Martin A. Carts

1.6k total citations
56 papers, 1.1k citations indexed

About

Martin A. Carts is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Aerospace Engineering. According to data from OpenAlex, Martin A. Carts has authored 56 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 55 papers in Electrical and Electronic Engineering, 11 papers in Hardware and Architecture and 9 papers in Aerospace Engineering. Recurrent topics in Martin A. Carts's work include Radiation Effects in Electronics (50 papers), Semiconductor materials and devices (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (14 papers). Martin A. Carts is often cited by papers focused on Radiation Effects in Electronics (50 papers), Semiconductor materials and devices (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (14 papers). Martin A. Carts collaborates with scholars based in United States, France and Netherlands. Martin A. Carts's co-authors include Paul W. Marshall, Robert A. Reed, Kenneth A. LaBel, Cheryl J. Marshall, S. Büchner, C.M. Seidleck, B.A. Randall, Barry K. Gilbert, C.J. Dale and Dale McMorrow and has published in prestigious journals such as Solid-State Electronics, IEEE Transactions on Nuclear Science and Planetary and Space Science.

In The Last Decade

Martin A. Carts

52 papers receiving 1.0k citations

Peers

Martin A. Carts
Ray Ladbury United States
C.M. Seidleck United States
T. F. Miyahira United States
B.G. Rax United States
K.A. LaBel United States
R. Koga United States
Jonathan A. Pellish United States
Gregory R. Allen United States
F. Bezerra France
G.L. Hash United States
Ray Ladbury United States
Martin A. Carts
Citations per year, relative to Martin A. Carts Martin A. Carts (= 1×) peers Ray Ladbury

Countries citing papers authored by Martin A. Carts

Since Specialization
Citations

This map shows the geographic impact of Martin A. Carts's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Martin A. Carts with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Martin A. Carts more than expected).

Fields of papers citing papers by Martin A. Carts

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Martin A. Carts. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Martin A. Carts. The network helps show where Martin A. Carts may publish in the future.

Co-authorship network of co-authors of Martin A. Carts

This figure shows the co-authorship network connecting the top 25 collaborators of Martin A. Carts. A scholar is included among the top collaborators of Martin A. Carts based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Martin A. Carts. Martin A. Carts is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Regoli, Leonardo, Mark B. Moldwin, Tom Nordheim, et al.. (2020). Radiation tolerance of the PNI RM3100 magnetometer for a Europa lander mission. Geoscientific instrumentation, methods and data systems. 9(2). 499–507. 6 indexed citations
2.
Ninkov, Zoran, et al.. (2020). Total ionizing dose effects on digital micromirror devices. Journal of Astronomical Telescopes Instruments and Systems. 6(4). 3 indexed citations
3.
LaBel, Kenneth A., Martin A. Carts, Matthew Kay, et al.. (2013). Hardness Assurance for Total Dose and Dose Rate Testing of a State-of-the-Art Off-Shore 32 nm CMOS Processor. 1–6. 3 indexed citations
4.
Campola, Michael J., Martin A. Carts, Megan C. Casey, et al.. (2011). Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems. NASA STI Repository (National Aeronautics and Space Administration). 1–10. 3 indexed citations
5.
Oldham, Timothy R., et al.. (2011). Effect of Radiation Exposure on the Retention of Commercial NAND Flash Memory. IEEE Transactions on Nuclear Science. 58(6). 2904–2910. 27 indexed citations
6.
Chen, Dakai, Timothy R. Oldham, Hak Kim, et al.. (2010). Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA. 56. 8–8.
7.
Chen, Dakai, James Forney, R.L. Pease, et al.. (2010). The Effects of ELDRS at Ultra-Low Dose Rates. NASA STI Repository (National Aeronautics and Space Administration). 6–6. 16 indexed citations
8.
Oldham, Timothy R., M. Friendlich, Martin A. Carts, C.M. Seidleck, & Kenneth A. LaBel. (2009). Effect of Radiation Exposure on the Endurance of Commercial nand Flash Memory. IEEE Transactions on Nuclear Science. 56(6). 3280–3284. 25 indexed citations
9.
Büchner, S., Anthony B. Sanders, Kenneth A. LaBel, et al.. (2008). Compendium of Recent Total Ionizing Dose Results for Candidate Spacecraft Electronics for NASA. 5–10. 13 indexed citations
10.
Pellish, Jonathan A., Robert A. Reed, Akil K. Sutton, et al.. (2007). A Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations. IEEE Transactions on Nuclear Science. 54(6). 2322–2329. 25 indexed citations
11.
Sutton, Akil K., John D. Cressler, Martin A. Carts, et al.. (2007). Proton-induced SEU in SiGe digital logic at cryogenic temperatures. 53. 1–2. 5 indexed citations
12.
Büchner, S., Tim Irwin, Ray Ladbury, et al.. (2005). Current total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA. NASA STI Repository (National Aeronautics and Space Administration). 19–25. 4 indexed citations
13.
Marshall, Paul W., Martin A. Carts, A.B. Campbell, et al.. (2004). A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS. IEEE Transactions on Nuclear Science. 51(6). 3457–3463. 33 indexed citations
14.
Reed, Robert A., Paul W. Marshall, J.C. Pickel, et al.. (2003). Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits. IEEE Transactions on Nuclear Science. 50(6). 2184–2190. 57 indexed citations
15.
Reed, Robert A., Paul W. Marshall, Jim Pickel, et al.. (2003). Broad Beam and Ion Microprobe Studies of Single-Event Upsets in High Speed 0.18micron Silicon Germanium Heterojunction Bipolar Transistors and Circuits. 2 indexed citations
16.
O'Bryan, Martha V., Kenneth A. LaBel, Robert A. Reed, et al.. (2003). Recent radiation damage and single event effect results for microelectronics. 1–14. 15 indexed citations
17.
O'Bryan, Martha V., K.A. LaBel, Robert A. Reed, et al.. (2002). Radiation damage and single event effect results for candidate spacecraft electronics. NASA STI Repository (National Aeronautics and Space Administration). 106–122. 22 indexed citations
18.
Howard, James W., et al.. (2002). Proton Single Event Effects (SEE) Testing of the Myrinet Crossbar Switch and Network Interface Card. NASA Technical Reports Server (NASA).
19.
Marshall, Cheryl J., et al.. (2002). Characterization of transient error cross sections in high speed commercial fiber optic data links. 142–145. 10 indexed citations
20.
Reed, Robert A., Martin A. Carts, Paul W. Marshall, et al.. (1996). Single Event Upset cross sections at various data rates. IEEE Transactions on Nuclear Science. 43(6). 2862–2867. 47 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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