Anthony Phan
About
In The Last Decade
Anthony Phan
29 papers receiving 684 citations
Peers
Comparison fields: 5 of 65
- Electrical and Electronic Engineering 561
- Hardware and Architecture 177
- Polymers and Plastics 76
- Materials Chemistry 64
- Radiation 62
Countries citing papers authored by Anthony Phan
This map shows the geographic impact of Anthony Phan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Anthony Phan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Anthony Phan more than expected).
Fields of papers citing papers by Anthony Phan
This network shows the impact of papers produced by Anthony Phan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Anthony Phan. The network helps show where Anthony Phan may publish in the future.
Co-authorship network of co-authors of Anthony Phan
This figure shows the co-authorship network connecting the top 25 collaborators of Anthony Phan. A scholar is included among the top collaborators of Anthony Phan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Anthony Phan. Anthony Phan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 79 | |
| 2 | 22 | |
| 3 | 1 | |
| 4 | Single Event Effects in Field Programmable Gate Array (FPGA) Devices: Update 2020 | 0 |
| 5 | Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report | 1 |
| 6 | Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report | 3 |
| 7 | Heavy Ion Test Report for the AD9257-EP Analog-to-Digital Converter | 1 |
| 8 | Evaluation of the Radiation Susceptibility of a 3D NAND Flash Memory | 2 |
| 9 | Heavy Ion Test Report for the AD9364 RF Transceiver | 2 |
| 10 | Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data | 1 |
| 11 | 15 | |
| 12 | 12 | |
| 13 | 1 | |
| 14 | An Analysis of Heavy-Ion Single Event Effects for a Variety of Finite State-Machine Mitigation Strategies | 1 |
| 15 | Independent Single Event Upset Testing of the Xilinx V5QV | 2 |
| 16 | 2 | |
| 17 | 3 | |
| 18 | 137 | |
| 19 | 105 | |
| 20 | 46 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.