S. Haendler
Impact in
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- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Silicon Carbide Semiconductor Technologies
- Radio Frequency Integrated Circuit Design
- Electrostatic Discharge in Electronics
- Ferroelectric and Negative Capacitance Devices
- Hardware and Architecture top 10%
Papers in
-
- Advancements in Semiconductor Devices and Circuit Design 55
- Semiconductor materials and devices 48
- Integrated Circuits and Semiconductor Failure Analysis 22
- Low-power high-performance VLSI design 17
- Silicon Carbide Semiconductor Technologies 9
- Electrostatic Discharge in Electronics 6
- Radio Frequency Integrated Circuit Design 3
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- VLSI and Analog Circuit Testing 4
- Co-authors
- G. GhibaudoC.A. DimitriadisE.G. IoannidisJ. JomaahChristoforos TheodorouF. BalestraN. PlanesT.A. Karatsori
In The Last Decade
S. Haendler
59 papers receiving 558 citations
Peers
Comparison fields: 5 of 27
- Electrical and Electronic Engineering 590
- Hardware and Architecture 31
- Atomic and Molecular Physics, and Optics 43
- Biomedical Engineering 56
- Condensed Matter Physics 13
Countries citing papers authored by S. Haendler
This map shows the geographic impact of S. Haendler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Haendler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Haendler more than expected).
Fields of papers citing papers by S. Haendler
This network shows the impact of papers produced by S. Haendler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Haendler. The network helps show where S. Haendler may publish in the future.
Co-authorship network
The 25 scholars most cited alongside S. Haendler, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 2 | |
| 2 | 2023 | 1 | |
| 3 | 2021 | 0 | |
| 4 | 2017 | 10 | |
| 5 | 2016 | 8 | |
| 6 | 2015 | 1 | |
| 7 | 2015 | 35 | |
| 8 | 2014 | 14 | |
| 9 | 2013 | 7 | |
| 10 | FDSOI process/design full solutions for ultra low leakage, high speed and low voltage SRAMs | 2013 | 32 |
| 11 | 2013 | 6 | |
| 12 | 2012 | 47 | |
| 13 | 2011 | 3 | |
| 14 | 2009 | 3 | |
| 15 | 2008 | 3 | |
| 16 | 2004 | 12 | |
| 17 | 2003 | 10 | |
| 18 | 2002 | 3 | |
| 19 | 2001 | 12 | |
| 20 | 2000 | 10 |
About S. Haendler
S. Haendler is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Industrial and Manufacturing Engineering, Condensed Matter Physics and Biomedical Engineering, having authored 62 papers that have together received 599 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (55 papers), Semiconductor materials and devices (48 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers), Low-power high-performance VLSI design (17 papers), Silicon Carbide Semiconductor Technologies (9 papers), Electrostatic Discharge in Electronics (6 papers), VLSI and Analog Circuit Testing (4 papers) and Radio Frequency Integrated Circuit Design (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (590 citations), Hardware and Architecture (31 citations), Atomic and Molecular Physics, and Optics (43 citations), Biomedical Engineering (56 citations) and Condensed Matter Physics (13 citations). S. Haendler has collaborated with scholars based in France, Greece and India. Frequent co-authors include G. Ghibaudo, C.A. Dimitriadis, E.G. Ioannidis, J. Jomaah, Christoforos Theodorou, F. Balestra, N. Planes, T.A. Karatsori, F. Arnaud and E. Josse. Their work appears in journals such as Solid-State Electronics, IEEE Transactions on Electron Devices, Microelectronics Reliability, Electronics Letters and Japanese Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.