Hugh Barnaby
About
In The Last Decade
Hugh Barnaby
209 papers receiving 4.2k citations
Hit Papers
Peers
Comparison fields: 5 of 66
- Electrical and Electronic Engineering 4.3k
- Materials Chemistry 430
- Cellular and Molecular Neuroscience 410
- Hardware and Architecture 388
- Polymers and Plastics 216
Countries citing papers authored by Hugh Barnaby
This map shows the geographic impact of Hugh Barnaby's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hugh Barnaby with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hugh Barnaby more than expected).
Fields of papers citing papers by Hugh Barnaby
This network shows the impact of papers produced by Hugh Barnaby. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hugh Barnaby. The network helps show where Hugh Barnaby may publish in the future.
Co-authorship network of co-authors of Hugh Barnaby
This figure shows the co-authorship network connecting the top 25 collaborators of Hugh Barnaby. A scholar is included among the top collaborators of Hugh Barnaby based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hugh Barnaby. Hugh Barnaby is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Title | Journal | Authors | Indexed citations |
|---|---|---|---|---|
| 1 | TID Response of IBM Gate-All-Around Stacked Nanosheet Transistors | IEEE Transactions on Nuclear Science | Nathaniel A. Dodds, Keshab Sapkota et al. | 2 |
| 2 | In Situ Analog In-Memory Computing Under Ionizing Radiation Exposure | IEEE Transactions on Nuclear Science | T. Patrick Xiao, Donald A. Wilson et al. | 0 |
| 3 | The Effect of Number of Fins per Transistor on the TID Response of 12LP FinFET Technology | IEEE Transactions on Nuclear Science | Nathaniel A. Dodds, B. Dodd et al. | 0 |
| 4 | Impact of 12-nm FinFET Technology Variations on TID Effects: A Comparative Study of GF 12LP and 12LP+ at the Transistor Level | IEEE Transactions on Nuclear Science | Nathaniel A. Dodds, Phil Oldiges et al. | 0 |
| 5 | Electron Holography Characterization of Total Ionizing Dose Effects in Oxide–Nitride Stacks | IEEE Transactions on Nuclear Science | Martha R. McCartney, David J. Smith et al. | 0 |
| 6 | Neutron Displacement Damage in Bipolar Junction Transistors Isolated From an Integrated Circuit | IEEE Transactions on Nuclear Science | Sneha Banerjee, Xujiao Gao et al. | 2 |
| 7 | The Effects of Threshold Voltage and Number of Fins Per Transistor on the TID Response of GF 12LP Technology | IEEE Transactions on Nuclear Science | Nathaniel A. Dodds, Phil Oldiges et al. | 5 |
| 8 | Analysis of Total Ionizing Dose Effects Using Electron Holography | IEEE Transactions on Nuclear Science | B. W. Kennedy, Martha R. McCartney et al. | 1 |
| 9 | Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETs | IEEE Transactions on Nuclear Science | Stefano Bonaldo, Hugh Barnaby et al. | 7 |
| 10 | Single-Event Gate Rupture Hardened Structure for High-Voltage Super-Junction Power MOSFETs | IEEE Transactions on Electron Devices | Hugh Barnaby, K.F. Galloway et al. | 14 |
| 11 | Analysis of SEGR in Silicon Planar Gate Super-Junction Power MOSFETs | IEEE Transactions on Nuclear Science | Hugh Barnaby, K.F. Galloway et al. | 19 |
| 12 | Ionizing Radiation Effects in SONOS-Based Neuromorphic Inference Accelerators | IEEE Transactions on Nuclear Science | T. Patrick Xiao, Christopher H. Bennett et al. | 7 |
| 13 | Single-Event Effects Induced by Heavy Ions in SONOS Charge Trapping Memory Arrays | IEEE Transactions on Nuclear Science | T. Patrick Xiao, Christopher H. Bennett et al. | 6 |
| 14 | Investigating Heavy-Ion Effects on 14-nm Process FinFETs: Displacement Damage Versus Total Ionizing Dose | IEEE Transactions on Nuclear Science | T. Patrick Xiao, Edward S. Bielejec et al. | 17 |
| 15 | Active neutron interrogation experiments and simulation verification using the SIngle-scintillator Neutron and Gamma-Ray spectrometer (SINGR) for geosciences | Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment | C. Hardgrove, A. Parsons et al. | 2 |
| 16 | Radiation Hardened Millimeter-Wave Receiver Implemented in 90-nm, SiGe HBT Technology | IEEE Transactions on Nuclear Science | John D. Cressler, Hugh Barnaby et al. | 8 |
| 17 | Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects | IEEE Transactions on Nuclear Science | Robin Jacobs-Gedrim, Michael Lee McLain et al. | 4 |
| 18 | Training a Neural Network on Analog TaO<italic>x</italic> ReRAM Devices Irradiated With Heavy Ions: Effects on Classification Accuracy Demonstrated With CrossSim | IEEE Transactions on Nuclear Science | Robin Jacobs-Gedrim, David Russell Hughart et al. | 11 |
| 19 | Active Nuclear Investigations of Planetary Surfaces with SINGR (SIngle-Scintillator Neutron and Gamma Ray Spectrometer) | Lunar and Planetary Science Conference | C. Hardgrove, Eric B. Johnson et al. | 1 |
| 20 | Reliability of high performance standard two-edge and radiation hardened by design enclosed geometry transistors | Michael Lee McLain, Hugh Barnaby et al. | 18 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.