Shi-Jie Wen
- Electrical and Electronic Engineering top 2%
- Hardware and Architecture top 0.5%
- Materials Chemistry
- Polymers and Plastics top 10%
- Computer Networks and Communications top 10%
- Co-authors
- Richard WongSanghyeon BaegB. L. BhuvaS. JagannathanL. W. MassengillRick WongN. N. MahatmeT. D. Loveless
- Topics
- Radiation Effects in Electronics (87 papers)Semiconductor materials and devices (54 papers)VLSI and Analog Circuit Testing (53 papers)
- Journals
- Journal of Applied PhysicsIEEE Transactions on Pattern Analysis and Machine IntelligenceIEEE Access
- Partner nations
- United StatesChinaCanada
In The Last Decade
Shi-Jie Wen
137 papers receiving 2.1k citations
Peers
Comparison fields: 5 of 72
- Electrical and Electronic Engineering 1.9k
- Hardware and Architecture 864
- Materials Chemistry 173
- Polymers and Plastics 170
- Computer Networks and Communications 147
Countries citing papers authored by Shi-Jie Wen
This map shows the geographic impact of Shi-Jie Wen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shi-Jie Wen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shi-Jie Wen more than expected).
Fields of papers citing papers by Shi-Jie Wen
This network shows the impact of papers produced by Shi-Jie Wen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shi-Jie Wen. The network helps show where Shi-Jie Wen may publish in the future.
Co-authorship network of co-authors of Shi-Jie Wen
This figure shows the co-authorship network connecting the top 25 collaborators of Shi-Jie Wen. A scholar is included among the top collaborators of Shi-Jie Wen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shi-Jie Wen. Shi-Jie Wen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 0 | |
| 4 | 2 | |
| 5 | 0 | |
| 6 | 3 | |
| 7 | 5 | |
| 8 | 1 | |
| 9 | 1 | |
| 10 | 0 | |
| 11 | 0 | |
| 12 | 1 | |
| 13 | 14 | |
| 14 | 18 | |
| 15 | Electromigration-Induced Bit-Error-Rate Degradation of Interconnect Signal Paths Characterized from a 16nm Test Chip | 3 |
| 16 | 4 | |
| 17 | 34 | |
| 18 | 22 | |
| 19 | 18 | |
| 20 | 2 |
About Shi-Jie Wen
Shi-Jie Wen is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Polymers and Plastics, having authored 148 papers that have together received 2.2k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (87 papers), Semiconductor materials and devices (54 papers) and VLSI and Analog Circuit Testing (53 papers). The work is most often cited by research in Hardware and Architecture (864 citations), Electrical and Electronic Engineering (1.9k citations) and Polymers and Plastics (170 citations). Shi-Jie Wen has collaborated with scholars based in United States, China and Canada. Frequent co-authors include Richard Wong, Sanghyeon Baeg, B. L. Bhuva, S. Jagannathan, L. W. Massengill, Rick Wong, N. N. Mahatme, T. D. Loveless, Rita Fung and Q. Yang. Their work appears in journals such as Journal of Applied Physics, IEEE Transactions on Pattern Analysis and Machine Intelligence and IEEE Access.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.