Jeffrey D. Black

2.0k total citations · 1 hit paper
36 papers, 1.5k citations indexed

About

Jeffrey D. Black is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Safety, Risk, Reliability and Quality. According to data from OpenAlex, Jeffrey D. Black has authored 36 papers receiving a total of 1.5k indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Electrical and Electronic Engineering, 15 papers in Hardware and Architecture and 2 papers in Safety, Risk, Reliability and Quality. Recurrent topics in Jeffrey D. Black's work include Radiation Effects in Electronics (33 papers), Semiconductor materials and devices (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). Jeffrey D. Black is often cited by papers focused on Radiation Effects in Electronics (33 papers), Semiconductor materials and devices (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). Jeffrey D. Black collaborates with scholars based in United States, France and Canada. Jeffrey D. Black's co-authors include L. W. Massengill, B. L. Bhuva, Ronald D. Schrimpf, Oluwole A. Amusan, Kevin M. Warren, Arthur F. Witulski, Andrew L. Sternberg, P.E. Dodd, Michael L. Alles and William H. Robinson and has published in prestigious journals such as Solid-State Electronics, IEEE Transactions on Nuclear Science and Physical review. E.

In The Last Decade

Jeffrey D. Black

34 papers receiving 1.4k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

2006 327 citations Oluwole A. Amusan, Arthur F. Witulski et al. IEEE Transactions on Nuclear Science profile →

Peers

Countries citing papers authored by Jeffrey D. Black

Since Specialization

Citations

This map shows the geographic impact of Jeffrey D. Black's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeffrey D. Black with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeffrey D. Black more than expected).

Fields of papers citing papers by Jeffrey D. Black

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jeffrey D. Black. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeffrey D. Black. The network helps show where Jeffrey D. Black may publish in the future.

Co-authorship network of co-authors of Jeffrey D. Black

This figure shows the co-authorship network connecting the top 25 collaborators of Jeffrey D. Black. A scholar is included among the top collaborators of Jeffrey D. Black based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jeffrey D. Black. Jeffrey D. Black is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	The Effects of Gamma Ray Integrated Dose on a Commercial 65-nm SRAM Device 2023 ·IEEE Transactions on Nuclear Science ·(unknown), Dolores Black, Jeffrey D. Black, (unknown), (unknown), (unknown), Jeffrey Goeders	2
2	Measuring and Modeling Single Event Transients in 12-nm Inverters 2022 ·IEEE Transactions on Nuclear Science ·Sapan Agarwal, Lawrence T. Clark, (unknown), (unknown), Dolores Black, (unknown), Jeffrey D. Black, Heather Quinn, John Brunhaver, Hugh Barnaby, (unknown), (unknown), Matthew Marinella	5
3	Study of inertial electrostatic confinement fusion using a finite-volume scheme for the one-dimensional Vlasov equation 2021 ·Physical review. E ·Jeffrey D. Black, (unknown), (unknown), Erik J. Sánchez	3
4	Multiscale System Modeling of Single-Event-Induced Faults in Advanced Node Processors 2021 ·IEEE Transactions on Nuclear Science ·(unknown), Arun Rodrigues, Dolores Black, Jeffrey D. Black, (unknown), (unknown), Ben Feinberg, (unknown), Heather Quinn, Lawrence T. Clark, John Brunhaver, Hugh Barnaby, Michael Lee McLain, Sapan Agarwal, Matthew Marinella	4
5	DFF Layout Variations in CMOS SOI—Analysis of Hardening by Design Options 2020 ·IEEE Transactions on Nuclear Science ·Jeffrey D. Black, Dolores Black, (unknown), P.E. Dodd, Patrick Griffin, (unknown), (unknown), (unknown), Robert A. Reed, Robert A. Weller, (unknown), Ronald D. Schrimpf	4
6	Thermal Neutron-Induced Single-Event Upsets in Microcontrollers Containing Boron-10 2019 ·IEEE Transactions on Nuclear Science ·Elizabeth C. Auden, Heather Quinn, S.A. Wender, J. M. O’Donnell, P.W. Lisowski, J. George, Ning Xu, Dolores Black, Jeffrey D. Black	14
7	Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts 2018 ·IEEE Transactions on Nuclear Science ·Jeffrey D. Black, (unknown), Dolores Black, P.E. Dodd, M.R. Shaneyfelt, (unknown), (unknown), (unknown), Matthew J. Davis, Robert A. Reed, Robert A. Weller, (unknown), Kevin M. Warren, (unknown), Ronald D. Schrimpf, (unknown)	4
8	New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle 2015 ·IEEE Transactions on Nuclear Science ·Nathaniel A. Dodds, P.E. Dodd, M.R. Shaneyfelt, F.W. Sexton, (unknown), Jeffrey D. Black, Paul W. Marshall, Robert A. Reed, Michael W. McCurdy, (unknown), (unknown), Kenneth P. Rodbell, Michael S. Gordon	25
9	A 256 kbit (32kx8) EEPROM for >200°C Applications 2014 ·Additional Conferences (Device Packaging HiTEC HiTEN & CICMT) ·D. K. Adams, Jeffrey D. Black, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown)	0
10	Impact of logic synthesis on soft error vulnerability using a 90-nm bulk CMOS digital cell library 2011 ·Daniel B. Limbrick, Dolores Black, (unknown), N. M. Atkinson, N. J. Gaspard, Jeffrey D. Black, William H. Robinson, Arthur F. Witulski	14
11	Effects of Guard Bands and Well Contacts in Mitigating Long SETs in Advanced CMOS Processes 2008 ·IEEE Transactions on Nuclear Science ·Balaji Narasimham, B. L. Bhuva, Ronald D. Schrimpf, L. W. Massengill, Matthew J. Gadlage, W.T. Holman, Arthur F. Witulski, William H. Robinson, Jeffrey D. Black, J.M. Benedetto, Paul Eaton	52
12	Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing 2008 ·IEEE Transactions on Device and Materials Reliability ·Oluwole A. Amusan, L. W. Massengill, M.P. Baze, Andrew L. Sternberg, (unknown), B. L. Bhuva, Jeffrey D. Black	91
13	Mitigation techniques for single event induced charge sharing in a 90 nm bulk CMOS process 2008 ·Oluwole A. Amusan, L. W. Massengill, M.P. Baze, B. L. Bhuva, Arthur F. Witulski, Jeffrey D. Black, A. Balasubramanian, Megan C. Casey, Dolores Black, Jonathan R. Ahlbin, Robert A. Reed, Michael W. McCurdy	22
14	Quantifying the Reduction in Collected Charge and Soft Errors in the Presence of Guard Rings 2008 ·IEEE Transactions on Device and Materials Reliability ·Balaji Narasimham, Robert L. Shuler, Jeffrey D. Black, B. L. Bhuva, Ronald D. Schrimpf, Arthur F. Witulski, W.T. Holman, L. W. Massengill	12
15	Single Event Upsets in a 130 nm Hardened Latch Design Due to Charge Sharing 2007 ·Oluwole A. Amusan, (unknown), (unknown), B. L. Bhuva, Jeffrey D. Black, M.P. Baze, L. W. Massengill	48
16	Quantifying the Effectiveness of Guard Bands in Reducing the Collected Charge Leading to Soft Errors 2007 ·Balaji Narasimham, Robert L. Shuler, Jeffrey D. Black, B. L. Bhuva, Ronald D. Schrimpf, (unknown), W.T. Holman, L. W. Massengill	10
17	Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies 2007 ·IEEE Transactions on Nuclear Science ·Balaji Narasimham, B. L. Bhuva, Ronald D. Schrimpf, L. W. Massengill, Matthew J. Gadlage, Oluwole A. Amusan, (unknown), Arthur F. Witulski, William H. Robinson, Jeffrey D. Black, J.M. Benedetto, Paul Eaton	129
18	Soft Error Considerations for Multicore Microprocessor Design 2007 ·William H. Robinson, Michael L. Alles, (unknown), B. L. Bhuva, Jeffrey D. Black, A. B. Bonds, L. W. Massengill, Sandeep Neema, Ronald D. Schrimpf, (unknown)	8
19	Charge Collection and Charge Sharing in a 130 nm CMOS Technology breakdown → 2006 ·IEEE Transactions on Nuclear Science ·Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill, B. L. Bhuva, Patrick R. Fleming, Michael L. Alles, Andrew L. Sternberg, Jeffrey D. Black, Ronald D. Schrimpf	327
20	HBD layout isolation techniques for multiple node charge collection mitigation 2005 ·IEEE Transactions on Nuclear Science ·Jeffrey D. Black, Andrew L. Sternberg, Michael L. Alles, Arthur F. Witulski, B. L. Bhuva, L. W. Massengill, J.M. Benedetto, M.P. Baze, J.L. Wert, (unknown)	93

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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