N. Seifert

3.3k total citations · 1 hit paper
61 papers, 2.5k citations indexed

About

N. Seifert is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computational Mechanics. According to data from OpenAlex, N. Seifert has authored 61 papers receiving a total of 2.5k indexed citations (citations by other indexed papers that have themselves been cited), including 48 papers in Electrical and Electronic Engineering, 25 papers in Hardware and Architecture and 13 papers in Computational Mechanics. Recurrent topics in N. Seifert's work include Radiation Effects in Electronics (40 papers), VLSI and Analog Circuit Testing (22 papers) and Semiconductor materials and devices (22 papers). N. Seifert is often cited by papers focused on Radiation Effects in Electronics (40 papers), VLSI and Analog Circuit Testing (22 papers) and Semiconductor materials and devices (22 papers). N. Seifert collaborates with scholars based in United States, Austria and United Kingdom. N. Seifert's co-authors include Subhasish Mitra, B. Gill, Qi Shi, Ming Zhang, Kee Sup Kim, V. Ambrose, L. W. Massengill, Xiao‐Wei Zhu, Shah M. Jahinuzzaman and Quan Shi and has published in prestigious journals such as Physical review. B, Condensed matter, Physical Review A and Applied Surface Science.

In The Last Decade

N. Seifert

60 papers receiving 2.4k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Robust system design with built-in soft-error resilience

2005 409 citations Subhasish Mitra, N. Seifert et al. profile →

Peers

Countries citing papers authored by N. Seifert

Since Specialization

Citations

This map shows the geographic impact of N. Seifert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Seifert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Seifert more than expected).

Fields of papers citing papers by N. Seifert

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. Seifert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Seifert. The network helps show where N. Seifert may publish in the future.

Co-authorship network of co-authors of N. Seifert

This figure shows the co-authorship network connecting the top 25 collaborators of N. Seifert. A scholar is included among the top collaborators of N. Seifert based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. Seifert. N. Seifert is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	On the Single Event Upset Susceptibility of 10-nm SRAM Devices to Ionizing Radiation 2025 ·IEEE Transactions on Nuclear Science ·N. Seifert, Soon Young Lee, (unknown), (unknown), (unknown), (unknown)	0
2	Soft Error Rate Improvements in 14-nm Technology Featuring Second-Generation 3D Tri-Gate Transistors 2015 ·IEEE Transactions on Nuclear Science ·N. Seifert, Shah M. Jahinuzzaman, Jyothi Velamala, Ricardo Ascázubi, (unknown), B. Gill, (unknown), J. Hicks	83
3	Susceptibility of planar and 3D tri-gate technologies to muon-induced single event upsets 2015 ·N. Seifert, Shah M. Jahinuzzaman, Jyothi Velamala, (unknown)	27
4	Timing vulnerability factors of sequential elements in modern microprocessors 2013 ·(unknown), (unknown), N. Seifert	11
5	Soft Error Susceptibilities of 22 nm Tri-Gate Devices 2012 ·IEEE Transactions on Nuclear Science ·N. Seifert, B. Gill, Shah M. Jahinuzzaman, (unknown), V. Ambrose, Quan Shi, R. Allmon, (unknown)	142
6	The Susceptibility of 45 and 32 nm Bulk CMOS Latches to Low-Energy Protons 2011 ·IEEE Transactions on Nuclear Science ·N. Seifert, B. Gill, Jonathan A. Pellish, Paul W. Marshall, Kenneth A. LaBel	28
7	Explaining Cache SER Anomaly Using Relative DUE AVF Measurement 2010 ·Digital WPI ·Arijit Biswas, C. H. Recchia, Shubhendu S. Mukherjee, V. Ambrose, (unknown), Aamer Jaleel, (unknown), N. Seifert	2
8	Radiation-induced Soft Errors: A Chip-level Modeling Perspective 2010 ·N. Seifert	20
9	Comparison of alpha-particle and neutron-induced combinational and sequential logic error rates at the 32nm technology node 2009 ·B. Gill, N. Seifert, (unknown)	85
10	Built-In Soft Error Resilience for Robust System Design 2007 ·Subhasish Mitra, Ming Zhang, N. Seifert, (unknown), Kee Sup Kim	53
11	Design for Resilience to Soft Errors and Variations 2007 ·Ming Zhang, Terrence Mak, Jim Tschanz, Kee Sup Kim, N. Seifert, (unknown)	16
12	Node sensitivity analysis for soft errors in CMOS logic 2006 ·B. Gill, C. Papachristou, Francis Wolff, N. Seifert	29
13	Logic soft errors a major barrier to robust platform design 2006 ·Subhasish Mitra, Ming Zhang, Terrence Mak, N. Seifert, (unknown), Kee Sup Kim	36
14	Extending Moore's Law into the next Decade - the SER Challenge 2006 ·N. Seifert	1
15	Radiation-induced clock jitter and race 2005 ·N. Seifert, (unknown), Mondira Pant, V. Ambrose, (unknown)	59
16	Anomalous temperature dependence of the desorption of excited sodium atomsinduced by ion bombardment of sodium fluoride crystals 1997 ·Physical review. B, Condensed matter ·Qun Yan, R. G. Albridge, (unknown), N. Seifert, N. H. Tolk	1
17	Droplet formation on metallic surfaces during low-fluence laser irradiation 1996 ·Applied Surface Science ·N. Seifert, G. Betz, W. Husinsky	16
18	Defect mediated sputtering of amorphous LiF induced by low-energy ion bombardment 1995 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·N. Seifert, Qun Yan, A. V. Barnes, N. H. Tolk, T. Neidhart, П. Варга, W. Husinsky, G. Betz	4
19	Photon and electron-stimulated desorption of excited alkali-metal atoms and CN molecules from alkali halide surfaces 1994 ·Radiation effects and defects in solids ·S. Vijayalakshmi, D. Liu, Junbo Xu, N. Seifert, D. J. McClure, Akira Ueda, (unknown), R. G. Albridge, (unknown), N. H. Tolk	5
20	Simultaneous measurements of transmission optical absorption and electron stimulated Li desorption on LiF crystals 1992 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·N. Seifert, Hui Ye, D. Liu, R. G. Albridge, (unknown), N. H. Tolk, W. Husinsky, G. Betz	13

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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