David F. Heidel

1.7k citations

54 papers · 1.2k indexed · h-index 20

Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing 14
- Physical Unclonable Functions (PUFs) and Hardware Security 5
Electrical and Electronic Engineering top 5%
- Radiation Effects in Electronics 28
- Integrated Circuits and Semiconductor Failure Analysis 21
- Semiconductor materials and devices 20
- Advancements in Semiconductor Devices and Circuit Design 13
- Low-power high-performance VLSI design 8
- Electromagnetic Compatibility and Noise Suppression 4
Radiation top 5%
Nuclear and High Energy Physics top 10%
Condensed Matter Physics top 10%

Co-authors: Kenneth P. Rodbell Michael S. Gordon Henry H. K. Tang Phil Oldiges Conal E. Murray Paul W. Marshall K.A. Jenkins Kenneth A. LaBel
Cited by: Hardware and Architecture Electrical and Electronic Engineering Radiation
Partner nations: United States Netherlands Canada

In The Last Decade

David F. Heidel

51 papers receiving 1.1k citations

Peers

Countries citing papers authored by David F. Heidel

Since Specialization

Citations

This map shows the geographic impact of David F. Heidel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David F. Heidel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David F. Heidel more than expected).

Fields of papers citing papers by David F. Heidel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David F. Heidel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David F. Heidel. The network helps show where David F. Heidel may publish in the future.

Co-authorship network

The 25 scholars most cited alongside David F. Heidel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with David F. Heidel Line = papers co-authored together David F. Heidel links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches Kenneth P. Rodbell,David F. Heidel,Jonathan A. Pellish,Paul W. Marshall,Henry H. K. Tang,Conal E. Murray,Kenneth A. LaBel,Michael S. Gordon,Kevin Stawiasz,James R. Schwank,Melanie D. Berg,Hak Kim,M. Friendlich,Anthony M. Phan,C.M. Seidleck	2011	51
2	Hardness assurance testing for proton direct ionization effects James R. Schwank,M.R. Shaneyfelt,Véronique Ferlet-Cavrois,P.E. Dodd,E. W. Blackmore,Jonathan A. Pellish,Kenneth P. Rodbell,David F. Heidel,Paul W. Marshall,Kenneth A. LaBel,Pascale Gouker,Nelson Tam,Richard Wong,Shi-Jie Wen,Robert A. Reed,Scott M. Dalton,Scot E. Swanson	2011	4
3	Impact of Spacecraft Shielding on Direct Ionization Soft Error Rates Jonathan A. Pellish,M.A. Xapsos,C. Stauffer,Thomas Jordan,Ray Ladbury,Timothy R. Oldham,Paul W. Marshall,David F. Heidel,Kenneth P. Rodbell	2010	1
4	Alpha-Particle Emission Energy Spectra From Materials Used for Solder Bumps Michael S. Gordon,Kenneth P. Rodbell,David F. Heidel,Conal E. Murray,Henry H. K. Tang,Brendan D. McNally,W. K. Warburton	2010	13
5	Modeling of Alpha-Induced Single Event Upsets for 45 nm Node SOI Devices Using Realistic C4 and 3D Circuit Geometries Henry H. K. Tang,Conal E. Murray,Giovanni Fiorenza,Kenneth P. Rodbell,David F. Heidel	2009	4
6	Latch Design Techniques for Mitigating Single Event Upsets in 65 nm SOI Device Technology A.J. KleinOsowski,Ethan H. Cannon,Michael S. Gordon,David F. Heidel,Phil Oldiges,C. Plettner,Kenneth P. Rodbell,Ronald D. Rose,Henry H. K. Tang	2007	7
7	Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells Kenneth P. Rodbell,David F. Heidel,Henry H. K. Tang,Michael S. Gordon,Phil Oldiges,Conal E. Murray	2007	151
8	An on-chip jitter measurement circuit with sub-picosecond resolution K.A. Jenkins,Anup Jose,David F. Heidel	2005	25
9	A low temperature 12 ns DRAM W.H. Henkels,Nicky Lu,Wei Hwang,T.V. Rajeevakumar,R. Franch,K.A. Jenkins,T. Bucelot,David F. Heidel,M. Immediato	2003	5
10	Low temperature SER and noise in a high speed DRAM W.H. Henkels,Nicky Lu,Wei Hwang,T.V. Rajeevakumar,R. Franch,K.A. Jenkins,T. Bucelot,David F. Heidel,M. Immediato	2003	4
11	Soft error rate scaling for emerging SOI technology options P. Oldiges,K. Bernstein,David F. Heidel,B. Klaasen,Ethan H. Cannon,R.H. Dennard,Haotian Tang,M. Ieong,H.‐S. Philip Wong	2003	22
12	Designing a testable system on a chip Stephen Kosonocky,A. A. Bright,K. W. Warren,R.A. Haring,S. P. Klepner,Sameh Asaad,S. Basavaiah,B. Havreluk,David F. Heidel,M. Immediato,K. Jenkin,Rathin K. Joshi,Bruce Howard Parker,T.V. Rajeevakumar,Kevin Stawiasz	2002	1
13	High speed serializing/de-serializing design-for-test method for evaluating a 1 GHz microprocessor David F. Heidel,Sang Dhong,H. Peter Hofstee,M. Immediato,Kevin Nowka,J. A. Silberman,Kevin Stawiasz	2002	30
14	Theoretical determination of the temporal and spatial structure of /spl alpha/-particle induced electron-hole pair generation in silicon P. Oldiges,R.H. Dennard,David F. Heidel,B. Klaasen,F. Assaderaghi,M. Ieong	2000	25
15	Implementation of a self-resetting CMOS 64-bit parallel adder with enhanced testability Wei Hwang,George Gristede,P. N. Sanda,S.Y. Wang,David F. Heidel	1999	26
16	Electron beam tester measurements of switching noise in VLSI circuits K.A. Jenkins,David F. Heidel	1991	3
17	Monte Carlo analysis of Josephson logic devices David F. Heidel	1983	2
18	Self-biasing Josephson logic circuits T. Gheewala,David F. Heidel	1982	1
19	Thermoelectric charge imbalance in superconducting aluminum David F. Heidel,J. C. Garland	1981	6
20	THERMOELECTRIC BRANCH IMBALANCE CURRENTS IN SUPERCONDUCTORS David F. Heidel,J. C. Garland	1978	4

About David F. Heidel

David F. Heidel is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Radiation, having authored 54 papers that have together received 1.2k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (28 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers), Semiconductor materials and devices (20 papers), VLSI and Analog Circuit Testing (14 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers), Low-power high-performance VLSI design (8 papers), Physical Unclonable Functions (PUFs) and Hardware Security (5 papers) and Electromagnetic Compatibility and Noise Suppression (4 papers). The work is most often cited by research in Hardware and Architecture (379 citations), Electrical and Electronic Engineering (1.0k citations) and Radiation (145 citations). David F. Heidel has collaborated with scholars based in United States, Netherlands and Canada. Frequent co-authors include Kenneth P. Rodbell, Michael S. Gordon, Henry H. K. Tang, Phil Oldiges, Conal E. Murray, Paul W. Marshall, K.A. Jenkins, Kenneth A. LaBel, James R. Schwank and M.R. Shaneyfelt.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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