Bappaditya Dey
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering top 5%
- Artificial Intelligence
- Computer Vision and Pattern Recognition
- Surfaces, Coatings and Films top 10%
- Co-authors
- Sandip HalderMagdy BayoumiKasem KhalilAshok KumarStefan De GendtPhilippe LerayWannes MeertOmar Eldash
- Topics
- Industrial Vision Systems and Defect Detection (24 papers)Advancements in Photolithography Techniques (21 papers)Integrated Circuits and Semiconductor Failure Analysis (21 papers)
- Cited by
- Industrial and Manufacturing EngineeringSurfaces, Coatings and FilmsHardware and Architecture
- Partner nations
- BelgiumUnited StatesEgypt
In The Last Decade
Bappaditya Dey
44 papers receiving 228 citations
Peers
Comparison fields: 5 of 41
- Electrical and Electronic Engineering 135
- Industrial and Manufacturing Engineering 81
- Artificial Intelligence 55
- Computer Vision and Pattern Recognition 45
- Surfaces, Coatings and Films 43
Countries citing papers authored by Bappaditya Dey
This map shows the geographic impact of Bappaditya Dey's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bappaditya Dey with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bappaditya Dey more than expected).
Fields of papers citing papers by Bappaditya Dey
This network shows the impact of papers produced by Bappaditya Dey. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bappaditya Dey. The network helps show where Bappaditya Dey may publish in the future.
Co-authorship network of co-authors of Bappaditya Dey
This figure shows the co-authorship network connecting the top 25 collaborators of Bappaditya Dey. A scholar is included among the top collaborators of Bappaditya Dey based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Bappaditya Dey. Bappaditya Dey is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 8 | |
| 4 | 2 | |
| 5 | 1 | |
| 6 | 1 | |
| 7 | 0 | |
| 8 | 1 | |
| 9 | 5 | |
| 10 | 1 | |
| 11 | 1 | |
| 12 | 1 | |
| 13 | 16 | |
| 14 | 5 | |
| 15 | 31 | |
| 16 | 9 | |
| 17 | 3 | |
| 18 | 16 | |
| 19 | 9 | |
| 20 | 11 |
About Bappaditya Dey
Bappaditya Dey is a scholar working on Industrial and Manufacturing Engineering, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 48 papers that have together received 238 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (24 papers), Advancements in Photolithography Techniques (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (21 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (81 citations), Surfaces, Coatings and Films (43 citations) and Hardware and Architecture (24 citations). Bappaditya Dey has collaborated with scholars based in Belgium, United States and Egypt. Frequent co-authors include Sandip Halder, Magdy Bayoumi, Kasem Khalil, Ashok Kumar, Stefan De Gendt, Philippe Leray, Wannes Meert, Omar Eldash, Gian F. Lorusso and Bartel Van Waeyenberge. Their work appears in journals such as IEEE Access, Japanese Journal of Applied Physics and IEEE Internet of Things Journal.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.