Edward P. Wilcox

716 total citations
60 papers, 485 citations indexed

About

Edward P. Wilcox is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Radiation. According to data from OpenAlex, Edward P. Wilcox has authored 60 papers receiving a total of 485 indexed citations (citations by other indexed papers that have themselves been cited), including 57 papers in Electrical and Electronic Engineering, 11 papers in Aerospace Engineering and 10 papers in Radiation. Recurrent topics in Edward P. Wilcox's work include Radiation Effects in Electronics (53 papers), Semiconductor materials and devices (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). Edward P. Wilcox is often cited by papers focused on Radiation Effects in Electronics (53 papers), Semiconductor materials and devices (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). Edward P. Wilcox collaborates with scholars based in United States and Australia. Edward P. Wilcox's co-authors include Kenneth A. LaBel, Megan C. Casey, Hak Kim, Jean‐Marie Lauenstein, Raymond L. Ladbury, Michael J. Campola, Anthony Phan, Anthony M. Phan, Dakai Chen and Jonathan A. Pellish and has published in prestigious journals such as IEEE Transactions on Nuclear Science, PubMed and NASA STI Repository (National Aeronautics and Space Administration).

In The Last Decade

Edward P. Wilcox

57 papers receiving 458 citations

Peers

Edward P. Wilcox

EEE

CNC

RADIA

Armen V. Sogoyan Russia

H.S. Kim United States

A.Y. Nikiforov Russia

S. M. Guertin United States

Martha V. O'Bryan United States

Ali Zadeh Netherlands

Megan C. Casey United States

C.I. Lee United States

В.С. Першенков Russia

Andrey V. Yanenko Russia

Armen V. Sogoyan Russia

Edward P. Wilcox

343 ×0.7

EEE

73 ×1.4

33 ×1.0

CNC

21 ×0.8

RADIA

11 ×0.4

Citations per year, relative to Edward P. Wilcox Edward P. Wilcox (= 1×) peers Armen V. Sogoyan

Countries citing papers authored by Edward P. Wilcox

Since Specialization

Citations

This map shows the geographic impact of Edward P. Wilcox's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Edward P. Wilcox with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Edward P. Wilcox more than expected).

Fields of papers citing papers by Edward P. Wilcox

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Edward P. Wilcox. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Edward P. Wilcox. The network helps show where Edward P. Wilcox may publish in the future.

Co-authorship network of co-authors of Edward P. Wilcox

This figure shows the co-authorship network connecting the top 25 collaborators of Edward P. Wilcox. A scholar is included among the top collaborators of Edward P. Wilcox based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Edward P. Wilcox. Edward P. Wilcox is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

O'Bryan, Martha V., Edward P. Wilcox, Megan C. Casey, et al.. (2024). Compendium of NASA Goddard Space Flight Center's Recent Radiation Effects Test Results. 1–9.

Wilcox, Edward P., et al.. (2023). Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories. 1–6. 4 indexed citations

O'Bryan, Martha V., Edward P. Wilcox, Melanie D. Berg, et al.. (2022). NASA Goddard Space Flight Center’s Recent Radiation Effects Test Results. 1–7. 2 indexed citations

LaBel, Kenneth A., Jonathan A. Pellish, Martha V. O'Bryan, et al.. (2019). NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results. 1–10. 8 indexed citations

Wilcox, Edward P. & Michael J. Campola. (2019). A TID and SEE Characterization of Multi-Terabit COTS 3D NAND Flash. 1–7. 16 indexed citations

O'Bryan, Martha V., Kenneth A. LaBel, Edward P. Wilcox, et al.. (2017). Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program. NASA STI Repository (National Aeronautics and Space Administration). 1–9. 6 indexed citations

Casey, Megan C., Jean‐Marie Lauenstein, Michael J. Campola, et al.. (2017). Destructive Single-Event Effects in Diodes. NASA Technical Reports Server (NASA). 1 indexed citations

Chen, Dakai, Edward P. Wilcox, Raymond L. Ladbury, et al.. (2017). Evaluation of the Radiation Susceptibility of a 3D NAND Flash Memory. NASA STI Repository (National Aeronautics and Space Administration). 2 indexed citations

Chen, Dakai, Edward P. Wilcox, Melanie D. Berg, et al.. (2015). Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM. IEEE Transactions on Nuclear Science. 62(6). 2703–2708. 12 indexed citations

10.

Lauenstein, Jean‐Marie, et al.. (2015). Silicon Carbide Power Device Performance Under Heavy-Ion Irradiation. NASA Technical Reports Server (NASA). 22 indexed citations

11.

Campola, Michael J., Dakai Chen, Kenneth A. LaBel, et al.. (2015). Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA. NASA STI Repository (National Aeronautics and Space Administration). 1–9. 3 indexed citations

12.

Casey, Megan C., Jean‐Marie Lauenstein, Edward P. Wilcox, et al.. (2014). Destructive Single-Event Failures in Schottky Diodes. NASA Technical Reports Server (NASA). 3 indexed citations

13.

Fleetwood, Zachary E., Adilson S. Cardoso, Ickhyun Song, et al.. (2014). Evaluation of Enhanced Low Dose Rate Sensitivity in Fourth-Generation SiGe HBTs. IEEE Transactions on Nuclear Science. 61(6). 2915–2922. 14 indexed citations

14.

Lauenstein, Jean‐Marie, Megan C. Casey, Edward P. Wilcox, et al.. (2013). Recent Radiation Test Results for Power MOSFETs. NASA STI Repository (National Aeronautics and Space Administration). 1–6. 8 indexed citations

15.

Ladbury, Ray, Melanie D. Berg, Edward P. Wilcox, et al.. (2013). Use of Commercial FPGA-Based Evaluation Boards for Single-Event Testing of DDR2 and DDR3 SDRAMs. IEEE Transactions on Nuclear Science. 60(6). 4457–4463. 8 indexed citations

16.

Casey, Megan C., Jean‐Marie Lauenstein, Edward P. Wilcox, et al.. (2013). Destructive Single-Event Failures in Diodes. NASA STI Repository (National Aeronautics and Space Administration). 1 indexed citations

17.

Chen, Dakai, Jonathan A. Pellish, Raymond L. Ladbury, et al.. (2012). Compendium of Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA. NASA STI Repository (National Aeronautics and Space Administration). 1–9. 7 indexed citations

18.

Wilcox, Edward P., Peng Cheng, Tushar Thrivikraman, et al.. (2010). Single Event Transient Hardness of a New Complementary (npn <formula formulatype="inline"><tex Notation="TeX">$+$</tex></formula> pnp) SiGe HBT Technology on Thick-Film SOI. IEEE Transactions on Nuclear Science. 11 indexed citations

19.

Moen, Kurt A., Edward P. Wilcox, John D. Cressler, et al.. (2010). Evaluating the Influence of Various Body-Contacting Schemes on Single Event Transients in 45-nm SOI CMOS. IEEE Transactions on Nuclear Science. 12 indexed citations

20.

Wilcox, Edward P., et al.. (1983). The Maryland bridge: is it here to stay?. PubMed. 58(5). 16, 18–9. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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