Patrick R. Fleming

17 papers receiving 577 citations

Hit Papers

Charge Collection and Charge Sharing in a 130 nm CMOS Tec...20062026201220192006100200300

Peers

Patrick R. Fleming
Comparison fields: 5 of 32
  • Electrical and Electronic Engineering 564
  • Hardware and Architecture 300
  • Emergency Medical Services 26
  • Surgery 23
  • Computational Mechanics 21
Replace Joseph R. Burns with:
Joseph R. Burns United States
P. Peronnard Switzerland
I. A. Kharitonov Russia
Bichen Chen United States
J.L. Knighten United States
Weiyuan Lin Singapore
Robert W. Techentin United States
G. Romano Italy
Matteo Cocchini United States
Ting Guo Singapore
Patrick R. Fleming relative to Joseph R. Burns United States Joseph R. Burns's profile →
Citations per field
00.5×10×15.8×
Joseph R. Burns · 1×
Citations per year

Countries citing papers authored by Patrick R. Fleming

Since Specialization
Citations

This map shows the geographic impact of Patrick R. Fleming's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick R. Fleming with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick R. Fleming more than expected).

Fields of papers citing papers by Patrick R. Fleming

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick R. Fleming. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick R. Fleming. The network helps show where Patrick R. Fleming may publish in the future.

Co-authorship network of co-authors of Patrick R. Fleming

This figure shows the co-authorship network connecting the top 25 collaborators of Patrick R. Fleming. A scholar is included among the top collaborators of Patrick R. Fleming based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Patrick R. Fleming. Patrick R. Fleming is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

17 of 17 papers shown
#WorkIndexed citations
1 32
2 1
3 3
4 1
5 14
6 22
7 17
8 27
9 4
10 6
11 4
12 81
13 24
14 21
15
Charge Collection and Charge Sharing in a 130 nm CMOS Technologybreakdown →
327
16 9
17 16

About Patrick R. Fleming

Patrick R. Fleming is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Critical Care and Intensive Care Medicine, having authored 17 papers that have together received 609 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (14 papers), VLSI and Analog Circuit Testing (10 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). The work is most often cited by research in Hardware and Architecture (300 citations), Electrical and Electronic Engineering (564 citations) and Critical Care and Intensive Care Medicine (20 citations). Patrick R. Fleming has collaborated with scholars based in United States and Sweden. Frequent co-authors include B. L. Bhuva, L. W. Massengill, Oluwole A. Amusan, Andrew L. Sternberg, Arthur F. Witulski, Michael L. Alles, Ronald D. Schrimpf, Jeffrey D. Black, W.T. Holman and A. Balasubramanian. Their work appears in journals such as Journal of Applied Physics, Critical Care Medicine and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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