S. Petitdidier

431 total citations
34 papers, 198 citations indexed

About

S. Petitdidier is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Biomedical Engineering. According to data from OpenAlex, S. Petitdidier has authored 34 papers receiving a total of 198 indexed citations (citations by other indexed papers that have themselves been cited), including 28 papers in Electrical and Electronic Engineering, 11 papers in Materials Chemistry and 8 papers in Biomedical Engineering. Recurrent topics in S. Petitdidier's work include Semiconductor materials and devices (22 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers) and GaN-based semiconductor devices and materials (7 papers). S. Petitdidier is often cited by papers focused on Semiconductor materials and devices (22 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers) and GaN-based semiconductor devices and materials (7 papers). S. Petitdidier collaborates with scholars based in France, India and Czechia. S. Petitdidier's co-authors include M. Chemla, Davide Levy, Valérie Bertagna, R. Erre, F. Rouelle, P. Besson, N. Rochat, B. Boudart, Y. Guhel and Christophe Gaquière and has published in prestigious journals such as Applied Physics Letters, Electrochimica Acta and Applied Surface Science.

In The Last Decade

S. Petitdidier

34 papers receiving 188 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. Petitdidier France 9 138 80 45 38 25 34 198
S. Day United Kingdom 9 347 2.5× 82 1.0× 52 1.2× 122 3.2× 9 0.4× 15 384
Kwangsu Kim South Korea 6 119 0.9× 183 2.3× 39 0.9× 39 1.0× 18 0.7× 11 260
K.L. Jiao United States 7 246 1.8× 228 2.9× 148 3.3× 57 1.5× 11 0.4× 20 315
Xueyan Wang China 10 114 0.8× 203 2.5× 44 1.0× 68 1.8× 7 0.3× 16 286
R. Winter Israel 12 319 2.3× 151 1.9× 34 0.8× 77 2.0× 53 2.1× 21 370
Baiqian Zhang United States 2 152 1.1× 314 3.9× 85 1.9× 98 2.6× 8 0.3× 2 359
Dong Sing Wuu Taiwan 9 258 1.9× 271 3.4× 59 1.3× 37 1.0× 92 3.7× 30 367
Eli G. Castanon United Kingdom 6 171 1.2× 192 2.4× 69 1.5× 27 0.7× 4 0.2× 8 263
N. Lakshminarayan South Korea 10 315 2.3× 248 3.1× 42 0.9× 66 1.7× 8 0.3× 16 368

Countries citing papers authored by S. Petitdidier

Since Specialization
Citations

This map shows the geographic impact of S. Petitdidier's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Petitdidier with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Petitdidier more than expected).

Fields of papers citing papers by S. Petitdidier

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Petitdidier. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Petitdidier. The network helps show where S. Petitdidier may publish in the future.

Co-authorship network of co-authors of S. Petitdidier

This figure shows the co-authorship network connecting the top 25 collaborators of S. Petitdidier. A scholar is included among the top collaborators of S. Petitdidier based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Petitdidier. S. Petitdidier is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Petitdidier, S., et al.. (2019). Neutron Irradiation Effects on the Electrical Properties of Previously Electrically Stressed AlInN/GaN HEMTs. IEEE Transactions on Nuclear Science. 66(5). 810–819. 2 indexed citations
2.
Petitdidier, S., et al.. (2017). Parasitic channel induced by an on-state stress in AlInN/GaN HEMTs. Applied Physics Letters. 110(16). 4 indexed citations
3.
Petitdidier, S., et al.. (2017). Influence of neutron irradiation on electron traps induced by NGB stress in AlInN/GaN HEMTs. IEEE Transactions on Nuclear Science. 1–1. 2 indexed citations
4.
Petitdidier, S., et al.. (2016). Analysis of degradation mechanisms in AlInN/GaN HEMTs by electroluminescence technique. Solid-State Electronics. 127. 13–19. 4 indexed citations
5.
Petitdidier, S., et al.. (2016). Influence of Neutron Irradiation on Electron Traps Existing in GaN-Based Transistors. IEEE Transactions on Nuclear Science. 63(3). 1918–1926. 8 indexed citations
6.
Petitdidier, S., et al.. (2015). Influence of Neutrons Irradiation on Electrical Traps Existing in GaN-Based Transistors. 30. 1–4. 5 indexed citations
7.
Loup, V., et al.. (2013). Si and Sige Alloys Wet Etching Using Tmah Chemistry. ECS Meeting Abstracts. MA2013-02(30). 2101–2101. 2 indexed citations
9.
Roy, D., Pauline Vannier, Y. Le Friec, et al.. (2009). Key Process steps for high reliable SiOCH low-k dielectrics for the sub 45nm technology nodes. 122–124. 3 indexed citations
10.
Besson, P., et al.. (2009). Impact of Megasonic Activation with Different Chemistries on Silicon Surface in Single Wafer Tool. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 145-146. 15–18. 1 indexed citations
11.
Petitdidier, S., et al.. (2007). Post Cu-CMP Engineering Challenges for the 65 nm Technology Nodes and Beyond. ECS Transactions. 11(2). 431–440. 1 indexed citations
12.
Petitdidier, S., et al.. (2004). Silicon clean impact on 90nm CMOS devices performance. 235–238. 1 indexed citations
13.
Petitdidier, S., Valérie Bertagna, N. Rochat, et al.. (2004). Growth mechanism and characterization of chemical oxide films produced in peroxide mixtures on Si(100) surfaces. Thin Solid Films. 476(1). 51–58. 15 indexed citations
14.
Chemla, M., et al.. (2004). Silicon Chemical Oxide Growth by a Novel Wet Treatment in Aqueous Chlorine Solutions. Electrochemistry. 72(4). 238–245. 1 indexed citations
15.
Petitdidier, S., et al.. (2003). Modelling the Growth of Chemical Oxide for Advanced Surface Preparation. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 92. 187–190. 1 indexed citations
16.
Rochat, N., Amal Chabli, F. Bertin, et al.. (2003). Infrared analysis of thin layers by attenuated total reflection spectroscopy. Materials Science and Engineering B. 102(1-3). 16–21. 12 indexed citations
17.
Chemla, M., et al.. (2002). R and C Impedance Components Equivalent to the Charge Distribution within Si-Substrate Depletion Layer. Electrochemical and Solid-State Letters. 6(1). G7–G7. 12 indexed citations
18.
Bertagna, Valérie, R. Erre, F. Rouelle, et al.. (2001). Electrochemical study for the characterisation of wet silicon oxide surfaces. Electrochimica Acta. 47(1-2). 129–136. 20 indexed citations
19.
Bertagna, Valérie, et al.. (2001). Electrochemical impedance spectroscopy as a probe for wet chemical silicon oxide characterization. Journal of Solid State Electrochemistry. 5(5). 306–312. 16 indexed citations
20.
Petitdidier, S., et al.. (2001). Optimisations of SC-1 Conditions for Sub 0.18μm Technologies in an Industrial Environment. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 76-77. 93–96. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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