N. J. Gaspard
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture top 2%
- Safety, Risk, Reliability and Quality
- Computer Networks and Communications
- Artificial Intelligence
- Co-authors
- B. L. BhuvaL. W. MassengillT. D. LovelessS. JagannathanRichard WongShi-Jie WenW.T. HolmanN. N. Mahatme
- Topics
- Radiation Effects in Electronics (32 papers)VLSI and Analog Circuit Testing (22 papers)Semiconductor materials and devices (16 papers)
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringSafety, Risk, Reliability and Quality
- Journals
- IEEE Transactions on Nuclear ScienceJournal of Electronic TestingExplore Bristol Research
- Partner nations
- United StatesChinaIsrael
In The Last Decade
N. J. Gaspard
33 papers receiving 605 citations
Peers
Comparison fields: 5 of 26
- Electrical and Electronic Engineering 625
- Hardware and Architecture 349
- Safety, Risk, Reliability and Quality 23
- Computer Networks and Communications 16
- Artificial Intelligence 15
Countries citing papers authored by N. J. Gaspard
This map shows the geographic impact of N. J. Gaspard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. J. Gaspard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. J. Gaspard more than expected).
Fields of papers citing papers by N. J. Gaspard
This network shows the impact of papers produced by N. J. Gaspard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. J. Gaspard. The network helps show where N. J. Gaspard may publish in the future.
Co-authorship network of co-authors of N. J. Gaspard
This figure shows the co-authorship network connecting the top 25 collaborators of N. J. Gaspard. A scholar is included among the top collaborators of N. J. Gaspard based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. J. Gaspard. N. J. Gaspard is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 5 | |
| 3 | 12 | |
| 4 | 35 | |
| 5 | 18 | |
| 6 | 7 | |
| 7 | 34 | |
| 8 | 20 | |
| 9 | 6 | |
| 10 | 20 | |
| 11 | 13 | |
| 12 | 39 | |
| 13 | 49 | |
| 14 | 38 | |
| 15 | 14 | |
| 16 | 28 | |
| 17 | 20 | |
| 18 | 47 | |
| 19 | 11 | |
| 20 | 16 |
About N. J. Gaspard
N. J. Gaspard is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Safety, Risk, Reliability and Quality, having authored 33 papers that have together received 633 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (32 papers), VLSI and Analog Circuit Testing (22 papers) and Semiconductor materials and devices (16 papers). The work is most often cited by research in Hardware and Architecture (349 citations), Electrical and Electronic Engineering (625 citations) and Safety, Risk, Reliability and Quality (23 citations). N. J. Gaspard has collaborated with scholars based in United States, China and Israel. Frequent co-authors include B. L. Bhuva, L. W. Massengill, T. D. Loveless, S. Jagannathan, Richard Wong, Shi-Jie Wen, W.T. Holman, N. N. Mahatme, Arthur F. Witulski and N. M. Atkinson. Their work appears in journals such as IEEE Transactions on Nuclear Science, Journal of Electronic Testing and Explore Bristol Research.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.