Lawrence T. Clark

3.2k total citations · 1 hit paper
152 papers, 2.3k citations indexed

About

Lawrence T. Clark is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computer Networks and Communications. According to data from OpenAlex, Lawrence T. Clark has authored 152 papers receiving a total of 2.3k indexed citations (citations by other indexed papers that have themselves been cited), including 139 papers in Electrical and Electronic Engineering, 57 papers in Hardware and Architecture and 10 papers in Computer Networks and Communications. Recurrent topics in Lawrence T. Clark's work include Semiconductor materials and devices (71 papers), Low-power high-performance VLSI design (67 papers) and Radiation Effects in Electronics (59 papers). Lawrence T. Clark is often cited by papers focused on Semiconductor materials and devices (71 papers), Low-power high-performance VLSI design (67 papers) and Radiation Effects in Electronics (59 papers). Lawrence T. Clark collaborates with scholars based in United States, Sweden and China. Lawrence T. Clark's co-authors include Vinay Vashishtha, Yu Cao, Chandarasekaran Ramamurthy, Keith E. Holbert, Saurabh Sinha, L. Shifren, Brian Cline, Greg Yeric, Jinhui Chen and David R. Allee and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Electron Devices and Neural Computation.

In The Last Decade

Lawrence T. Clark

144 papers receiving 2.2k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

ASAP7: A 7-nm finFET predictive process design kit

2016 459 citations Lawrence T. Clark, Vinay Vashishtha et al. profile →

Peers

Lawrence T. Clark

EEE

HA

CNC

BE

AI

Brian Cline United States

Yuxiao Wang United States

Hussam Amrouch Germany

Seokhyeong Kang South Korea

David Fick United States

Noriyuki Miura Japan

Greg Yeric United States

Youngsoo Shin South Korea

Samuel Naffziger United States

Robert K. Montoye United States

Brian Cline United States

Lawrence T. Clark

1.5k ×0.7

EEE

429 ×0.5

HA

153 ×0.7

CNC

169 ×0.9

BE

79 ×0.5

AI

Citations per year, relative to Lawrence T. Clark Lawrence T. Clark (= 1×) peers Brian Cline

Countries citing papers authored by Lawrence T. Clark

Since Specialization

Citations

This map shows the geographic impact of Lawrence T. Clark's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Lawrence T. Clark with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Lawrence T. Clark more than expected).

Fields of papers citing papers by Lawrence T. Clark

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Lawrence T. Clark. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Lawrence T. Clark. The network helps show where Lawrence T. Clark may publish in the future.

Co-authorship network of co-authors of Lawrence T. Clark

This figure shows the co-authorship network connecting the top 25 collaborators of Lawrence T. Clark. A scholar is included among the top collaborators of Lawrence T. Clark based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Lawrence T. Clark. Lawrence T. Clark is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

1.

Clark, Lawrence T., et al.. (2023). Total Ionizing Dose Response of a 22-nm Compiled Fully Depleted Silicon-on-Insulator Static Random Access Memory. IEEE Transactions on Nuclear Science. 70(8). 2034–2041. 4 indexed citations

2.

Clark, Lawrence T., et al.. (2023). Consistent and Repeatable Transistor Level TID Transistor Array Measurement. 54. 1–4.

3.

Guertin, Steven M., et al.. (2023). SEE Test Results for SRAM and Register Files Compiled on 22nm Fully-Depleted-Silicon-on-Insulator (22FDX). 1–3.

4.

Clark, Lawrence T.. (2023). Secure true random number generation using 1.5-T transistor flash memory. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information).

5.

Clark, Lawrence T., et al.. (2022). A Transistor Array for Extracting Total Ionizing Dose Threshold Voltage Shifts. 1–4. 1 indexed citations

6.

Rodrigues, Arun, Dolores Black, Jeffrey D. Black, et al.. (2021). Multiscale System Modeling of Single-Event-Induced Faults in Advanced Node Processors. IEEE Transactions on Nuclear Science. 68(5). 980–990. 4 indexed citations

7.

Vashishtha, Vinay, et al.. (2017). ASAP7 predictive design kit development and cell design technology co-optimization. International Conference on Computer Aided Design. 16 indexed citations

8.

Vashishtha, Vinay, et al.. (2017). ASAP7 predictive design kit development and cell design technology co-optimization: Invited paper. 992–998. 48 indexed citations

9.

Vashishtha, Vinay, et al.. (2015). Delay and power tradeoffs for static and dynamic register files. 43. 2900–2903. 4 indexed citations

10.

Clark, Lawrence T., et al.. (2015). Architectural and Micro-Architectural Techniques for Software Controlled Microprocessor Soft-Error Mitigation. 1–6. 3 indexed citations

11.

Clark, Lawrence T., et al.. (2013). SRAM cell optimization for low AV T transistors. 57–63. 4 indexed citations

12.

Wang, Xin, Keith E. Holbert, & Lawrence T. Clark. (2011). Single event upset mitigation techniques for FPGAs utilized in nuclear power plant digital instrumentation and control. Nuclear Engineering and Design. 241(8). 3317–3324. 8 indexed citations

13.

Clark, Lawrence T., et al.. (2011). Validation of and delay variation in total ionizing dose hardened standard cell libraries. 2051–2054. 12 indexed citations

14.

Venugopal, Sameer M., et al.. (2008). Localization of Gate Bias Induced Threshold Voltage Degradation in a-Si:H TFTs. IEEE Electron Device Letters. 29(1). 93–95. 21 indexed citations

15.

Clark, Lawrence T., et al.. (2007). A Low Standby Power Flip-flop with Reduced Circuit and Control Complexity. 3. 571–574. 5 indexed citations

16.

Chen, Jinhui, et al.. (2006). An Ultra-low Power Memory with a Subthreshold Power Supply Voltage [PREPRINT]. Defense Technical Information Center (DTIC).

17.

Maloney, Timothy J., Steven S.S. Poon, & Lawrence T. Clark. (2004). Methods for designing low-leakage ESD power supply clamps. Journal of Electrostatics. 62(2-3). 85–97. 1 indexed citations

18.

Lin, Binshan & Lawrence T. Clark. (1994). Information control and security policy in health care information systems. CSUSB ScholarWorks (California State University, San Bernardino). 3(2). 2. 3 indexed citations

19.

Clark, Lawrence T., R. Grondin, & Sandwip K. Dey. (1989). Ferroelectric connections for IC neural networks. 47–51. 4 indexed citations

20.

Clark, Lawrence T., et al.. (1989). Integrated circuit emulation of ART1 networks. 37–41. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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