Scot E. Swanson

590 citations

29 papers · 392 indexed · h-index 12

Impact in

Electrical and Electronic Engineering top 10%
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Photonic and Optical Devices
- Semiconductor Lasers and Optical Devices
- Optical Network Technologies
- Advanced MEMS and NEMS Technologies
- Advancements in Semiconductor Devices and Circuit Design
Instrumentation

Papers in ⓘ

Electrical and Electronic Engineering 29
- Semiconductor materials and devices 18
- Integrated Circuits and Semiconductor Failure Analysis 18
- Radiation Effects in Electronics 10
- Advanced MEMS and NEMS Technologies 4
- Advanced Photonic Communication Systems 3
Electronic, Optical and Magnetic Materials 3
- Copper Interconnects and Reliability 3

Co-authors: P.E. Dodd (15 shared papers)Danelle M. Tanner (5 shared papers)M.R. Shaneyfelt (13 shared papers)Norman F. Smith (2 shared papers)Steven E. Golowich (1 shared paper)James R. Schwank (12 shared papers)John Abbott (1 shared paper)Jeremy A. Walraven (3 shared papers)
Journals: IEEE Transactions on Nuclear Science (12 papers)Optics Express (1 paper)Journal of Lightwave Technology (1 paper)Proceedings - International Symposium for Testing and Failure Analysis (1 paper)
Partner nations: United States Netherlands Canada

In The Last Decade

Scot E. Swanson

29 papers receiving 369 citations

Peers

Countries citing papers authored by Scot E. Swanson

Since Specialization

Citations

This map shows the geographic impact of Scot E. Swanson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Scot E. Swanson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Scot E. Swanson more than expected).

Fields of papers citing papers by Scot E. Swanson

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Scot E. Swanson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Scot E. Swanson. The network helps show where Scot E. Swanson may publish in the future.

Co-authors

The 25 scholars most cited alongside Scot E. Swanson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Scot E. Swanson Line = papers co-authored together Scot E. Swanson links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 29 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Development of system specification for laser-optimized 50-μm multimode fiber for multigigabit short-wavelength LANs Journal of Lightwave Technology ·P. Pepeljugoski, M.J. Hackert, John Abbott, Scot E. Swanson, Steven E. Golowich, A. J. Ritger, Paul Kolesar, Y.C. Chen, P. Pleunis	2003	68
2	Hardness Assurance for Proton Direct Ionization-Induced SEEs Using<newline/> a High-Energy Proton Beam IEEE Transactions on Nuclear Science ·Nathaniel A. Dodds, J.R. Schwank, M.R. Shaneyfelt, P.E. Dodd, Barney L. Doyle, M. Trinczek, E. W. Blackmore, Kenneth P. Rodbell, Michael S. Gordon, Robert A. Reed, J. A. Pellish, Kenneth A. LaBel, Paul W. Marshall, Scot E. Swanson, György Vizkelethy, Stuart Van Deusen, F.W. Sexton, M.J. Martinez	2014	47
3	Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements IEEE Transactions on Nuclear Science ·James R. Schwank, M.R. Shaneyfelt, Dale McMorrow, Véronique Ferlet-Cavrois, P.E. Dodd, David F. Heidel, Paul W. Marshall, Jonathan A. Pellish, Kenneth A. LaBel, Kenneth P. Rodbell, Mark C. Hakey, Richard S. Flores, Scot E. Swanson, Scott M. Dalton	2010	30
4	Reliability of a MEMS torsional ratcheting actuator Danelle M. Tanner, Jeremy A. Walraven, S.M. Barnes, Norman F. Smith, Fernando Bitsie, Scot E. Swanson	2002	30
5	Radiation Response of AlGaN-Channel HEMTs IEEE Transactions on Nuclear Science ·M.J. Martinez, M. King, Albert G. Baca, Andrew A. Allerman, Andrew A. Armstrong, Brianna Klein, E Douglas, Robert Kaplar, Scot E. Swanson	2018	30
6	Hardness Assurance Testing for Proton Direct Ionization Effects IEEE Transactions on Nuclear Science ·James R. Schwank, M.R. Shaneyfelt, Véronique Ferlet-Cavrois, P.E. Dodd, E. W. Blackmore, Jonathan A. Pellish, Kenneth P. Rodbell, David F. Heidel, Paul W. Marshall, Kenneth A. LaBel, Pascale Gouker, Nelson Tam, Richard Wong, Shi-Jie Wen, Robert A. Reed, Scott M. Dalton, Scot E. Swanson	2012	25
7	Novel self-stressing test structures for realistic high-frequency reliability characterization E.S. Snyder, David V. Campbell, Scot E. Swanson, D.G. Pierce	1993	19
8	Gamma radiation effects on passive silicon photonic waveguides using phase sensitive methods Optics Express ·Nicholas Boynton, Michael Gehl, Christina Dallo, Andrew Pomerene, Andrew Starbuck, Dana Hood, P.E. Dodd, Scot E. Swanson, Douglas C. Trotter, Christopher T. DeRose, Anthony L. Lentine	2020	17
9	The Effect of Gamma Radiation Exposure on Active Silicon Photonic Device Performance Metrics IEEE Transactions on Nuclear Science ·Galen Hoffman, Michael Gehl, Nicholas Martinez, D. Trotter, Andrew Starbuck, Andrew Pomerene, Christina Dallo, Dana Hood, P.E. Dodd, Scot E. Swanson, Christopher M. Long, Chris DeRose, Anthony L. Lentine	2019	17
10	Non-destructive resonant frequency measurement on MEMS actuators Norman F. Smith, Danelle M. Tanner, Scot E. Swanson, S. L. Miller	2002	14
11	Training a Neural Network on Analog TaO_{<italic>x</italic>} ReRAM Devices Irradiated With Heavy Ions: Effects on Classification Accuracy Demonstrated With CrossSim IEEE Transactions on Nuclear Science ·Robin Jacobs-Gedrim, David Russell Hughart, Sapan Agarwal, György Vizkelethy, Edward S. Bielejec, B. L. Vaandrager, Scot E. Swanson, Kathrine E. Knisely, Jennifer Taggart, Hugh Barnaby, Matthew Marinella	2018	11
12	Wafer-level pulsed-DC electromigration response at very high frequencies D.G. Pierce, E.S. Snyder, Scot E. Swanson, Lloyd W. Irwin	1994	11
13	Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs IEEE Transactions on Nuclear Science ·James R. Schwank, M.R. Shaneyfelt, P.E. Dodd, Dale McMorrow, Jeffrey H. Warner, Véronique Ferlet-Cavrois, Pascale Gouker, Joseph S. Melinger, Jonathan A. Pellish, Kenneth P. Rodbell, David F. Heidel, Paul W. Marshall, Kenneth A. LaBel, Scot E. Swanson	2011	11
14	Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques IEEE Transactions on Nuclear Science ·James R. Schwank, M.R. Shaneyfelt, P.E. Dodd, Dale McMorrow, György Vizkelethy, Véronique Ferlet-Cavrois, Pascale Gouker, Richard S. Flores, Jeffrey Stevens, Stephen B. Buchner, Scott M. Dalton, Scot E. Swanson	2011	10
15	Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains IEEE Transactions on Nuclear Science ·P.E. Dodd, M.R. Shaneyfelt, Richard S. Flores, James R. Schwank, Thomas A. Hill, Dale McMorrow, György Vizkelethy, Scot E. Swanson, Scott M. Dalton	2011	9
16	Pin-joint design effect on the reliability of a polysilicon microengine Danelle M. Tanner, Jeremy A. Walraven, S.S. Mani, Scot E. Swanson	2003	8
17	Effects of Moisture and Hydrogen Exposure on Radiation-Induced MOS Device Degradation and Its Implications for Long-Term Aging IEEE Transactions on Nuclear Science ·James R. Schwank, M.R. Shaneyfelt, Aritra Dasgupta, Sarah A. Francis, Xing Zhou, Daniel M. Fleetwood, Ronald D. Schrimpf, Sokrates T. Pantelides, James A. Felix, P.E. Dodd, Veronique Ferlet-Cavrois, Philippe Paillet, Scott M. Dalton, Scot E. Swanson, G.L. Hash, Steve M. Thornberg, James Michael Hochrein, G.K. Lum	2008	6
18	Focused Ion Beam Induced Effects on MOS Transistor Parameters Proceedings - International Symposium for Testing and Failure Analysis ·A. N. Campbell, Paiboon Tangyunyong, Jeffrey Richard Jessing, Charles E. Hembree, Daniel M. Fleetwood, Scot E. Swanson, J.M. Soden, Nicholas Antoniou, William E. Vanderlinde, Marsha Abramo	1999	5
19	SOI Substrate Removal for SEE Characterization: Techniques and Applications IEEE Transactions on Nuclear Science ·M.R. Shaneyfelt, James R. Schwank, P.E. Dodd, Jeffrey Stevens, György Vizkelethy, Scot E. Swanson, Scott M. Dalton	2012	4
20	Hardness assurance testing for proton direct ionization effects James R. Schwank, M.R. Shaneyfelt, Véronique Ferlet-Cavrois, P.E. Dodd, E. W. Blackmore, Jonathan A. Pellish, Kenneth P. Rodbell, David F. Heidel, Paul W. Marshall, Kenneth A. LaBel, Pascale Gouker, Nelson Tam, Richard Wong, Shi-Jie Wen, Robert A. Reed, Scott M. Dalton, Scot E. Swanson	2011	4

About Scot E. Swanson

Scot E. Swanson is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Hardware and Architecture and Computational Mechanics, having authored 29 papers that have together received 392 indexed citations. Recurring topics across this work include Semiconductor materials and devices (18 papers), Integrated Circuits and Semiconductor Failure Analysis (18 papers), Radiation Effects in Electronics (10 papers), Advanced MEMS and NEMS Technologies (4 papers), Ion-surface interactions and analysis (3 papers), Advanced Photonic Communication Systems (3 papers), Force Microscopy Techniques and Applications (3 papers) and Copper Interconnects and Reliability (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (367 citations), Instrumentation (15 citations), Hardware and Architecture (24 citations), Radiation (27 citations) and Atomic and Molecular Physics, and Optics (61 citations). Scot E. Swanson has collaborated with scholars based in United States, Netherlands and Canada. Frequent co-authors include P.E. Dodd, Danelle M. Tanner, M.R. Shaneyfelt, Norman F. Smith, Steven E. Golowich, James R. Schwank, John Abbott, Jeremy A. Walraven, P. Pepeljugoski and A. J. Ritger. Their work appears in journals such as IEEE Transactions on Nuclear Science, Optics Express, Journal of Lightwave Technology and Proceedings - International Symposium for Testing and Failure Analysis.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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