semiconductor materials and devices (29 papers), Copper Interconnects and Reliability (25 papers) and Metal and Thin Film Mechanics (20 papers). Conal E. Murray is often cited by papers focused on Semiconductor materials and devices (29 papers), Copper Interconnects and Reliability (25 papers) and Metal and Thin Film Mechanics (20 papers). Conal E. Murray collaborates with scholars based in United States, France and Canada. Conal E. Murray's co-authors include M. Copel, David B. Mitzi, I. C. Noyan, Laura L. Kosbar, Ali Afzali, Étienne Barthel, L. Martinů, Marco Sebastiani, G. Abadias and Gregory B. Thompson and has published in prestigious journals such as Nature, Physical Review Letters and Advanced Materials.

In The Last Decade

Conal E. Murray

101 papers receiving 2.5k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Review Article: Stress in thin films and coatings: Current status, challenges, and prospects

2018 583 citations G. Abadias, Eric Chason et al. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Conal E. Murray United States	20	1.6k	1.1k	455	438	427	104	2.6k
Patrice Gergaud France	23	1.0k 0.6×	819 0.7×	327 0.7×	348 0.8×	401 0.9×	194	1.9k
J. Bruley United States	35	2.3k 1.5×	2.8k 2.5×	355 0.8×	875 2.0×	796 1.9×	136	4.4k
Ф. Ф. Комаров Belarus	22	1.1k 0.7×	1.1k 1.0×	123 0.3×	462 1.1×	220 0.5×	328	2.4k
B. C. Larson United States	20	548 0.3×	1.3k 1.2×	391 0.9×	376 0.9×	231 0.5×	51	2.2k
J. Z. Tischler United States	27	480 0.3×	1.6k 1.4×	469 1.0×	473 1.1×	300 0.7×	98	2.7k
W. Jäger Germany	31	1.3k 0.8×	1.6k 1.5×	151 0.3×	300 0.7×	441 1.0×	150	2.9k
Vicki J. Keast Australia	26	626 0.4×	1.4k 1.2×	739 1.6×	129 0.3×	588 1.4×	84	2.4k
Katsuyoshi Endo Japan	25	787 0.5×	669 0.6×	116 0.3×	224 0.5×	822 1.9×	124	1.9k
Frank Frost Germany	31	2.0k 1.3×	1.6k 1.5×	119 0.3×	399 0.9×	704 1.6×	119	3.1k
J.-S. Chung South Korea	24	743 0.5×	2.0k 1.8×	1.0k 2.3×	182 0.4×	484 1.1×	76	2.7k

Countries citing papers authored by Conal E. Murray

Since Specialization

Citations

This map shows the geographic impact of Conal E. Murray's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Conal E. Murray with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Conal E. Murray more than expected).

Fields of papers citing papers by Conal E. Murray

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Conal E. Murray. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Conal E. Murray. The network helps show where Conal E. Murray may publish in the future.

Co-authorship network of co-authors of Conal E. Murray

This figure shows the co-authorship network connecting the top 25 collaborators of Conal E. Murray. A scholar is included among the top collaborators of Conal E. Murray based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Conal E. Murray. Conal E. Murray is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Kurter, Cihan, Conal E. Murray, R. T. Gordon, et al.. (2022). Quasiparticle tunneling as a probe of Josephson junction barrier and capacitor material in superconducting qubits. npj Quantum Information. 8(1). 20 indexed citations

Abadias, G., Eric Chason, Jozef Kečkéš, et al.. (2018). Review Article: Stress in thin films and coatings: Current status, challenges, and prospects. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 36(2). 583 indexed citations breakdown →

Murray, Conal E., Anita Madan, Yunyu Wang, et al.. (2017). Quantification of local strain distributions in nanoscale strained SiGe FinFET structures. Journal of Applied Physics. 122(13). 11 indexed citations

Gordon, Michael S., et al.. (2016). Measurements of radioactive contaminants in semiconductor materials. Semiconductor Science and Technology. 31(12). 123003–123003. 6 indexed citations

Hruszkewycz, S. O., Martin V. Holt, Conal E. Murray, et al.. (2016). High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography. Nature Materials. 16(2). 244–251. 78 indexed citations

Murray, Conal E., Jean Jordan‐Sweet, Stephen W. Bedell, & E. Todd Ryan. (2015). Stress determination through diffraction: establishing the link between Kröner and Voigt/Reuss limits. Powder Diffraction. 30(2). 99–103. 1 indexed citations

Murray, Conal E., et al.. (2013). Submicron mapping of strain distributions induced by three-dimensional through-silicon via features. Applied Physics Letters. 102(25). 14 indexed citations

Mäser, J., Barry Lai, Tonio Buonassisi, et al.. (2013). A next-generation in-situ nanoprobe beamline for the Advanced Photon Source. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8851. 885106–885106. 2 indexed citations

Murray, Conal E., E. Todd Ryan, Paul R. Besser, et al.. (2012). Understanding stress gradients in microelectronic metallization. Powder Diffraction. 27(2). 92–98. 2 indexed citations

10.

Murray, Conal E., Paul R. Besser, E. Todd Ryan, & Jean Jordan‐Sweet. (2011). Manipulating stress in Cu/low-k dielectric nanocomposites. Applied Physics Letters. 98(14). 3 indexed citations

11.

Zschech, Ehrenfried, et al.. (2011). Devices, Materials, and Processes for Nanoelectronics: Characterization with Advanced X‐Ray Techniques Using Lab‐Based and Synchrotron Radiation Sources. Advanced Engineering Materials. 13(8). 811–836. 6 indexed citations

12.

Murray, Conal E., et al.. (2010). Nanoscale strain characterization in microelectronic materials using X-ray diffraction. Powder Diffraction. 25(2). 108–113. 6 indexed citations

13.

Saenger, K. L., Keith Fogel, J. A. Ott, J. P. de Souza, & Conal E. Murray. (2008). Effects of patterned, stressed SiN overlayers on Si solid phase epitaxy. Applied Physics Letters. 92(12). 4 indexed citations

14.

Tang, Henry H. K., et al.. (2007). Importance of BEOL Modeling in Single Event Effect Analysis. IEEE Transactions on Nuclear Science. 54(6). 2162–2167. 13 indexed citations

15.

Wells, Oliver C., et al.. (2006). Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope. Scanning. 28(1). 27–31. 8 indexed citations

16.

Murray, Conal E., C. C. Goldsmith, T. M. Shaw, J. P. Doyle, & I. C. Noyan. (2006). Thermal stress evolution in embedded Cu/low-k dielectric composite features. Applied Physics Letters. 89(1). 9 indexed citations

17.

Murray, Conal E., C. C. Goldsmith, & I. C. Noyan. (2005). Spatially transient stress effects in thin films by X-ray diffraction. Powder Diffraction. 20(2). 112–116. 1 indexed citations

18.

Murray, Conal E. & I. C. Noyan. (2005). Mechanics of End Effects in Thin Film and Substrate Stress Distributions. Materials science forum. 490-491. 13–18. 2 indexed citations

19.

Lane, Michael, Conal E. Murray, F. R. McFeely, Philippe M. Vereecken, & R. Rosenberg. (2003). Liner materials for direct electrodeposition of Cu. Applied Physics Letters. 83(12). 2330–2332. 142 indexed citations

20.

Murray, Conal E. & I. C. Noyan. (1996). The relationship between the golden section φ and the elastic constants of ensembles selected by diffraction methods. Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 73(5). 1313–1321. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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