Conal E. Murray
- Structural Biology top 1%
- Advanced Electron Microscopy Techniques and Applications 10
- Radiation top 2%
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- Semiconductor materials and devices 29
- Integrated Circuits and Semiconductor Failure Analysis 16
- Advancements in Semiconductor Devices and Circuit Design 12
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- Copper Interconnects and Reliability 25
- Materials Chemistry top 5%
- Microstructure and mechanical properties 11
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- Metal and Thin Film Mechanics 20
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- Advanced Surface Polishing Techniques 11
Conal E. Murray
101 papers receiving 2.5k citations
Hit Papers
Peers
Comparison fields: 5 of 79
- Structural Biology 182
- Radiation 277
- Electrical and Electronic Engineering 1.6k
- Electronic, Optical and Magnetic Materials 455
- Materials Chemistry 1.1k
Countries citing papers authored by Conal E. Murray
This map shows the geographic impact of Conal E. Murray's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Conal E. Murray with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Conal E. Murray more than expected).
Fields of papers citing papers by Conal E. Murray
This network shows the impact of papers produced by Conal E. Murray. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Conal E. Murray. The network helps show where Conal E. Murray may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Conal E. Murray, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 20 | |
| 2 | Review Article: Stress in thin films and coatings: Current status, challenges, and prospectsbreakdown → | 2018 | 583 |
| 3 | 2017 | 11 | |
| 4 | 2016 | 78 | |
| 5 | 2016 | 6 | |
| 6 | 2015 | 1 | |
| 7 | 2013 | 19 | |
| 8 | 2013 | 7 | |
| 9 | 2012 | 2 | |
| 10 | 2011 | 3 | |
| 11 | 2011 | 51 | |
| 12 | 2010 | 6 | |
| 13 | 2009 | 6 | |
| 14 | 2008 | 4 | |
| 15 | 2008 | 0 | |
| 16 | 2007 | 6 | |
| 17 | 2006 | 8 | |
| 18 | 2006 | 66 | |
| 19 | 2005 | 1 | |
| 20 | 2001 | 0 |
About Conal E. Murray
Conal E. Murray is a scholar working on Structural Biology, Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering, having authored 104 papers that have together received 2.6k indexed citations. Recurring topics across this work include Semiconductor materials and devices (29 papers), Copper Interconnects and Reliability (25 papers), Metal and Thin Film Mechanics (20 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers), Microstructure and mechanical properties (11 papers), Advanced Surface Polishing Techniques (11 papers) and Advanced Electron Microscopy Techniques and Applications (10 papers). The work is most often cited by research in Structural Biology (182 citations), Radiation (277 citations) and Electrical and Electronic Engineering (1.6k citations). Conal E. Murray has collaborated with scholars based in United States, France and Canada. Frequent co-authors include M. Copel, David B. Mitzi, I. C. Noyan, Ali Afzali, Laura L. Kosbar, Gary L. Doll, Jozef Kečkéš, Eric Chason, Gregory B. Thompson and Marco Sebastiani. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, IEEE Transactions on Nuclear Science, Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.