G.L. Hash

2.1k total citations
48 papers, 1.6k citations indexed

About

G.L. Hash is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Safety, Risk, Reliability and Quality. According to data from OpenAlex, G.L. Hash has authored 48 papers receiving a total of 1.6k indexed citations (citations by other indexed papers that have themselves been cited), including 47 papers in Electrical and Electronic Engineering, 8 papers in Hardware and Architecture and 3 papers in Safety, Risk, Reliability and Quality. Recurrent topics in G.L. Hash's work include Radiation Effects in Electronics (34 papers), Semiconductor materials and devices (34 papers) and Integrated Circuits and Semiconductor Failure Analysis (27 papers). G.L. Hash is often cited by papers focused on Radiation Effects in Electronics (34 papers), Semiconductor materials and devices (34 papers) and Integrated Circuits and Semiconductor Failure Analysis (27 papers). G.L. Hash collaborates with scholars based in United States, France and Canada. G.L. Hash's co-authors include M.R. Shaneyfelt, P.E. Dodd, F.W. Sexton, J.R. Schwank, P.S. Winokur, Daniel M. Fleetwood, B.L. Draper, D.S. Walsh, Philippe Paillet and J. Baggio and has published in prestigious journals such as IEEE Transactions on Nuclear Science, OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) and University of North Texas Digital Library (University of North Texas).

In The Last Decade

G.L. Hash

45 papers receiving 1.5k citations

Peers

Countries citing papers authored by G.L. Hash

Since Specialization

Citations

This map shows the geographic impact of G.L. Hash's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G.L. Hash with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G.L. Hash more than expected).

Fields of papers citing papers by G.L. Hash

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G.L. Hash. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G.L. Hash. The network helps show where G.L. Hash may publish in the future.

Co-authorship network of co-authors of G.L. Hash

This figure shows the co-authorship network connecting the top 25 collaborators of G.L. Hash. A scholar is included among the top collaborators of G.L. Hash based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G.L. Hash. G.L. Hash is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Effects of Moisture and Hydrogen Exposure on Radiation-Induced MOS Device Degradation and Its Implications for Long-Term Aging 2008 ·IEEE Transactions on Nuclear Science ·James R. Schwank, M.R. Shaneyfelt, (unknown), (unknown), (unknown), Daniel M. Fleetwood, Ronald D. Schrimpf, Sokrates T. Pantelides, James A. Felix, P.E. Dodd, (unknown), Philippe Paillet, Scott M. Dalton, Scot E. Swanson, G.L. Hash, (unknown), James Michael Hochrein, G.K. Lum	6
2	Heavy Ion Energy Effects in CMOS SRAMs 2007 ·IEEE Transactions on Nuclear Science ·P.E. Dodd, J.R. Schwank, M.R. Shaneyfelt, V. Ferlet-Cavrois, Philippe Paillet, J. Baggio, G.L. Hash, J. Félix, Kazuyuki Hirose, Hirobumi Saito	35
3	Radiation Response and Variability of Advanced Commercial Foundry Technologies 2006 ·IEEE Transactions on Nuclear Science ·James A. Felix, P.E. Dodd, M.R. Shaneyfelt, James R. Schwank, G.L. Hash	17
4	Effects of particle energy on proton-induced single-event latchup 2005 ·IEEE Transactions on Nuclear Science ·J.R. Schwank, M.R. Shaneyfelt, J. Baggio, P.E. Dodd, J. Félix, V. Ferlet-Cavrois, Philippe Paillet, Damien Lambert, F.W. Sexton, G.L. Hash, E. W. Blackmore	88
5	Effects of Total Dose Irradiation on Single-Event Upset Hardness 2005 ·J.R. Schwank, M.R. Shaneyfelt, J. Félix, P.E. Dodd, (unknown), P. Paillet, J. Baggio, G.L. Hash, Richard S. Flores, L. W. Massengill, E. W. Blackmore	3
6	Identification of Radiation-Induced Parasitic Leakage Paths Using Light Emission Microscopy 2004 ·ESASP ·M.R. Shaneyfelt, Paiboon Tangyunyong, (unknown), (unknown), Matthew Jerry, Richard S. Flores, James R. Schwank, R. J. Dodd, (unknown), G.L. Hash	1
7	Neutron-induced soft errors, latchup, and comparison of SER test methods for SRAM technologies 2003 ·P.E. Dodd, M.R. Shaneyfelt, J.R. Schwank, G.L. Hash	53
8	Radiation characterization of a Monolithic nuclear event detector 2003 ·G.L. Hash, J.R. Schwank, M.R. Shaneyfelt, K.L. Hughes, (unknown), (unknown), (unknown), R. L. Martin	0
9	Charge collection in SOI capacitors and circuits and its effect on SEU hardness 2002 ·IEEE Transactions on Nuclear Science ·J.R. Schwank, P.E. Dodd, M.R. Shaneyfelt, György Vizkelethy, B.L. Draper, (unknown), D.S. Walsh, G.L. Hash, Barney L. Doyle, Floyd D. McDaniel	44
10	Radiation hardness assurance categories for COTS technologies 2002 ·G.L. Hash, M.R. Shaneyfelt, F.W. Sexton, P.S. Winokur	12
11	Single-event upset and snapback in silicon-on-insulator devices 2000 ·University of North Texas Digital Library (University of North Texas) ·P.E. Dodd, M.R. Shaneyfelt, James R. Schwank, G.L. Hash, B.L. Draper, P.S. Winokur	3
12	Thermal-stress effects on enhanced low-dose-rate sensitivity of linear bipolar circuits 2000 ·University of North Texas Digital Library (University of North Texas) ·M.R. Shaneyfelt, James R. Schwank, S.C. Witczak, L.C. Riewe, P.S. Winokur, G.L. Hash	5
13	The role of thermal and fission neutrons in reactor neutron-induced upsets in commercial SRAMs 1997 ·IEEE Transactions on Nuclear Science ·Patrick Griffin, (unknown), F.W. Sexton, P. J. Cooper, (unknown), G.L. Hash, (unknown)	23
14	Impact of aging on radiation hardness[CMOS SRAMs] 1997 ·IEEE Transactions on Nuclear Science ·M.R. Shaneyfelt, P.S. Winokur, Daniel M. Fleetwood, G.L. Hash, J.R. Schwank, F.W. Sexton, R.L. Pease	27
15	SEU and SEL response of the Westinghouse 64K E-2PROM, analog devices AD7876 12-bit ADC, and the Intel 82527 Serial Communications Controller 1994 ·F.W. Sexton, G.L. Hash, (unknown), J. Murray, J.R. Schwank, P.S. Winokur, (unknown)	0
16	Interface-trap building rates in wet and dry oxides 1992 ·IEEE Transactions on Nuclear Science ·M.R. Shaneyfelt, J.R. Schwank, Daniel M. Fleetwood, P.S. Winokur, K.L. Hughes, G.L. Hash, (unknown)	41
17	Transient radiation hardness of the CMOSV 1.25 micron technology 1991 ·IEEE Transactions on Nuclear Science ·(unknown), G.L. Hash, (unknown), R.K. Treece	7
18	Failure mechanisms of integrated circuits in space 1987 ·P.S. Winokur, F.W. Sexton, G.L. Hash	1
19	Current Induced Avalanche in Epitaxial Structures 1985 ·IEEE Transactions on Nuclear Science ·T. F. Wrobel, (unknown), G.L. Hash, L. J. Smith	49
20	Snap-Back: A Stable Regenerative Breakdown Mode of MOS Devices 1983 ·IEEE Transactions on Nuclear Science ·A. Ochoa, F.W. Sexton, T. F. Wrobel, G.L. Hash, (unknown)	28

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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