N. Seifert

3.3k total citations · 1 hit paper
61 papers, 2.5k citations indexed

About

N. Seifert is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computational Mechanics. According to data from OpenAlex, N. Seifert has authored 61 papers receiving a total of 2.5k indexed citations (citations by other indexed papers that have themselves been cited), including 48 papers in Electrical and Electronic Engineering, 25 papers in Hardware and Architecture and 13 papers in Computational Mechanics. Recurrent topics in N. Seifert's work include Radiation Effects in Electronics (40 papers), VLSI and Analog Circuit Testing (22 papers) and Semiconductor materials and devices (22 papers). N. Seifert is often cited by papers focused on Radiation Effects in Electronics (40 papers), VLSI and Analog Circuit Testing (22 papers) and Semiconductor materials and devices (22 papers). N. Seifert collaborates with scholars based in United States, Austria and United Kingdom. N. Seifert's co-authors include Subhasish Mitra, B. Gill, Qi Shi, Ming Zhang, Kee Sup Kim, V. Ambrose, Xiao‐Wei Zhu, L. W. Massengill, Shah M. Jahinuzzaman and Quan Shi and has published in prestigious journals such as Physical review. B, Condensed matter, Physical Review A and Applied Surface Science.

In The Last Decade

N. Seifert

60 papers receiving 2.4k citations

Hit Papers

align trajectories sort by overperformance

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Robust system design with built-in soft-error resilience

2005 409 citations Subhasish Mitra, N. Seifert et al. profile →

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author						Papers	Cites
N. Seifert	2.3k	1.4k	247	170	93	61	2.5k
R. Koga	1.5k 0.6×	509 0.4×	78 0.3×	65 0.4×	47 0.5×	87	1.6k
M. H. Woods	1.2k 0.5×	305 0.2×	107 0.4×	44 0.3×	61 0.7×	18	1.3k
C. Poivey	1.2k 0.5×	338 0.2×	71 0.3×	98 0.6×	52 0.6×	111	1.3k
Véronique Ferlet-Cavrois	1.8k 0.8×	299 0.2×	114 0.5×	21 0.1×	59 0.6×	73	2.0k
C.M. Seidleck	1.2k 0.5×	280 0.2×	103 0.4×	50 0.3×	35 0.4×	64	1.3k
Jonathan A. Pellish	1.5k 0.6×	371 0.3×	37 0.1×	68 0.4×	69 0.7×	102	1.5k
David F. Heidel	1.0k 0.4×	379 0.3×	62 0.3×	25 0.1×	25 0.3×	54	1.2k
C. Carmichael	744 0.3×	506 0.3×	73 0.3×	54 0.3×	16 0.2×	30	814
Marta Bagatin	1.4k 0.6×	214 0.1×	241 1.0×	13 0.1×	60 0.6×	123	1.6k
Frédéric Saigné	1.8k 0.8×	386 0.3×	35 0.1×	61 0.4×	81 0.9×	192	2.0k

Countries citing papers authored by N. Seifert

Since Specialization

Citations

This map shows the geographic impact of N. Seifert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Seifert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Seifert more than expected).

Fields of papers citing papers by N. Seifert

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. Seifert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Seifert. The network helps show where N. Seifert may publish in the future.

Co-authorship network of co-authors of N. Seifert

This figure shows the co-authorship network connecting the top 25 collaborators of N. Seifert. A scholar is included among the top collaborators of N. Seifert based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. Seifert. N. Seifert is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Seifert, N., et al.. (2025). On the Single Event Upset Susceptibility of 10-nm SRAM Devices to Ionizing Radiation. IEEE Transactions on Nuclear Science. 72(5). 1768–1778.

Seifert, N., Shah M. Jahinuzzaman, Jyothi Velamala, et al.. (2015). Soft Error Rate Improvements in 14-nm Technology Featuring Second-Generation 3D Tri-Gate Transistors. IEEE Transactions on Nuclear Science. 62(6). 2570–2577. 83 indexed citations

Jahinuzzaman, Shah M., B. Gill, V. Ambrose, & N. Seifert. (2013). Correlating low energy neutron SER with broad beam neutron and 200 MeV proton SER for 22nm CMOS Tri-Gate devices. 89 a. 3D.1.1–3D.1.6. 9 indexed citations

Seifert, N., et al.. (2013). Timing vulnerability factors of sequential elements in modern microprocessors. 4. 55–60. 11 indexed citations

Seifert, N., B. Gill, Shah M. Jahinuzzaman, et al.. (2012). Soft Error Susceptibilities of 22 nm Tri-Gate Devices. IEEE Transactions on Nuclear Science. 59(6). 2666–2673. 142 indexed citations

Seifert, N., B. Gill, Jonathan A. Pellish, Paul W. Marshall, & Kenneth A. LaBel. (2011). The Susceptibility of 45 and 32 nm Bulk CMOS Latches to Low-Energy Protons. IEEE Transactions on Nuclear Science. 58(6). 2711–2718. 28 indexed citations

Biswas, Arijit, C. H. Recchia, Shubhendu S. Mukherjee, et al.. (2010). Explaining Cache SER Anomaly Using Relative DUE AVF Measurement. Digital WPI. 2 indexed citations

Seifert, N.. (2010). Radiation-induced Soft Errors: A Chip-level Modeling Perspective. 4(2-3). 99–221. 20 indexed citations

Gill, B., et al.. (2009). Comparison of alpha-particle and neutron-induced combinational and sequential logic error rates at the 32nm technology node. 199–205. 85 indexed citations

10.

Zhang, Ming, et al.. (2007). Design for Resilience to Soft Errors and Variations. 23–28. 16 indexed citations

11.

Mitra, Subhasish, et al.. (2007). Built-In Soft Error Resilience for Robust System Design. 1–6. 53 indexed citations

12.

Gill, B., C. Papachristou, Francis Wolff, & N. Seifert. (2006). Node sensitivity analysis for soft errors in CMOS logic. 964–972. 29 indexed citations

13.

Seifert, N.. (2006). Extending Moore's Law into the next Decade - the SER Challenge. 7–7. 1 indexed citations

14.

Mitra, Subhasish, et al.. (2006). Logic soft errors a major barrier to robust platform design. 687–696. 36 indexed citations

15.

Seifert, N., et al.. (2005). Radiation-induced clock jitter and race. 215–222. 59 indexed citations

16.

Seifert, N. & G. Betz. (1998). Computer simulations of laser-induced ejection of droplets. Applied Surface Science. 133(3). 189–194. 12 indexed citations

17.

Yan, Qun, et al.. (1997). Anomalous temperature dependence of the desorption of excited sodium atomsinduced by ion bombardment of sodium fluoride crystals. Physical review. B, Condensed matter. 55(5). 2854–2858. 1 indexed citations

18.

Seifert, N., G. Betz, & W. Husinsky. (1996). Droplet formation on metallic surfaces during low-fluence laser irradiation. Applied Surface Science. 103(1). 63–70. 16 indexed citations

19.

Seifert, N., Qun Yan, A. V. Barnes, et al.. (1995). Defect mediated sputtering of amorphous LiF induced by low-energy ion bombardment. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 101(1-2). 131–136. 4 indexed citations

20.

Seifert, N., Hui Ye, D. Liu, et al.. (1992). Simultaneous measurements of transmission optical absorption and electron stimulated Li desorption on LiF crystals. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 72(3-4). 401–408. 13 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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