G. Ghidini
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Memory and Neural Computing
- Radiation Effects in Electronics
- Ferroelectric and Negative Capacitance Devices
- Materials Chemistry top 10%
- Electronic and Structural Properties of Oxides
Papers in
-
- Semiconductor materials and devices 126
- Advancements in Semiconductor Devices and Circuit Design 75
- Integrated Circuits and Semiconductor Failure Analysis 41
- Advanced Memory and Neural Computing 33
- Ferroelectric and Negative Capacitance Devices 10
-
- Electronic and Structural Properties of Oxides 32
- Co-authors
- A. PaccagnellaF. W. SmithAndrea CesterM. CeschiaA. ScarpaG. GhibaudoLuca LarcherG. Pananakakis
- Journals
- Microelectronics Reliability (23 papers)IEEE Transactions on Nuclear Science (18 papers)Microelectronic Engineering (11 papers)Solid-State Electronics (9 papers)IEEE Transactions on Electron Devices (6 papers)
- Partner nations
- ItalySwitzerlandUnited States
In The Last Decade
G. Ghidini
122 papers receiving 1.8k citations
Peers
Comparison fields: 5 of 49
- Electrical and Electronic Engineering 1.8k
- Materials Chemistry 406
- Computational Mechanics 140
- Structural Biology 9
- Atomic and Molecular Physics, and Optics 176
Countries citing papers authored by G. Ghidini
This map shows the geographic impact of G. Ghidini's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Ghidini with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Ghidini more than expected).
Fields of papers citing papers by G. Ghidini
This network shows the impact of papers produced by G. Ghidini. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Ghidini. The network helps show where G. Ghidini may publish in the future.
Co-authors
The 25 scholars most cited alongside G. Ghidini, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 2 | |
| 2 | Charge retention phenomena in charge transfer silicon nitride: impact of technology and operating conditions | 2011 | 0 |
| 3 | 2011 | 1 | |
| 4 | 2009 | 0 | |
| 5 | 2009 | 8 | |
| 6 | 2009 | 9 | |
| 7 | 2009 | 3 | |
| 8 | 2007 | 5 | |
| 9 | 2004 | 3 | |
| 10 | 2003 | 7 | |
| 11 | 2001 | 1 | |
| 12 | 2001 | 38 | |
| 13 | Time stability of Stress Induced Leakage Current in thin gate oxides | 1999 | 1 |
| 14 | 1999 | 21 | |
| 15 | Impact of constant current stressing procedure on Stress Induced Leakage current generation in thin oxides | 1998 | 0 |
| 16 | 1998 | 7 | |
| 17 | 1997 | 7 | |
| 18 | 1997 | 6 | |
| 19 | 1997 | 3 | |
| 20 | 1986 | 7 |
About G. Ghidini
G. Ghidini is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Computational Mechanics, Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics, having authored 127 papers that have together received 1.8k indexed citations. Recurring topics across this work include Semiconductor materials and devices (126 papers), Advancements in Semiconductor Devices and Circuit Design (75 papers), Integrated Circuits and Semiconductor Failure Analysis (41 papers), Advanced Memory and Neural Computing (33 papers), Electronic and Structural Properties of Oxides (32 papers), Ferroelectric and Negative Capacitance Devices (10 papers), Ion-surface interactions and analysis (8 papers) and Copper Interconnects and Reliability (7 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.8k citations), Materials Chemistry (406 citations), Computational Mechanics (140 citations), Structural Biology (9 citations) and Atomic and Molecular Physics, and Optics (176 citations). G. Ghidini has collaborated with scholars based in Italy, Switzerland and United States. Frequent co-authors include A. Paccagnella, F. W. Smith, Andrea Cester, M. Ceschia, A. Scarpa, G. Ghibaudo, Luca Larcher, G. Pananakakis, Andrea L. Lacaita and A. Candelori. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Nuclear Science, Microelectronic Engineering, Solid-State Electronics and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.