Scot E. Swanson

590 total citations
29 papers, 392 citations indexed

About

Scot E. Swanson is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, Scot E. Swanson has authored 29 papers receiving a total of 392 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 5 papers in Atomic and Molecular Physics, and Optics and 3 papers in Computational Mechanics. Recurrent topics in Scot E. Swanson's work include Integrated Circuits and Semiconductor Failure Analysis (18 papers), Semiconductor materials and devices (18 papers) and Radiation Effects in Electronics (10 papers). Scot E. Swanson is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (18 papers), Semiconductor materials and devices (18 papers) and Radiation Effects in Electronics (10 papers). Scot E. Swanson collaborates with scholars based in United States, Netherlands and Canada. Scot E. Swanson's co-authors include P.E. Dodd, Danelle M. Tanner, M.R. Shaneyfelt, Norman F. Smith, James R. Schwank, P. Pepeljugoski, John Abbott, Steven E. Golowich, A. J. Ritger and Jeremy A. Walraven and has published in prestigious journals such as Optics Express, Journal of Lightwave Technology and IEEE Transactions on Nuclear Science.

In The Last Decade

Scot E. Swanson

29 papers receiving 369 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Scot E. Swanson United States 12 367 61 33 27 26 29 392
Ashok Raman United States 15 679 1.9× 40 0.7× 23 0.7× 10 0.4× 49 1.9× 42 721
Antoine Touboul France 14 597 1.6× 41 0.7× 17 0.5× 22 0.8× 68 2.6× 66 643
Len Adams Switzerland 2 234 0.6× 16 0.3× 23 0.7× 59 2.2× 51 2.0× 2 314
Donald B. King United States 8 238 0.6× 32 0.5× 28 0.8× 36 1.3× 43 1.7× 30 311
James A. Felix United States 7 806 2.2× 23 0.4× 21 0.6× 31 1.1× 85 3.3× 14 838
Zhangang Zhang China 13 415 1.1× 25 0.4× 12 0.4× 18 0.7× 61 2.3× 85 496
A. Touboul France 11 382 1.0× 70 1.1× 31 0.9× 7 0.3× 32 1.2× 51 430
A.J. Auberton‐Hervé France 14 641 1.7× 90 1.5× 85 2.6× 31 1.1× 93 3.6× 50 692
Peitian Cong China 11 226 0.6× 132 2.2× 16 0.5× 18 0.7× 30 1.2× 74 321
R.N. Nowlin United States 9 1.0k 2.8× 35 0.6× 12 0.4× 40 1.5× 71 2.7× 13 1.0k

Countries citing papers authored by Scot E. Swanson

Since Specialization
Citations

This map shows the geographic impact of Scot E. Swanson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Scot E. Swanson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Scot E. Swanson more than expected).

Fields of papers citing papers by Scot E. Swanson

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Scot E. Swanson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Scot E. Swanson. The network helps show where Scot E. Swanson may publish in the future.

Co-authorship network of co-authors of Scot E. Swanson

This figure shows the co-authorship network connecting the top 25 collaborators of Scot E. Swanson. A scholar is included among the top collaborators of Scot E. Swanson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Scot E. Swanson. Scot E. Swanson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Gehl, Michael, Christina Dallo, Andrew Pomerene, et al.. (2020). Gamma radiation effects on passive silicon photonic waveguides using phase sensitive methods. Optics Express. 28(23). 35192–35192. 17 indexed citations
2.
Gehl, Michael, Andrew Starbuck, Andrew Pomerene, et al.. (2019). The Effect of Gamma Radiation Exposure on Active Silicon Photonic Device Performance Metrics. IEEE Transactions on Nuclear Science. 66(5). 801–809. 17 indexed citations
3.
Jacobs-Gedrim, Robin, David Russell Hughart, Sapan Agarwal, et al.. (2018). Training a Neural Network on Analog TaO<italic>x</italic> ReRAM Devices Irradiated With Heavy Ions: Effects on Classification Accuracy Demonstrated With CrossSim. IEEE Transactions on Nuclear Science. 66(1). 54–60. 11 indexed citations
4.
Dodds, Nathaniel A., J.R. Schwank, M.R. Shaneyfelt, et al.. (2014). Hardness Assurance for Proton Direct Ionization-Induced SEEs Using<newline/> a High-Energy Proton Beam. IEEE Transactions on Nuclear Science. 61(6). 2904–2914. 47 indexed citations
5.
Shaneyfelt, M.R., James R. Schwank, P.E. Dodd, et al.. (2012). SOI Substrate Removal for SEE Characterization: Techniques and Applications. IEEE Transactions on Nuclear Science. 59(4). 1142–1148. 4 indexed citations
6.
Schwank, James R., M.R. Shaneyfelt, Véronique Ferlet-Cavrois, et al.. (2012). Hardness Assurance Testing for Proton Direct Ionization Effects. IEEE Transactions on Nuclear Science. 59(4). 1197–1202. 25 indexed citations
7.
Schwank, James R., M.R. Shaneyfelt, Véronique Ferlet-Cavrois, et al.. (2011). Hardness assurance testing for proton direct ionization effects. 788–794. 4 indexed citations
8.
Shaneyfelt, M.R., James R. Schwank, P.E. Dodd, et al.. (2011). SOI substrate removal for SEE characterization: Techniques and applications. 52. 683–689. 1 indexed citations
9.
Schwank, James R., M.R. Shaneyfelt, Dale McMorrow, et al.. (2010). Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements. IEEE Transactions on Nuclear Science. 57(4). 1827–1834. 30 indexed citations
10.
Schwank, James R., M.R. Shaneyfelt, Dale McMorrow, et al.. (2009). Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements. 47. 91–97. 2 indexed citations
11.
Schwank, James R., M.R. Shaneyfelt, Daniel M. Fleetwood, et al.. (2008). Effects of Moisture and Hydrogen Exposure on Radiation-Induced MOS Device Degradation and Its Implications for Long-Term Aging. IEEE Transactions on Nuclear Science. 55(6). 3206–3215. 6 indexed citations
12.
Pepeljugoski, P., et al.. (2003). Development of system specification for laser-optimized 50-μm multimode fiber for multigigabit short-wavelength LANs. Journal of Lightwave Technology. 21(5). 1256–1275. 68 indexed citations
13.
Tanner, Danelle M., et al.. (2003). On-chip monitoring of MEMS gear motion. 8. 484–490. 3 indexed citations
14.
Swanson, Scot E., et al.. (2002). Complete method for E/sub bd/ correction by series resistance characterization. 20. 33–38. 3 indexed citations
15.
Swanson, Scot E., et al.. (2002). Self-stressing structures for electromigration testing to 500 MHz. 62–67. 1 indexed citations
16.
Tanner, Danelle M., et al.. (2002). Self-stressing structures for wafer-level oxide breakdown to 200 MHz. 113–117. 2 indexed citations
17.
Tanner, Danelle M., et al.. (2002). Reliability of a MEMS torsional ratcheting actuator. 81–90. 30 indexed citations
18.
Swanson, Scot E., et al.. (1994). Wafer-level pulsed-DC electromigration response at very high frequencies. 198–206. 11 indexed citations
19.
Swanson, Scot E., et al.. (1993). Novel self-stressing test structures for realistic high-frequency reliability characterization. 57–65. 19 indexed citations
20.
Swanson, Scot E., et al.. (1992). High-frequency Test Structures For Wafer-level Reliability. 88–91. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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