J. Brini
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- Semiconductor materials and devices 60
- Advancements in Semiconductor Devices and Circuit Design 52
- Thin-Film Transistor Technologies 35
- Integrated Circuits and Semiconductor Failure Analysis 20
- Silicon and Solar Cell Technologies 17
- Silicon Carbide Semiconductor Technologies 7
- Condensed Matter Physics top 10%
- Materials Chemistry top 10%
- Silicon Nanostructures and Photoluminescence 16
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- Semiconductor materials and interfaces 10
- Biomedical Engineering top 10%
J. Brini
86 papers receiving 2.3k citations
Hit Papers
Peers
Comparison fields: 5 of 43
- Electrical and Electronic Engineering 2.4k
- Condensed Matter Physics 123
- Materials Chemistry 409
- Atomic and Molecular Physics, and Optics 242
- Biomedical Engineering 280
Countries citing papers authored by J. Brini
This map shows the geographic impact of J. Brini's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Brini with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Brini more than expected).
Fields of papers citing papers by J. Brini
This network shows the impact of papers produced by J. Brini. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Brini. The network helps show where J. Brini may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J. Brini, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Espace, nodalité, phobie | 2013 | 1 |
| 2 | Lecture, écriture et ordinateur | 2010 | 1 |
| 3 | Simple model for 1/f noise in polycrystalline silicon thin-film transistors | 2003 | 0 |
| 4 | 2002 | 23 | |
| 5 | Low frequency noise in HEMT structure | 2001 | 5 |
| 6 | 2000 | 5 | |
| 7 | 2000 | 1 | |
| 8 | 1999 | 5 | |
| 9 | 1999 | 25 | |
| 10 | Impact of constant current stressing procedure on Stress Induced Leakage current generation in thin oxides | 1998 | 0 |
| 11 | 1997 | 7 | |
| 12 | 1997 | 62 | |
| 13 | 1994 | 3 | |
| 14 | Low-Frequency Noise Sources in Polysilicon Emiter Bipolar Transistors: Influence of Hot-Electron-Induced Degradation and Post-Stress Recovery | 1993 | 2 |
| 15 | Analysis and Modeling of Low Frequency Noise in Extremely Deep Submicron Silicon CMOS Devices | 1993 | 2 |
| 16 | 1993 | 1 | |
| 17 | 1992 | 62 | |
| 18 | 1992 | 1 | |
| 19 | Volume Inversion in SOI MOSFETs with Double Gate Control: A New Transistor Operation with Greatly Enhanced Performance | 1987 | 1 |
| 20 | 1985 | 23 |
About J. Brini
J. Brini is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 90 papers that have together received 2.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (60 papers), Advancements in Semiconductor Devices and Circuit Design (52 papers), Thin-Film Transistor Technologies (35 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers), Silicon and Solar Cell Technologies (17 papers), Silicon Nanostructures and Photoluminescence (16 papers), Semiconductor materials and interfaces (10 papers) and Silicon Carbide Semiconductor Technologies (7 papers). The work is most often cited by research in Electrical and Electronic Engineering (2.4k citations), Condensed Matter Physics (123 citations) and Materials Chemistry (409 citations). J. Brini has collaborated with scholars based in France, Greece and Bulgaria. Frequent co-authors include F. Balestra, G. Ghibaudo, C.A. Dimitriadis, G. Kamarinos, M. Benachir, S. Cristoloveanu, T. Elewa, Filippos Farmakis, Constantinos T. Angelis and M Miyasaka. Their work appears in journals such as Solid-State Electronics, Journal of Applied Physics, Applied Physics Letters, IEEE Electron Device Letters and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.