G. Guégan
-
- Semiconductor materials and devices 57
- Advancements in Semiconductor Devices and Circuit Design 56
- Integrated Circuits and Semiconductor Failure Analysis 22
- Ferroelectric and Negative Capacitance Devices 8
- Silicon Carbide Semiconductor Technologies 6
- Electrostatic Discharge in Electronics 5
- Advancements in Photolithography Techniques 3
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- Quantum and electron transport phenomena 8
- Co-authors
- S. DeleonibusG. GhibaudoT. BoutchachaM. SanquerAndrea CesterG. GhidiniA. PaccagnellaC. Raynaud
- Cited by
- Electrical and Electronic EngineeringStructural BiologyAtomic and Molecular Physics, and Optics
- Journals
- Solid-State Electronics (10 papers)Microelectronics Reliability (6 papers)IEEE Electron Device Letters (3 papers)
- Partner nations
- FranceSwitzerlandCzechia
In The Last Decade
G. Guégan
61 papers receiving 446 citations
Peers
Comparison fields: 5 of 32
- Electrical and Electronic Engineering 444
- Structural Biology 9
- Atomic and Molecular Physics, and Optics 95
- Surfaces, Coatings and Films 8
- Biomedical Engineering 49
Countries citing papers authored by G. Guégan
This map shows the geographic impact of G. Guégan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Guégan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Guégan more than expected).
Fields of papers citing papers by G. Guégan
This network shows the impact of papers produced by G. Guégan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Guégan. The network helps show where G. Guégan may publish in the future.
Co-authorship network
The 25 scholars most cited alongside G. Guégan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 6 | |
| 2 | 2009 | 3 | |
| 3 | 2008 | 4 | |
| 4 | 2004 | 25 | |
| 5 | 2002 | 2 | |
| 6 | 2002 | 7 | |
| 7 | 2001 | 5 | |
| 8 | 2001 | 6 | |
| 9 | 2000 | 24 | |
| 10 | 2000 | 8 | |
| 11 | 2000 | 36 | |
| 12 | 1999 | 16 | |
| 13 | 1998 | 7 | |
| 14 | 1997 | 3 | |
| 15 | Analysis and Modeling of Low Frequency Noise in Extremely Deep Submicron Silicon CMOS Devices | 1993 | 2 |
| 16 | Process and Design Considerations for Latch-Up Optimization on Deep Sub-Micron CMOS Technology | 1993 | 1 |
| 17 | A 16×16 bits Multiplier in 0.5μm CMOS technology | 1991 | 1 |
| 18 | 1988 | 1 | |
| 19 | 1988 | 1 | |
| 20 | 1979 | 0 |
About G. Guégan
G. Guégan is a scholar working on Electrical and Electronic Engineering, Structural Biology, Atomic and Molecular Physics, and Optics, Hardware and Architecture and Industrial and Manufacturing Engineering, having authored 67 papers that have together received 468 indexed citations. Recurring topics across this work include Semiconductor materials and devices (57 papers), Advancements in Semiconductor Devices and Circuit Design (56 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers), Ferroelectric and Negative Capacitance Devices (8 papers), Quantum and electron transport phenomena (8 papers), Silicon Carbide Semiconductor Technologies (6 papers), Electrostatic Discharge in Electronics (5 papers) and Advancements in Photolithography Techniques (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (444 citations), Structural Biology (9 citations), Atomic and Molecular Physics, and Optics (95 citations), Surfaces, Coatings and Films (8 citations) and Biomedical Engineering (49 citations). G. Guégan has collaborated with scholars based in France, Switzerland and Czechia. Frequent co-authors include S. Deleonibus, G. Ghibaudo, T. Boutchacha, M. Sanquer, Andrea Cester, G. Ghidini, A. Paccagnella, C. Raynaud, J. Gautier and F. Balestra. Their work appears in journals such as Solid-State Electronics, Microelectronics Reliability, IEEE Electron Device Letters, Microelectronic Engineering and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.