Denis Shamiryan
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- Copper Interconnects and Reliability 48
- Ceramics and Composites top 2%
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- Semiconductor materials and devices 76
- Advancements in Semiconductor Devices and Circuit Design 18
- Integrated Circuits and Semiconductor Failure Analysis 11
- Advancements in Photolithography Techniques 8
- Plasma Diagnostics and Applications 8
- Silicon and Solar Cell Technologies 7
- Mechanics of Materials top 1%
- Metal and Thin Film Mechanics 32
- Materials Chemistry top 5%
- Co-authors
- Karen MaexMikhaı̈l R. BaklanovZ. Sh. YanovitskayaSywert BrongersmaFrancesca IacopiThomas AbellAdam UrbanowiczS. Vanhaelemeersch
- Cited by
- Electronic, Optical and Magnetic MaterialsCeramics and CompositesElectrical and Electronic Engineering
- Journals
- Journal of Applied Physics (5 papers)Journal of The Electrochemical Society (4 papers)Materials Today (2 papers)
- Partner nations
- BelgiumUnited StatesRussia
In The Last Decade
Denis Shamiryan
85 papers receiving 3.2k citations
Hit Papers
Peers
Comparison fields: 5 of 71
- Electronic, Optical and Magnetic Materials 1.8k
- Ceramics and Composites 254
- Electrical and Electronic Engineering 2.4k
- Mechanics of Materials 992
- Materials Chemistry 1.1k
Countries citing papers authored by Denis Shamiryan
This map shows the geographic impact of Denis Shamiryan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Denis Shamiryan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Denis Shamiryan more than expected).
Fields of papers citing papers by Denis Shamiryan
This network shows the impact of papers produced by Denis Shamiryan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Denis Shamiryan. The network helps show where Denis Shamiryan may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Denis Shamiryan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 1 | |
| 2 | 2013 | 243 | |
| 3 | 2011 | 11 | |
| 4 | 2011 | 1 | |
| 5 | Mechanism of k-value Reduction of PECVD Low-k Films Treated with He/H2 Ash Plasma | 2010 | 2 |
| 6 | Fabrication of porogen residue free ultra low-k PECVD material by subsequent H2-afterglow plasma treatment and UV curing | 2010 | 1 |
| 7 | 2010 | 25 | |
| 8 | 2010 | 3 | |
| 9 | 2010 | 7 | |
| 10 | 2009 | 1 | |
| 11 | 2009 | 3 | |
| 12 | 2008 | 16 | |
| 13 | Influence of crystallographic orientation on etch properties of TiN | 2006 | 1 |
| 14 | 2005 | 3 | |
| 15 | 2004 | 319 | |
| 16 | 2002 | 3 | |
| 17 | 2002 | 1 | |
| 18 | Precursor penetration and sealing for CVD SiCOH low k dielectric during atomic layer deposition of WCN barrier | 2002 | 1 |
| 19 | 2001 | 6 | |
| 20 | 2001 | 81 |
About Denis Shamiryan
Denis Shamiryan is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Mechanics of Materials, having authored 94 papers that have together received 3.3k indexed citations. Recurring topics across this work include Semiconductor materials and devices (76 papers), Copper Interconnects and Reliability (48 papers), Metal and Thin Film Mechanics (32 papers), Advancements in Semiconductor Devices and Circuit Design (18 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Advancements in Photolithography Techniques (8 papers), Plasma Diagnostics and Applications (8 papers) and Silicon and Solar Cell Technologies (7 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (1.8k citations), Ceramics and Composites (254 citations) and Electrical and Electronic Engineering (2.4k citations). Denis Shamiryan has collaborated with scholars based in Belgium, United States and Russia. Frequent co-authors include Karen Maex, Mikhaı̈l R. Baklanov, Z. Sh. Yanovitskaya, Sywert Brongersma, Francesca Iacopi, Thomas Abell, Adam Urbanowicz, S. Vanhaelemeersch, Werner Boullart and Т. В. Рахимова. Their work appears in journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Materials Today.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.