Megan C. Casey
About
In The Last Decade
Megan C. Casey
55 papers receiving 578 citations
Peers
Comparison fields: 5 of 35
- Electrical and Electronic Engineering 588
- Hardware and Architecture 180
- Aerospace Engineering 30
- Safety, Risk, Reliability and Quality 22
- Radiation 21
Countries citing papers authored by Megan C. Casey
This map shows the geographic impact of Megan C. Casey's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Megan C. Casey with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Megan C. Casey more than expected).
Fields of papers citing papers by Megan C. Casey
This network shows the impact of papers produced by Megan C. Casey. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Megan C. Casey. The network helps show where Megan C. Casey may publish in the future.
Co-authorship network of co-authors of Megan C. Casey
This figure shows the co-authorship network connecting the top 25 collaborators of Megan C. Casey. A scholar is included among the top collaborators of Megan C. Casey based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Megan C. Casey. Megan C. Casey is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 8 | |
| 5 | 1 | |
| 6 | 2 | |
| 7 | 8 | |
| 8 | 8 | |
| 9 | 6 | |
| 10 | Taking SiC Power Devices to the Final Frontier: Addressing Challenges of the Space Radiation Environment | 8 |
| 11 | Destructive Single-Event Effects in Diodes | 1 |
| 12 | Silicon Carbide Power Device Performance Under Heavy-Ion Irradiation | 22 |
| 13 | Single-Event Transient Testing of the Crane Aerospace and Electronics SMHF2812D Dual DC-DC Converter | 1 |
| 14 | Destructive Single-Event Failures in Schottky Diodes | 3 |
| 15 | 8 | |
| 16 | 7 | |
| 17 | 3 | |
| 18 | Probing the SEB Sensitive Depth of a Power MOSFET Using a Two-Photon Absorption Laser Method | 3 |
| 19 | 10 | |
| 20 | 28 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.