Pascal Besson
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- 3D IC and TSV technologies
- Radiation Effects in Electronics
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing
Papers in
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- Semiconductor materials and devices 34
- 3D IC and TSV technologies 14
- Advancements in Semiconductor Devices and Circuit Design 11
- Advanced MEMS and NEMS Technologies 2
- CCD and CMOS Imaging Sensors 1
-
- Copper Interconnects and Reliability 5
- Co-authors
- F. Martín (8 shared papers)O. Renault (4 shared papers)Nicholas T. Barrett (3 shared papers)J.-F. Damlencourt (4 shared papers)Jean‐Michel Hartmann (18 shared papers)S. Marthon (1 shared paper)D. Blin (1 shared paper)Virginie Loup (19 shared papers)
- Journals
- Microelectronic Engineering (11 papers)Applied Surface Science (4 papers)Journal of Applied Physics (2 papers)Solid-State Electronics (2 papers)IEEE Electron Device Letters (2 papers)
- Partner nations
- FranceUnited StatesGermany
In The Last Decade
Pascal Besson
92 papers receiving 1.4k citations
Peers
Comparison fields: 5 of 26
- Electrical and Electronic Engineering 919
- Hardware and Architecture 33
- Surfaces, Coatings and Films 21
- Electronic, Optical and Magnetic Materials 45
- Condensed Matter Physics 29
Countries citing papers authored by Pascal Besson
This map shows the geographic impact of Pascal Besson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Pascal Besson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Pascal Besson more than expected).
Fields of papers citing papers by Pascal Besson
This network shows the impact of papers produced by Pascal Besson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Pascal Besson. The network helps show where Pascal Besson may publish in the future.
Co-authors
The 25 scholars most cited alongside Pascal Besson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 99 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 191 | |
| 2 | 2015 | 116 | |
| 3 | 2005 | 105 | |
| 4 | 2004 | 99 | |
| 5 | 2016 | 65 | |
| 6 | 2017 | 64 | |
| 7 | 2014 | 51 | |
| 8 | 2018 | 46 | |
| 9 | 2007 | 42 | |
| 10 | 2003 | 31 | |
| 11 | 2002 | 28 | |
| 12 | 2002 | 24 | |
| 13 | 2004 | 23 | |
| 14 | 2014 | 23 | |
| 15 | 2021 | 23 | |
| 16 | 2010 | 22 | |
| 17 | 2021 | 22 | |
| 18 | 2006 | 20 | |
| 19 | 2014 | 18 | |
| 20 | 2004 | 17 |
About Pascal Besson
Pascal Besson is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Condensed Matter Physics, Biophysics and Atomic and Molecular Physics, and Optics, having authored 99 papers that have together received 1.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (34 papers), 3D IC and TSV technologies (14 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers), Copper Interconnects and Reliability (5 papers), GaN-based semiconductor devices and materials (2 papers), Semiconductor materials and interfaces (2 papers), Advanced MEMS and NEMS Technologies (2 papers) and CCD and CMOS Imaging Sensors (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (919 citations), Hardware and Architecture (33 citations), Surfaces, Coatings and Films (21 citations), Electronic, Optical and Magnetic Materials (45 citations) and Condensed Matter Physics (29 citations). Pascal Besson has collaborated with scholars based in France, United States and Germany. Frequent co-authors include F. Martín, O. Renault, Nicholas T. Barrett, J.-F. Damlencourt, Jean‐Michel Hartmann, S. Marthon, D. Blin, Virginie Loup, N. Rochat and S. Deleonibus. Their work appears in journals such as Microelectronic Engineering, Applied Surface Science, Journal of Applied Physics, Solid-State Electronics and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.