Kevin M. Warren

2.7k total citations
60 papers, 2.1k citations indexed

About

Kevin M. Warren is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Radiation. According to data from OpenAlex, Kevin M. Warren has authored 60 papers receiving a total of 2.1k indexed citations (citations by other indexed papers that have themselves been cited), including 60 papers in Electrical and Electronic Engineering, 23 papers in Hardware and Architecture and 11 papers in Radiation. Recurrent topics in Kevin M. Warren's work include Radiation Effects in Electronics (59 papers), Integrated Circuits and Semiconductor Failure Analysis (30 papers) and Semiconductor materials and devices (24 papers). Kevin M. Warren is often cited by papers focused on Radiation Effects in Electronics (59 papers), Integrated Circuits and Semiconductor Failure Analysis (30 papers) and Semiconductor materials and devices (24 papers). Kevin M. Warren collaborates with scholars based in United States, Sweden and China. Kevin M. Warren's co-authors include Robert A. Weller, Ronald D. Schrimpf, Robert A. Reed, L. W. Massengill, Marcus H. Mendenhall, Brian D. Sierawski, P.E. Dodd, Jeffrey D. Black, Dennis R. Ball and N.F. Haddad and has published in prestigious journals such as IEEE Electron Device Letters, IBM Journal of Research and Development and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.

In The Last Decade

Kevin M. Warren

59 papers receiving 2.0k citations

Peers

Countries citing papers authored by Kevin M. Warren

Since Specialization

Citations

This map shows the geographic impact of Kevin M. Warren's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kevin M. Warren with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kevin M. Warren more than expected).

Fields of papers citing papers by Kevin M. Warren

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kevin M. Warren. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kevin M. Warren. The network helps show where Kevin M. Warren may publish in the future.

Co-authorship network of co-authors of Kevin M. Warren

This figure shows the co-authorship network connecting the top 25 collaborators of Kevin M. Warren. A scholar is included among the top collaborators of Kevin M. Warren based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kevin M. Warren. Kevin M. Warren is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Shifts Using Back-Gate Biasing in 22-nm FD-SOI Transistors 2022 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), (unknown), J. S. Kauppila, T. D. Haeffner, Dennis R. Ball, En Xia Zhang, Kevin M. Warren, Michael L. Alles, L. W. Massengill	5
2	Sensitive-Volume Model of Single-Event Latchup for a 180-nm SRAM Test Structure 2020 ·IEEE Transactions on Nuclear Science ·(unknown), Andrew L. Sternberg, Brian D. Sierawski, En Xia Zhang, Kevin M. Warren, (unknown), (unknown), Nathaniel A. Dodds, György Vizkelethy, (unknown), Daniel M. Fleetwood, Robert A. Reed, Ronald D. Schrimpf	5
3	Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts 2018 ·IEEE Transactions on Nuclear Science ·Jeffrey D. Black, (unknown), Dolores Black, P.E. Dodd, M.R. Shaneyfelt, (unknown), (unknown), (unknown), Matthew J. Davis, Robert A. Reed, Robert A. Weller, (unknown), Kevin M. Warren, (unknown), Ronald D. Schrimpf, (unknown)	4
4	Transmission Line Pulse Test Method for Estimating SEB Performance of $n$ -Channel Lateral DMOS Power Transistors 2017 ·IEEE Transactions on Nuclear Science ·(unknown), P.L. Hower, Kevin M. Warren, R. Baumann	14
5	Probability of latching an SET in advanced technologies 2016 ·(unknown), J. S. Kauppila, Kevin M. Warren, (unknown), B. L. Bhuva, (unknown), K. Lilja, L. W. Massengill	3
6	CRÈME: The 2011 Revision of the Cosmic Ray Effects on Micro-Electronics Code 2012 ·IEEE Transactions on Nuclear Science ·James H. Adams, A. F. Barghouty, Marcus H. Mendenhall, Robert A. Reed, Brian D. Sierawski, Kevin M. Warren, J. W. Watts, Robert A. Weller	47
7	Incremental Enhancement of SEU Hardened 90 nm CMOS Memory Cell 2011 ·IEEE Transactions on Nuclear Science ·N.F. Haddad, (unknown), R.K. Lawrence, Bin Li, John Rodgers, (unknown), Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall, Robert A. Reed	30
8	Monte Carlo simulation of radiation effects in microelectronics 2010 ·Robert A. Weller, Marcus H. Mendenhall, Robert A. Reed, Kevin M. Warren, Brian D. Sierawski, Ronald D. Schrimpf, L. W. Massengill, Makoto Asai	1
9	Monte Carlo Simulation of Single Event Effects 2010 ·IEEE Transactions on Nuclear Science ·Robert A. Weller, Marcus H. Mendenhall, Robert A. Reed, Ronald D. Schrimpf, Kevin M. Warren, Brian D. Sierawski, L. W. Massengill	168
10	Single event upset modeling with nuclear reactions in nanoscale electronics 2008 ·International Conference Mixed Design of Integrated Circuits and Systems ·Marek Turowski, Alex Fedoseyev, Ashok Raman, Kevin M. Warren	9
11	Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry 2008 ·IEEE Transactions on Nuclear Science ·Kevin M. Warren, A. Sternberg, Robert A. Weller, M.P. Baze, (unknown), Robert A. Reed, Marcus H. Mendenhall, Ronald D. Schrimpf	42
12	Assessing Alpha Particle-Induced Single Event Transient Vulnerability in a 90-nm CMOS Technology 2008 ·IEEE Electron Device Letters ·Matthew J. Gadlage, Ronald D. Schrimpf, Balaji Narasimham, Jonathan A. Pellish, Kevin M. Warren, Robert A. Reed, Robert A. Weller, B. L. Bhuva, L. W. Massengill, Xiao‐Wei Zhu	18
13	Reliability and radiation effects in IC technologies 2008 ·DSpace - NTUA (National Technical University of Athens) ·Ronald D. Schrimpf, Kevin M. Warren, Robert A. Weller, Robert A. Reed, L. W. Massengill, Michael L. Alles, Daniel M. Fleetwood, X. J. Zhou, Leonidas Tsetseris, Sokrates T. Pantelides	33
14	Multi-Scale Simulation of Radiation Effects in Electronic Devices 2008 ·IEEE Transactions on Nuclear Science ·Ronald D. Schrimpf, Kevin M. Warren, Dennis R. Ball, Robert A. Weller, Robert A. Reed, Daniel M. Fleetwood, L. W. Massengill, Marcus H. Mendenhall, S. N. Rashkeev, Sokrates T. Pantelides, (unknown)	12
15	Soft error reliability improvements for implantable medical devices 2008 ·(unknown), Jeff Wilkinson, K. J. Walsh, Brian D. Sierawski, Kevin M. Warren, Robert A. Reed, György Vizkelethy	3
16	Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods 2008 ·Kevin M. Warren, Jeff Wilkinson, Robert A. Weller, Brian D. Sierawski, Robert A. Reed, (unknown), Marcus H. Mendenhall, Ronald D. Schrimpf, L. W. Massengill	13
17	A Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations 2007 ·IEEE Transactions on Nuclear Science ·Jonathan A. Pellish, Robert A. Reed, Akil K. Sutton, Robert A. Weller, Martin A. Carts, Paul W. Marshall, Cheryl J. Marshall, (unknown), John D. Cressler, Marcus H. Mendenhall, Ronald D. Schrimpf, Kevin M. Warren, Brian D. Sierawski, Guofu Niu	25
18	The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM 2005 ·IEEE Transactions on Nuclear Science ·Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall, Robert A. Reed, Dennis R. Ball, (unknown), Brian D. Olson, Michael L. Alles, L. W. Massengill, Ronald D. Schrimpf, N.F. Haddad, S. Doyle, Dale McMorrow, Joseph S. Melinger, William T. Lotshaw	133
19	Single event testing of DC/DC converters for space flight 2003 ·Kevin M. Warren, David R. Roth, J.D. Kinnison, R. Pappalardo	4
20	Analysis of the influence of MOS device geometry on predicted SEU cross sections 1999 ·IEEE Transactions on Nuclear Science ·Kevin M. Warren, L. W. Massengill, Ronald D. Schrimpf, Hugh Barnaby	19

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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