K. Bernstein

2.6k total citations · 2 hit papers
22 papers, 1.9k citations indexed

About

K. Bernstein is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, K. Bernstein has authored 22 papers receiving a total of 1.9k indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 3 papers in Biomedical Engineering and 2 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in K. Bernstein's work include Advancements in Semiconductor Devices and Circuit Design (19 papers), Semiconductor materials and devices (16 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). K. Bernstein is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (19 papers), Semiconductor materials and devices (16 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). K. Bernstein collaborates with scholars based in United States, Germany and Spain. K. Bernstein's co-authors include E. Nowak, D.J. Frank, Wilfried Haensch, Norman J. Rohrer, Ruchir Puri, M. Ieong, K.W. Guarini, Amitesh Kumar, Douglas Charles La Tulipe and S.E. Steen and has published in prestigious journals such as IEEE Electron Device Letters, IBM Journal of Research and Development and Microelectronics Reliability.

In The Last Decade

K. Bernstein

20 papers receiving 1.8k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Three-dimensional integrated circuits

2006 501 citations Anna W. Topol, Douglas Charles La Tulipe et al. IBM Journal of Research and Development profile →
High-performance CMOS variability in the 65-nm regime and beyond

2006 390 citations K. Bernstein, D.J. Frank et al. IBM Journal of Research and Development profile →

Peers

Countries citing papers authored by K. Bernstein

Since Specialization

Citations

This map shows the geographic impact of K. Bernstein's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Bernstein with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Bernstein more than expected).

Fields of papers citing papers by K. Bernstein

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Bernstein. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Bernstein. The network helps show where K. Bernstein may publish in the future.

Co-authorship network of co-authors of K. Bernstein

This figure shows the co-authorship network connecting the top 25 collaborators of K. Bernstein. A scholar is included among the top collaborators of K. Bernstein based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Bernstein. K. Bernstein is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	Challenges for post-CMOS devices & architectures 2011 ·(unknown), K. Bernstein	2
2	Thermomechanical modeling of 3D electronic packages 2008 ·IBM Journal of Research and Development ·Sri M. Sri-Jayantha, Gerard McVicker, K. Bernstein, John Knickerbocker	51
3	Ultralow-voltage, minimum-energy CMOS 2006 ·IBM Journal of Research and Development ·Scott Hanson, Bin Zhai, K. Bernstein, David Blaauw, A. Bryant, L. Chang, Koushik K. Das, Wilfried Haensch, E. Nowak, Dennis Sylvester	155
4	Dependability Analysis of Nano-scale FinFET circuits 2006 ·Rare & Special e-Zone (The Hong Kong University of Science and Technology) ·Feng Wang, Yuan Xie, K. Bernstein, (unknown)	42
5	Scaling, power, and the future of CMOS 2006 ·Mark Horowitz, E. Alon, Dinesh Patil, Samuel Naffziger, Ranjeet Kumar, K. Bernstein	201
6	Three-dimensional integrated circuits breakdown → 2006 ·IBM Journal of Research and Development ·Anna W. Topol, Douglas Charles La Tulipe, Liang Shi, D.J. Frank, K. Bernstein, S.E. Steen, Amitesh Kumar, G. Singco, Anthony Young, K.W. Guarini, M. Ieong	501
7	Nanometer-scale CMOS devices 2005 ·K. Bernstein	2
8	Analysis and design of digital CMOS circuits in hybrid SOI-epitaxial technology with different crystal orientations 2005 ·(unknown), S.-H. Lo, C.T. Chuang, K. Bernstein, R. Williams	1
9	Turning silicon on its edge 2004 ·IEEE Circuits and Devices Magazine ·E. Nowak, I. Aller, Thomas Ludwig, Keunwoo Kim, (unknown), Ching-Te Chuang, K. Bernstein, Ruchir Puri	303
10	Three dimensional CMOS devices and integrated circuits 2004 ·M. Ieong, K.W. Guarini, V. Chan, K. Bernstein, (unknown), J. Kedzierski, Wilfried Haensch	19
11	Soft error rate scaling for emerging SOI technology options 2003 ·P. Oldiges, K. Bernstein, David F. Heidel, (unknown), Ethan H. Cannon, R.H. Dennard, Haotian Tang, M. Ieong, H.‐S. Philip Wong	22
12	All electronic defect inspection, management, and reporting system 2003 ·T. White, (unknown), (unknown), Janet Lin, (unknown), (unknown), (unknown), (unknown), (unknown), K. Bernstein, (unknown), (unknown)	0
13	Design and CAD challenges in sub-90nm CMOS technologies 2003 ·K. Bernstein, Ching-Te Chuang, (unknown), Ruchir Puri	36
14	CMOS circuit technology for sub-ambient temperature operation 2002 ·I. Aller, K. Bernstein, U. Ghoshal, (unknown), S.E. Schuster, Yuan Taur, (unknown)	12
15	SOI Circuit Design Concepts 2002 ·K. Bernstein, Norman J. Rohrer	37
16	Analysis of the effect of the gate oxide breakdown on SRAM stability 2002 ·Microelectronics Reliability ·R. Rodrı́guez, J. H. Stathis, B.P. Linder, S. P. Kowalczyk, C.T. Chuang, (unknown), (unknown), K. Bernstein, A.J. Bhavnagarwala, S. Lombardo	3
17	Experimental 2.0 V power/performance optimization of a 3.6 V-design CMOS microprocessor-PowerPC 601 2002 ·(unknown), K. Bernstein, L.G. Heller, E. Nowak, F. White	1
18	The impact of gate-oxide breakdown on SRAM stability 2002 ·IEEE Electron Device Letters ·R. Rodrı́guez, J. H. Stathis, B.P. Linder, S. P. Kowalczyk, C.T. Chuang, (unknown), (unknown), K. Bernstein, A.J. Bhavnagarwala, S. Lombardo	98
19	Effects of Gate-to-Body Tunneling Current on PD/SOI CMOS Circuits 2001 ·(unknown), Ruchir Puri, K. Bernstein	5
20	SOI CMOS circuit design exposed — Another dirty tricks campaign? 2000 ·(unknown), K. Bernstein	5

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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