P.E. Dodd
- Hardware and Architecture top 0.2%
- VLSI and Analog Circuit Testing 18
-
- Radiation Effects in Electronics 97
- Semiconductor materials and devices 96
- Integrated Circuits and Semiconductor Failure Analysis 75
- Advancements in Semiconductor Devices and Circuit Design 44
- Advanced Memory and Neural Computing 16
- Electrostatic Discharge in Electronics 10
- Radiation top 1%
-
- Semiconductor Quantum Structures and Devices 10
- Co-authors
- M.R. ShaneyfeltJ.R. SchwankL. W. MassengillF.W. SextonPhilippe PailletJ. FélixDaniel M. FleetwoodJames R. Schwank
- Journals
- IEEE Transactions on Nuclear Science (95 papers)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (5 papers)IEEE Transactions on Electron Devices (3 papers)
- Partner nations
- United StatesFranceCanada
In The Last Decade
P.E. Dodd
150 papers receiving 6.9k citations
Hit Papers
Peers
Comparison fields: 5 of 70
- Hardware and Architecture 1.9k
- Electrical and Electronic Engineering 7.1k
- Radiation 443
- Nuclear and High Energy Physics 318
- Safety, Risk, Reliability and Quality 152
Countries citing papers authored by P.E. Dodd
This map shows the geographic impact of P.E. Dodd's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P.E. Dodd with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P.E. Dodd more than expected).
Fields of papers citing papers by P.E. Dodd
This network shows the impact of papers produced by P.E. Dodd. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P.E. Dodd. The network helps show where P.E. Dodd may publish in the future.
Co-authorship network
The 25 scholars most cited alongside P.E. Dodd, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 1 | |
| 2 | 2020 | 4 | |
| 3 | 2018 | 4 | |
| 4 | 2012 | 4 | |
| 5 | 2010 | 269 | |
| 6 | SQUEEZE CAST AUTOMOTIVE APPLICATIONS AND DESIGN CONSIDERATIONS | 2009 | 1 |
| 7 | 2008 | 6 | |
| 8 | Power MOSFET Degradation in Space Radiation Environments. | 2007 | 2 |
| 9 | 2006 | 17 | |
| 10 | 3-D Device Simulation | 2003 | 1 |
| 11 | 2003 | 57 | |
| 12 | 2003 | 53 | |
| 13 | 2003 | 15 | |
| 14 | 2002 | 44 | |
| 15 | 2000 | 52 | |
| 16 | Single-event upset and snapback in silicon-on-insulator devices | 2000 | 3 |
| 17 | 1997 | 42 | |
| 18 | 1994 | 93 | |
| 19 | Studies of Heterojunction Bipolar Transistor Device Physics and New Device Concepts | 1993 | 1 |
| 20 | 1989 | 1 |
About P.E. Dodd
P.E. Dodd is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Chemical Health and Safety, Radiation and Nuclear and High Energy Physics, having authored 154 papers that have together received 7.3k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (97 papers), Semiconductor materials and devices (96 papers), Integrated Circuits and Semiconductor Failure Analysis (75 papers), Advancements in Semiconductor Devices and Circuit Design (44 papers), VLSI and Analog Circuit Testing (18 papers), Advanced Memory and Neural Computing (16 papers), Semiconductor Quantum Structures and Devices (10 papers) and Electrostatic Discharge in Electronics (10 papers). The work is most often cited by research in Hardware and Architecture (1.9k citations), Electrical and Electronic Engineering (7.1k citations), Radiation (443 citations), Nuclear and High Energy Physics (318 citations) and Safety, Risk, Reliability and Quality (152 citations). P.E. Dodd has collaborated with scholars based in United States, France and Canada. Frequent co-authors include M.R. Shaneyfelt, J.R. Schwank, L. W. Massengill, F.W. Sexton, Philippe Paillet, J. Félix, Daniel M. Fleetwood, James R. Schwank, G.L. Hash and James A. Felix. Their work appears in journals such as IEEE Transactions on Nuclear Science, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, IEEE Transactions on Electron Devices, IEEE Electron Device Letters and Electronics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.