Richard Wong

2.2k total citations
90 papers, 1.7k citations indexed

About

Richard Wong is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Materials Chemistry. According to data from OpenAlex, Richard Wong has authored 90 papers receiving a total of 1.7k indexed citations (citations by other indexed papers that have themselves been cited), including 83 papers in Electrical and Electronic Engineering, 33 papers in Hardware and Architecture and 5 papers in Materials Chemistry. Recurrent topics in Richard Wong's work include Radiation Effects in Electronics (57 papers), Semiconductor materials and devices (40 papers) and VLSI and Analog Circuit Testing (32 papers). Richard Wong is often cited by papers focused on Radiation Effects in Electronics (57 papers), Semiconductor materials and devices (40 papers) and VLSI and Analog Circuit Testing (32 papers). Richard Wong collaborates with scholars based in United States, China and South Korea. Richard Wong's co-authors include Shi-Jie Wen, B. L. Bhuva, Sanghyeon Baeg, S. Jagannathan, L. W. Massengill, T. D. Loveless, N. N. Mahatme, N. J. Gaspard, Chris H. Kim and Rita Fung and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Industry Applications and SAE technical papers on CD-ROM/SAE technical paper series.

In The Last Decade

Richard Wong

89 papers receiving 1.7k citations

Peers

Richard Wong

EEE

CNC

Arthur F. Witulski United States

P. Hazucha United States

Chang Chen United States

B. Courtois France

He Tang China

Kazutoshi Kobayashi Japan

Alan J. Weger United States

Ganesh Balamurugan United States

B. Bloechel United States

Sharat C. Prasad United States

Arthur F. Witulski United States

Richard Wong

3.8k ×2.4

EEE

1.1k ×1.5

89 ×0.7

CNC

92 ×0.8

160 ×1.5

Citations per year, relative to Richard Wong Richard Wong (= 1×) peers Arthur F. Witulski

Countries citing papers authored by Richard Wong

Since Specialization

Citations

This map shows the geographic impact of Richard Wong's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Richard Wong with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Richard Wong more than expected).

Fields of papers citing papers by Richard Wong

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Richard Wong. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Richard Wong. The network helps show where Richard Wong may publish in the future.

Co-authorship network of co-authors of Richard Wong

This figure shows the co-authorship network connecting the top 25 collaborators of Richard Wong. A scholar is included among the top collaborators of Richard Wong based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Richard Wong. Richard Wong is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Shamseddine, A., Kaveh Zakeri, Yao Yu, et al.. (2025). The Use of Proton Radiation in the Management of Adenoid Cystic Carcinoma. International Journal of Particle Therapy. 18. 101206–101206.

Weber, Johannes, Rita Fung, Richard Wong, et al.. (2019). Stress Current Slew Rate Sensitivity of an Ultra-High-Speed Interface IC. IEEE Transactions on Device and Materials Reliability. 19(4). 591–601. 1 indexed citations

Wong, Richard, et al.. (2019). Characterization of ESD shielding materials with novel test methods. Journal of Physics Conference Series. 1322(1). 12023–12023. 3 indexed citations

Kundu, Somnath, Muqing Liu, Richard Wong, Shi-Jie Wen, & Chris H. Kim. (2018). A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning. 308–310. 34 indexed citations

Weber, Johannes, et al.. (2018). Comparison of CDM and CC-TLP robustness for an ultra-high speed interface IC. Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft). 1–9. 9 indexed citations

Fung, Rita, et al.. (2017). Charged device ESD threats with high speed RF interfaces. 1–8. 8 indexed citations

Wang, Haibin, Li Chen, Aixiang He, et al.. (2016). A 65 nm Temporally Hardened Flip-Flop Circuit. IEEE Transactions on Nuclear Science. 63(6). 2934–2940. 22 indexed citations

Wang, Haibin, Li Chen, J. S. Kauppila, et al.. (2016). An Area Efficient Stacked Latch Design Tolerant to SEU in 28 nm FDSOI Technology. IEEE Transactions on Nuclear Science. 63(6). 3003–3009. 22 indexed citations

Evans, Adrian, Li Chen, Maximilien Glorieux, et al.. (2016). Single Event Transient and TID Study in 28 nm UTBB FDSOI Technology. IEEE Transactions on Nuclear Science. 64(1). 113–118. 49 indexed citations

10.

Lim, C.K., et al.. (2015). Stuck Bits Study in DDR3 SDRAMs Using 45-MeV Proton Beam. IEEE Transactions on Nuclear Science. 62(2). 520–526. 18 indexed citations

11.

Wang, Haibin, Li Chen, Sanghyeon Baeg, et al.. (2014). Single Event Resilient Dynamic Logic Designs. Journal of Electronic Testing. 30(6). 751–761. 2 indexed citations

12.

Mahatme, N. N., N. J. Gaspard, T. Assis, et al.. (2014). Impact of technology scaling on the combinational logic soft error rate. Explore Bristol Research. 5F.2.1–5F.2.6. 35 indexed citations

13.

Chatterjee, Indranil, B. L. Bhuva, Shi-Jie Wen, & Richard Wong. (2012). Influence of User-Controlled Parameters in Alpha Particle-Induced Single-Event Error Rates in Commercial SRAM Cells. IEEE Transactions on Nuclear Science. 59(4). 872–879. 2 indexed citations

14.

Dodds, Nathaniel A., Nicholas C. Hooten, Robert A. Reed, et al.. (2012). Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect. IEEE Transactions on Nuclear Science. 59(6). 2642–2650. 39 indexed citations

15.

Loveless, T. D., S. Jagannathan, B. L. Bhuva, et al.. (2011). Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node. IEEE Transactions on Nuclear Science. 58(3). 1008–1014. 105 indexed citations

16.

Bhuva, B. L., Balaji Narasimham, A. S. Oates, et al.. (2011). Soft error testing at advanced technology nodes. 5B.1.1–5B.1.4. 2 indexed citations

17.

Schwank, James R., M.R. Shaneyfelt, Véronique Ferlet-Cavrois, et al.. (2011). Hardness assurance testing for proton direct ionization effects. 788–794. 4 indexed citations

18.

Baeg, Sanghyeon, Shi-Jie Wen, & Richard Wong. (2009). Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Transactions on Circuits and Systems I Regular Papers. 57(4). 814–822. 37 indexed citations

19.

Baeg, Sanghyeon, Shi-Jie Wen, & Richard Wong. (2009). SRAM Interleaving Distance Selection With a Soft Error Failure Model. IEEE Transactions on Nuclear Science. 56(4). 2111–2118. 111 indexed citations

20.

Wong, Richard. (1989). Adhesively Bonded Composite Structures: Process Control, Non Destructive Inspection, and Strength Effects. SAE technical papers on CD-ROM/SAE technical paper series. 1. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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